Test System Integration
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Mezzanine System
5089
System
The 5089 provides eight channels of 12 bit A/D conversion using the Analog Devices AD7328, and is suitable for medium resolution medium speed applications.
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Product
High Voltage Battery Test System
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The increasing use of electric drive systems both in the automotive industry and in transportation requires the development of new high-performance energy storage systems. In order to support you in the development and production of these systems, S.E.A. develops individually configurable test systems which are scalable and can be used flexibly for the respective requirements.
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Product
Hydrostatic Test Stand, Hydraulic System Components
9901HTX-100LR2-36x36x15
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The 3 ft. wide x 3 ft. deep Hydrostatic Test Stand, Hydraulic System Components is utilized for pressure testing hose and tube assemblies as well as any component requiring hydrostatic testing in the integral safety test chamber.
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Product
Boundary Scan / JTAG Test Development System
onTAP Development
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The onTAP Development system will speed up your project development time and keep costs under control. These tools enable you to quickly and easily develop, run, and debug JTAG tests ranging from single JTAG chain applications to multiple JTAG chain applications with multi-die modules, merged sub-assemblies, and multi-drop configurations.
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Product
Test Analysis for Land Seismic Systems
Testif-i Land
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Testif-i Land is an independent, powerful and cost effective software suite that allows you independently process instruments, source and receiver tests to confirm that the equipment is performing correctly and within specification. The software includes modules to perform comprehensive analysis of vibrator wireline similarity test data. Analysis includes a harmonic intensity plot which can highlight problems such as sub-harmonics which may not be seen on numerical results.Geophone pulse tests can be analysed using the receiver response module and test data from third party geophone testers can be graphed and statistics produced for ease of interpretation.
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Product
Development System
FE-51RD2
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* Emulates Atmel AT89C51RD2, AT89C51ED2 and others * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Product
Midi Systems
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MIDI systems provide an efficient solution for customers seeking a Box PC with wide temperature performance and abundant I/O. MIDI systems feature expansion-ready front panels with removable cover plates to expose additional connector cutouts. The enclosure can easily accommodate up to two additional PC/104 style I/O modules or PCIe MiniCards. The cover plate provides ample cooling for our rugged conduction-cooled SBCs. Table-top, wall mount, and DIN rail mounting options are all included.
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Product
Signal Integrity Test Products
S1
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*Fixtureless Test Solution*Automated Optical Inspection*DC Electrical test*Tests any backplane – Small, large, simple, complex*Now available with 4 heads
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Product
16-Station Testing System
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The ElectroPuls 16-Station testing system performs high cycle fatigue testing on multiple samples simultaneously, with a fatigue-rated load cell included on each station. The fixture uses a carousel designed with high stiffness and low mass to enable high frequency testing and reduce test time.
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Product
Cell, Battery, And Module Test Systems
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Maximize your testing capabilities with Maccor's hardware and software. Our comprehensive turn-key systems come bundled with all the essentials to jumpstart your testing process. Select from multiple options and configurations to match your requirements.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
Torque Systems
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The Drive Plate Torque System uses a low power radio link to transfer digitised strain measurements from a rotating wheel hub to a stationary antenna mounted nearby. The signals are passed to a receiver where they are decoded and output as CAN bus messages and analogue outputs.
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Product
Integrated Transformer Test Van
XD90
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Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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Product
Integration API
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Testdroid API is an easy-to-use gateway for managing your development and testing effort on real Android and iOS devices. As an alternative for an official Testdroid Cloud site, the API provides all infrastructure through different clients (e.g. Java, Python, Ruby) following the RESTful architecture paradigm and returning JSON with appropriate HTTP response codes.
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Vibration Systems
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The Hanse 6 Degrees of Freedom (6DoF) vibration system consists of a patented-designed table with pneumatic actuators. The system can generate up to 100 GRMS over a frequency range of 5 to 10,000 Hz in 3 axes and rotational about each axis. 8 standard models are available. They range from 1 to 36 square feet.
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Product
Test System
USB Explorer 280
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The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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Product
Terahertz Systems
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Non-destructive and non-contact coating thickness measurement of organic single and multilayer systems as well as material analysis.
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Product
IT Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
IT battery test system support for multiple charging mode (such as CC, CV, CP, pulse, etc.) and discharge mode, to ensure that the battery performance and safety in the practical application. IT battery test system is designed to be modular, easy to maintain, and with anti-reverse connection, data loss and other protection functions
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Product
Thermal Stability Test System
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Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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Product
Radar Systems
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A radar system utilizing electronic-computer techniques whereby raw data is used to track an assigned target, compute target velocity, and predict its future position without interfering with the scanning rate.
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Product
Upstream-Measurement-System
AMA 310 UMS & VAROS 107
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This system combines the KWS devices AMA 310/UMS and VAROS 107 to a high-end monitoring system for the return path frequency range. An AMA 310 in a 19-inch version (3.5 RU) with UMS module is used in the headend, in the field the CATV handheld VAROS 107 is the counterpart.
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Product
Amplifier Systems
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Sutter Instrument provides a complete line of electrophysiology recording hardware and software, ideal for applications ranging from tissue slice patch clamp over dissociated cell recordings to cell line studies.
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Product
Wafer Auto Line Integration
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The line is used for semiconductor wafer grinding. It carries out material matching and distribution, automatic loading and unloading, auto focusing and positioning and many other functions. The grinding precision is 2μm(3-sigma). It is also capable of collecting and analyzing real-time production data and interfacing with MES system.
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Product
Mezzanine System
3564
System
The 3564 is a four channel comparator board with a common mode range of -150V to 150V on the two differential inputs and a DAC per channel to set trigger levels. The high common mode range and DC coupling provides a robust solution to level detection and triggering.
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Product
D-Mic Testing System
BK3012V2
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Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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Product
Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Product
0.3M Integrating Sphere For Leds Luminous Flux Test
CX-0.3S
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Shenzhen Chuangxin Instruments Co., Ltd.
Thesystem are composed of integrating sphere, spectroradiometer and computer to determine the spectroradiometric and colorimetric parameters, e.g. spectral power distribution, chromaticity coordinates, correlated color temperature, color rendering index, color tolerance, color difference, luminous flux, current, voltage, wattage, etc.
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Product
Mission Computer Software Integration Rig
MS 1124
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The HSIR is the ground test facility and it simulates various LRUs/sensors interfaced with the HAWK Mission Computer. RIG consists of Industrial computers with Simulation modules, Acquisition modules, Video generator module and video display monitors. RIG provides the simulated inputs to both the MCs from each simulated sensor/ LRU through hardwired signals, through the MIL-1553B, Arinc 429, RS-422, RS232 and Ethernet etc. The rig is capable of testing two MCs together either of which can be used as the Bus Controller (BC) or the Remote Terminal (RT). The rig provides the facility to monitor and acquire the MIL-1553B, Arinc 429, RS-422, and RS232 Ethernet bus, Analog IOs, Synchro IOs, Discrete IOs and transactions that takes place between the MCs and various sensors/units. The RIG has the capability to test individual MCs also.
