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Production Test Systems
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Production Test System
G3 Hybrid
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Informtest SAT
«Информтест САТ» - это инновационная, высокотехнологичная среда для разработки циклограмм, осуществления процессов моделирования и тестирования любых объектов контроля, не имеющая аналогов российского производства. Крупнейшие научные и производственные центры (РКК «Энергия», ОАО «ИСС» им. Академика М.Ф. Решетнева) уже используют данное программное обеспечение. Informtest Holding presents a unique software product "Automatic Testing System". This product eliminates the need to involve programmers in the development of open source software for testing and modeling, a CAD of the Informtest SAT shell and one specialist is enough. Thanks to an intuitive graphical interface, the development of any necessary sequence diagrams is not difficult even for a user unfamiliar with the basics of programming. The system is constantly being improved and updated. It is possible to make the necessary changes for each customer.
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Electrical
This category covers test equipment required for electrical performance tests on Industrial Lighting, Street Lighting, Automotive Lighting, Appliances, Accessories & related products. A wide range of Electrical Test Panels, Electro-mechanical endurance test systems for many products, Appliance test systems and also a range of low energy spot welding machines (one of the very few products we make which are not test equipment). Equipment are custom built to suit specific customer requirements.
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Multiport Coaxial Switch, DC to 20 GHz, SP4T
87204B
The Keysight 87204B terminated multiport switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control created the Keysight 87204B which meet the requirements for highly repeatable switching elements in test instruments and switching interfaces. The Keysight 87204B is designed to operate for more than 10 million cycles. The exceptional 0.03 dB insertion loss repeatability is warranted for 5 million cycles at 25° C. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of this switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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PXI-Based Modules
PXI-based modules form the core of many measurement and automation systems. These modules are designed to integrate into design verification and high-volume production test systems. Combined with our demonstrated microwave and high-speed digital expertise, SCT’s PXI design capabilities make us well positioned to deliver innovative products to the wireless test market.
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Coaxial Matrix Switch, DC to 20 GHz
87406B
The Keysight 87406B matrix switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control creates a switch that meets the requirements for highly repeatable switching elements in test instruments and switching interfaces. The switch is designed to operate for more than 10 million cycles and will meet all electrical specifications for at least 5 million cycles. The switch exhibits exceptional insertion loss repeatability. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of the switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Coaxial Matrix Switch, DC to 20 GHz
87606B
The Keysight 87606B matrix switch provides the life and reliability required for automated test and measurement, signal monitoring and routing applications. Innovative design and careful process control creates a switch that meets the requirements for highly repeatable switching elements in test instruments and switching interfaces. The switch is designed to operate for more than 10 million cycles and will meet all electrical specifications for at least 5 million cycles. The switch exhibits exceptional insertion loss repeatability. This reduces sources of random errors in the measurement path and improves measurement uncertainty. Switch life is a critical consideration in production test systems, satellite and antenna monitoring systems, and test instrumentation. The longevity of the switch increases system uptime, and lowers the cost of ownership by reducing calibration cycles and switch maintenance.
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Saluki S87234 Series USB Peak and Average Power Sensor (max. 67GHz)
S87234D/E/F/L USB peak and average power sensor is a diode-detection broadband power measurement instrument based on the USB 2.0 interface, which can realize accurate average power measurement, pulse power measurement with large dynamic range and CCDF statistical measurement analysis. The frequency range covers 50MHz to 67GHz, the highest power accuracy can reach 0.2dB, the video bandwidth is ≥30MHz, and the rise/fall time is ≤13ns.S87234 series can flexibly expand the power measurement function of electronic measuring instruments and test systems, and is mainly used for field testing, production line testing and system integration.
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Test Box
RF
This is a custom made part of a Phase Noise test system. It contains relays, filters, amplifiers, and so on. It works with other of-the-shelf eqipment, and custom software to form a high volume production test system.
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DC Power Supplies
Rohde & Schwarz offers a versatile portfolio of DC Power supplies that fit variety of test and measurement scenarios. Whether you are looking to equip an educational lab or integrate a power supply into a production test system, we have the right equipment for you.
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Automation Of Vibration Testing
The system can be equipped with various National I / O devices using PCI, PXI, USB and cRIO platforms for both testing tasks and for advanced diagnostics of the tested products. The system software includes a wide range of virtual instruments (Vibrotest, Vibration, Vibrotest SBC, Vibrorezonans, Beat, etc.).
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Battery Formation and Testing System
BFS 2000
BENNING Elektrotechnik und Elektronik GmbH
For many decades now, BENNING has designed and manufactured charge/discharge converters for the battery industry. These converters are used in both the production and testing processes involved in battery manufacturing and for series-testing of batteries. BENNING's BFS battery production and testing system provides a solution which makes it easier to control and monitor production and test processes which saves both time and energy. When used in power stations and rail applications (mobile version), it can be used to test and maintain a wide range of battery types.
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IQC Test Systems
Signalysis has worked with many Tier I and Tier II Automotive sub-suppliers to provide production test systems. Below are some examples of our systems; we have also supplied systems for wiper motors, axles, door panels, window mechanisms, and many other interior components.
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68 Pin VHDCI Connector & Cable Accessories
These 68 Way VHDCI connectors & cables provide a high-density 0.5A solution that is suitable for use to 30Vac. We have developed this range of standard connection solutions to simplify the task of integrating products into a test system, the high density and skill levels involved in terminating this connector mean that we strongly recommend that you use our connection solutions. This category of connectors are not compatible with our products, however, are offered for developing a connection solution for use with other vendor’s products. You can also try our Cable Design Tool to graphically design a customized cable assembly.
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PXI & LXI Simulation Tools
Our PXI & LXI simulation tools help you to accelerate the development process by simulating the product in your test system. These tools allow you to develop and test the system software independent from your application hardware. By using the tools, you can minimize the time required with the physical system.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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CPE Design Verification System
Jupiter 310
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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BMS Manufacturing Test System
The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Automated Testing Systems
Automated Testing Systems enable a new dimension of testing productivity. These systems were designed as a solution to these common testing challenges:*Safety*Throughput*Repetitive Tasks/Better Use of Skilled Operators*Variability of Results
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
