Test Software Development
See Also: Test Software, Software Development, Software Testing
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
Testing Software
IEC 61850
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Beijing GFUVE Electronics Co.,Ltd.
Intelligent substation has widely adopted IEC 61850 standard communication, the standardization of information model is the basis for intelligent substation equipment (or system) to achieve IEC 61850 communication. This module can test if the information model meet the requirements of DL/T860 standard, national network and related model specifications. It can test and control unit model, protection unit model, econometric model, condition monitoring model. It is selectable to test according to IEC61850-6 SCL grammatical rules, IEC61850-7 logic nodes and common data, the national network model standards and custom models.
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Product
Advanced Multicore Software Development Kit
M*SDK
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The focus of the Imperas products is to save engineering time in the development of embedded software, primarily achieved by making the engineering process significantly more efficient through the use of high-performance simulation and automated, powerful tooling.
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Product
Digital I/O Vector Development Software
DIOEasy
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DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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Product
Regenerative Battery Pack Test System
17020E
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Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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Product
True Concurrent Test
TestStation Duo
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The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Software Tools for Efficient Code Development and Analysis
Verissimo SystemVerilog Testbench Linter
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SystemVerilog is a rich object-oriented programming language that provides powerful constructs and a high level of programming flexibility. Such capabilities meet the needs of today's complex design and verification requirements, but at the same time introduce new challenges in code development. For example, the possibility of implementing the same functionality in multiple ways may impact the simulation performance or lead to unexpected behavior.
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Product
USRP Software Defined Radio Device
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The USRP Software Defined Radio Device is a reconfigurable RF device that includes a combination of host-based processors, FPGAs, and RF front ends. The USRP Software Defined Radio Device include options that range from lower cost options with fixed FPGA personalities to high-end radios with a large, open FPGAs and wide instantaneous bandwidth. These devices can be used for applications such as multiple input, multiple output (MIMO) and LTE/WiFi testbeds, SIGINT, and radar systems.
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Product
Test & Development
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Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Product
Analog Waveform Development and Analysis Software
WaveEasy
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WaveEasy is an interactive analog waveform editor software tool for creating and editing analog waveforms. To view or edit existing waveforms, you can open or save files using various file formats including WaveEasy, ASCII or text (txt, csv, prn), or the NI-HWS (hws) format which is used by many instrument drivers.
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Product
Test System Optimized for High-Performance Digital and SoC
ULTRAWAVEMX44 and ULTRAWAVEMX20-D16
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Teradyne is the leader in RF/wireless device testing and has a large installed base of UltraFLEX test systems with the UltraWave24 RF instrument. As new devices for handset and base station applications are introduced using mmWave technology, Teradyne’s mmWave instrumentation has expanded in anticipation of new testing demands.
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Product
In-Line RF Test Platform
AR925
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This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
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The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
API Development & Testing Platform
StopLight
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The best way to model, document, and test web APIs. Model complex APIs faster than ever. Stoplight consists of four primary components; API designer, hosted documentation, the new scenarios component, and Prism. Stoplight API designer automatically discovers APIs from HTTP traffic which developers can reference to build new APIs. Developers can use the API designer to build APIs based on imported API definition files such as RAML and Swagger, and build APIs from scratch.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
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The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Product
Test Automation Software
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PathWave test and measurement software delivers fast, accurate, and comprehensive data analysis. Connected workflows and trusted algorithms allow you to optimize test plans while increasing test efficiency. Designed for spectrum analyzers, oscilloscopes, network analyzers and many more test instruments as well as PCs or automation systems.
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Product
Advanced SoC Test System
3680
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The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Stress Test Software
PassMark BurnInTest
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PassMark BurnInTest? is a software tool that allows all the major sub-systems of a computer to be simultaneously stress tested for endurance, reliability and stability.
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Product
Material Testing Software
MS100
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Sinowon Innovation Metrology Manufacture Ltd.
MS100 is professional software for material testing in windows system, it is able to conduct tensile, compression, bending, shearing, bonding strength, peeling, tearing and other tests for rubber, plastic, leather, metal, nylon line, fabric, paper, aviation, packaging, construction, petrifaction, electrician, vehicle and other materials.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
PAT Testing Software
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How PAT test results are recorded and managed can be an important factor in the implementation of effective workplace electrical safety testing programs.
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Product
Software Development Kit for Machine Vision Cameras
FlyCapture SDK
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The FlyCapture® Software Development Kit (SDK) provides a common software interface to control and acquire images for FLIR area scan USB 3.1, GigE, FireWire, and USB 2.0 cameras using the same API under 32- or 64-bit Windows or Linux. Note: Blackfly S cameras use our latest SDK: Spinnaker. Spinnaker also supports all USB 3.1 and GigE area scan cameras.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Scienlab Combined Battery Test Solution
SL1133A
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Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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Product
Portable, Integrated O-Level Test Platform
Guardian™
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Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Material Testing Software
TRAPEZIUM LITE X
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Simple Software Enhances Productivity TRAPEZIUM LITE X is newly developed simple software for Autograph series testing machines. It boasts comprehensive new functions for more efficient testing.
