Integrated Design Environment
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Product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
Test Platform
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Custom Design & Manufacturing
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Engineering and manufacturing solutions serving aerospace and defense, including interiors, composites, and complex assemblies.
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Product
6.8 GHz Wideband Synthesizer with Integrated VCO
ADF4356
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The ADF4356 allows implementation of fractional-N or integer-N phase-locked loop (PLL) frequency synthesizers when used with an external loop filter and an external reference frequency. A series of frequency dividers at another frequency output permits operation from 53.125 MHz to 6800 MHz. The ADF4356 has an integrated VCO with a fundamental output frequency ranging from 3400 MHz to 6800 MHz. In addition, the VCO frequency is connected to divide by 1, 2, 4, 8, 16, 32, or 64 circuits that allow the user to generate RF output frequencies as low as 53.125 MHz. For applications that require isolation, the RF output stage can be muted. The mute function is both pin- and software-controllable.
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Product
PCB S.I/P.I (Signal Integrity/ Power Integrity)
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Why need for PCB Simulators?Higher data speed (>GHz) Higher density Larger system size EMI concern Cost cut down Reduce of project term
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Product
Automated Test Environment
AS5657-ATE
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The AS5657 Automated Test Environment (AS5657-ATE) is designed to automate device compliance testing according to the SAE-AS5657 “Test Plan/Procedure for AS5643 IEEE-1394b Interface Requirements for Military and Aerospace Vehicle Applications”. The purpose of this tool is to automate and simplify the task of AS5643 compliance verification and testing, which of course is essential for device compatibility within avionics and aerospace programs.
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Programmable Demultiplexers with Integrated CDR
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Advanced Science and Novel Technology, Co., Inc.
Broadband digital deserializer 1-to-16.Low-power LVDS output data buffers with a proprietary architecture.Clock-divided-by-16 LVDS output buffer with 90-step phase selection.Single +3.3V power supply.Industrial temperature range.Low power consumption of 730mW at 17Gbps.Custom 100-pin CQFP package (13mm x 13mm).
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Product
Current Integrated Sources
CIS
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The CIS current integrated source was designed to provide a stable alternating current source for the electricity meter test equipment, and in laboratories. The output current is isolated and independent from the mains voltage. Different CIS versions are available depending upon the values of output power and output current required.
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Integrated Function Tester for Inductance Ballast
UI2001B
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• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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Product
System Design and Prediction Tool
MAPP 3D
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MAPP 3D, a free software application for macOS and Windows, is a powerful, multipurpose sound system design tool that delivers precise, high-resolution predictions of sound energy distribution in a three-dimensional sound field. From preproduction to post-show analysis, work faster and smarter with the ability to streamline processes and consolidate designs in one simple, accurate 3D model.
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Omniblock Integrated X-Ray Systems
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Omniblock® X-ray generators from Excelitas Technologies integrate the high-voltage source and X-ray tube into one consolidated housing. This design configuration eliminates the high-voltage cables and connectors reducing cost while improving system design flexibility and streamlining integration. They are specifically designed for generating X-rays in static or rotating applications using proven designs of up to 180 kV and 2.4 kW. Typical applications for Omniblock X-ray generators include baggage screening, medical imaging, food inspection, industrial analysis and many other cost-sensitive and space-constrained X-ray applications.
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SoftTest Design Testing Services
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We are a one-stop turn-key solution provider for the design, development, integration and support for Automated Test Systems. Our capabilities include Functional parametric and non-parametric test systems, intelligent go/no-go gauges, vision systems and a variety of fixtures and adaters to interface with the product under test the most efficient way possible. SofTest Designs can adapt the development architecture to meet the preferences or requirements of our customers in terms of instruments, interfaces and software. With our own in-house machine shop, our development and integration times are greatly reduced optimizing resources and transfering the benefits to our customer's applications.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Digital Current Integrator
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The ORTEC Model 439 Digital Current Integrator was designed to accurately measure DC currents or the average value of pulse currents such as produced by accelerator beams. It digitizes the input current by producing an output pulse for specific values of input charge. A front-panel switch permit the selection of three different amounts of charge (10–10, 10–8 or 10–6 coulomb) required to produce an output pulse. The instrument has a digitizing rate from 0 to 10 kHz to provide wide dynamic range on each setting and high-resolution readout without meter interpolation.
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Integrated Test Environment
ITE
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The Integrated Test Environment (ITE) is our solution to handle complex hardware or software test projects.ITE provides features to define and manage requirements and test cases in different documents, link them with each other as well as plan tests and test campaigns. Moreover the tests can be developed, executed and evaluated by considering the linked requirements. Test results can additionally be recorded and finally reported in different, adaptable and configurable reports.
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Debugging Environment
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Only designers who make no mistakes can avoid debugging. The question is, how fast can you debug? That depends largely on how clearly the issues identified by your tools are presented. A good debugging environment can save hours of frustration and tedium.
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Integrated Transformer Test Van
XD90
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Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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Product
PCI Altera 485/LVDS - Altera User Design
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The PCI compatible PCI-Altera-485/LVDS design is for the advanced user who wants to implement their own Altera design or requires reconfigurable logic. The PCI-Altera-485/LVDS makes the implementation and use of the 20K400E easy. Larger Altera parts are available. The design comes with the basic features built in and the specific features ready for you.
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Product
Transmission & Integrating Sphere FT-NIR Spectrometer
QuasIR™ 4000
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The QuasIR™ 4000 was designed from the ground up to offer the industry a new kind of NIR analysis solution – a solution that brings together the portability required to move NIR analysis closer to point-of-need, combined with unmatched spectroscopic performance for the fastest and most accurate results.
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THIN AI Motherboard 12th Gen Intel® Core™ Processor (Alder Lake), MXM GPU Integration
AIMB-288E
Motherboard
12th Gen Intel® Core™ Desktop Processors (LGA1700), with H610ESupport Intel Arc Embedded MXM GPU or NVIDIA Quadro Embedded MXM GPUUp to 64GB DDR5 4800 MT/s with two SO-DIMMTriple displays with 2 DP and 1 eDP, up to 4KAbundant Expansion: 1 M.2 M-key & 1 M.2 B-key, 4 USB 3.2 Gen2x1 & 2 USB 3.2 Gen1x1, 1 SATA IIISupport Windows 10 LTSC & Ubuntu 20.04 LTS; SUSI API, and WISE-DeviceOn for quick AI deployment at scale
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Integrated Vehicle Health & Monitoring
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Military vehicles must have the ability to meet evolving combat requirements while operating under hostile conditions and the reliability to function effectively under such conditions. Integrated Vehicle Health Monitoring (IVHM) systems combine a range of diagnostic tools within a single platform and provide around-the-clock, intelligent diagnostics on critical mission, air, land and sea applications.
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Predicting Microwave and RF Designs Virtually
RF Module
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The RF Module is used by designers of RF and microwave devices to design antennas, waveguides, filters, circuits, cavities, and metamaterials. By quickly and accurately simulating electromagnetic wave propagation and resonant behavior, engineers are able to compute electromagnetic field distributions, transmission, reflection, impedance, Q-factors, S-parameters, and power dissipation. Simulation offers you the benefits of lower cost combined with the ability to evaluate and predict physical effects that are not directly measurable in experiments.
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Product
RF Solution Integrated Handler
3240-Q
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The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
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Product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
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The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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Parallel Differential Battery Tester With Integrated Chamber
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Accelerate your battery parallel test using our PDBT. Featuring an integrated chamber, it precisely conducts battery comparison test and fast measures battery's self-discharge current. Its portable, powerful design is perfect for innovative research applications.
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Product
Powerful, Fully Integrated Workstation for Emission Microscopy
PEM-1000
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The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Futureproof Your Control PLD And Bridging Designs
MachXO3
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*Up to 9400 LUTs with up to 384 I/O pins*Instant-on 1 ms boot-up with background upgrade, Hitless I/O reconfigure and dual-boot error recovery*Available with 3.3/2.5 V core or low power 1.2 V core – including additional options on 9400 LUT devices*MachXO3LF includes programmable Flash and User Flash Memory (UFM)*Available in amazingly small (2.50 x 2.50 mm, 0.4 mm pitch) WLCSP packages and BGA packages with 0.50 mm and 0.80 mm pitch
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3D Design
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Rapid Design Exploration. Created for design engineering workflows, our intuitive product design software generates a fast user experience. Rapid design exploration includes detailed insight into real-world product performance. Live physics and accurate high-fidelity simulation combine into an easy-to-use interface that supports faster-time-to-market.
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NFC and EMVCo Conformance and Design Validation Solution
Micropross MP500 TCL3
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The MP500 TCL3 Generator/Analyzer is a high-performance test solution for designing and characterizing NFC devices. Built specifically for the laboratory environment, the MP500 TCL3 offers advanced signal generation features for unmatched flexibility. It supports the following standards:
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RE Family Development Environment
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Renesas offers integrated development environments, driver software, sample code, an evaluation kit, and flash programmers for accelerating your system development.
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Photo Detector with Integrated Transimpedance Amplifiers
ADN3010-11
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Analog Devices optoelectronic amplifiers include a range of germanium photodiodes that, through a proprietary process, have been monolithically integrated with silicon transimpedance amplifiers and limiting amplifiers. This process eliminates the need for bond wires connecting the photodiode to the transimpedance amplifier, which leads to improved performance and greater manufacturing reliability. Our portfolio of products also supports the growing need for optical and electrical interface miniaturization.
