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Test Handler
M4171
Advantest’s M4171 single-site handler combines these capabilities in a portable design that is ideally suited for use in engineering environments.
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Striptest Contactors
ULTRA® CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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ULTRA® Contactors
ULTRA CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Automated Fiber Handler
1200
The 1200 Automated Fiber Handler is the first fiber preparation product that enables optical fiber manufacturers to significantly reduce the cost of production measurements by automating the critical optical fiber stripping, cleaning, cleaving and temporary coupling processes.
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Kelvin Test Contactor
cCruiser
cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.cCruiser is the versatile solution for testing small discrete ICs. Its side-by-side Kelvin design is optimized for tri-temp capable insulation layer with extended Automotive temperature range -60°C to + 175°C. Contact socket is G-Pin footprint compatible with a contact spring wear out zone. Featuring conventional onboard socket contact mounting and 80 mΩ low and stable contact resistance. Denmark base material with various plating options, including pure Springs, LEDA, cGold and “state of the art” Thebe.
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Capacitor Leakage Current Meter
DU2316/2317
Delta United Instrument Co., Ltd.
Leackage Current range display: 0.0001uA ~ 20.00mAAutomatic or Manual trigger with CHARGE/TEST/DISCHARGE100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceHi / Lo current limit setting & PASS/FAIL judgment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Programmable LCRZ Meter
DU-6212/6215/6216
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 55 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Pick And Place Contactors
Designs available for all Pick and Place handler brands, suitable for all range of packages with Multiple Pitch and various numbers of I/Os. Full tri-temp capability up to 180 Deg C.
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
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ROV Thickness Gauges & Probe Handlers
ROV Thickness Gauges & Probe HandlersCompleting the Cygnus ROV Mountable thickness gauges, a range of ROV Probe Handlers have been developed to offer an engineered probe handling solution. Each probe handler will work with a thickness gauge of the Cygnus ROV Mountable range listed below.
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Software Tool Especially Designed for Production Process Supervision
LEON OP
The Leon OP is a software tool especially designed for production process supervision. Therefore, the application provides the following key features:- Execution of KT ICT sequences or NI TestStand sequences- Parallel, semi-parallel or sequential execution of test sequences, individually definable per Test Sequence- Customizable User Interface, simple or detailed test views, grid or board layout arrangement possibilities- Tracing into sequence execution- User management with different user levels and restrictions per user group- Displaying execution results and statistics by panel or nest- Supporting interaction with an automation (e.g.: handler system)- Supporting interaction with a process control / MES system- Integrated Callback structure to adopt to different workflows- Maintenance view for fast displaying of fails inside a board- Result History View to quickly access the last test results- Store execution results in result files with user defined format- Autostart-option for running application in automation mode without any operator interaction at all- Several abortion criteria to abort execution by fail count (consecutive or time based)- A Maintenance View for viewing testprobe locations on the DUT is available via Aster Quadview
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Test Handler
ETH
The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Tri-Temp Test Handler
JANUS 2800T Tri-Temp Handler
SESSCO Janus 2800T Tri-temp Handler is designed to accommodate small to medium size standard and custom IC packages. Supports high parallelism of up to octal sites and is equipped with dual high-speed input tube loaders and dual auto output tube unloaders for higher throughput up to 28K UPH. With over 500+ I/O and 16 temperature zones available, it has plenty enough resources for the most demanding applications. It can be customized for MEMS applications and high-voltage testing. Powered by a cutting-edge 10 ns/step all-integrated controller and modular programming design.
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High Speed Gravity Handler
MT9928 xm
This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.
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Automated Lead Frame Testing
Sigma MAG
The Sigma MAG comes with an independent lead frame (un)loader for hands-free bond testing. The magazine handler is compatible with OHT and AGV and allows top and front-loading of multiple types
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Automated Test Handler
In-Line Duomax
100 % Automated Fixture Change1.5 N x 8000 Test PointsICT FCT EOL IntegrationHigh ProductivityHigh QualityGreat ROINo PLC
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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100Hz-50kHz LCR Meter
Chroma 11021/11021-L
Chroma Systems Solutions, Inc.
The Chroma 11021/11021-L are the most cost-effective digital LCR Meters, providing 100Hz, 120Hz, 1kHz, and 10kHz test frequencies for the 11021 and 1kHz, 10kHz, 40kHz, 50kHz test frequencies for the 11021-L. Standard RS232 interface, optional GPIB & Handler interface, high speed and stable measurement capabilities enable the Chroma 11021/11021-L can be used for both component evaluation on the production line and fundamental impedance testing for bench-top applications.
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Inline Handler W/Bypass Line Master
6TL35
A perfect basis for a heavy-duty, reliable, high precision, and automatic integrated Test system for medium to high demanding environments. Important technical and economic advantages due to their modular structure and expansion capability are evident. The production testing environment will be flexible and efficient, helping towards the always valued Return of Investment.
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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High-Throughput Film Frame Handler
MCT FH-1200
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
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Turret Contactors
Design available for all Turret handler models. Leaded and Leadless packages, device pitch down to 0.20mm for Kelvin and Non Kelvin testing on both thermal and ambient environment.
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PHOTO COUPLER TESTER
May be linked to machine handler for automatic test on production line.Test items include：VF、IR、Vceo、Iceo、Vsat、CTR
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RF Solution Integrated Handler
3240-Q
The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
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Tube-To-Tube Gravity Handler
Rasco SO1000
The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.
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Gravity Test Handlers
Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.
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Wafer Level Test Handler
Kronos
Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Film Frame Test Handler
4170-IH
High throughput ・High withstand load, and high thrust table ・Expansion of the strip attachment area ：260(L) X 300(W) [Withinφ300mm for WLCSP]・LOT control by barcode/2D code reader ・Easy device type exchange only test socket and display screen setting・Auto-cleaning function unit is installed to clean the socket at any desired timing.・8/12 inches ring conversion ・S2/S8 regulation compliance・SEMI G85 compliance・SECS/GEM compliance
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Cantilever Spring Pin ULTRA
CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
