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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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MPI Manual Probe Systems
MPI Advanced Semiconductor Test
manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Electrical Probe Systems
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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General Purpose Probes
PIT-12
PIT-12 General Purpose Probe for Pressurized Systems - 12'' #304 stainless steel shaft. Diameter is 1/16''. Immersible. Maximum temperature 350°C, Time constant 0.5 Seconds. Shaft Terminated in a sub-miniature Type T Thermocouple plug. 10 foot Sub Miniature Type T extension lead supplied. Not isolated.
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Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Custom solutions
Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: develop customized optical probes and inspection stations develop inline probe fixtures for production environments adapt Novacam standard interferometer component modules to suit your application help integrate Novacam systems or components with third-party tools write customized software
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Software
DIGITIZER
The Digitizer allows the recovery of design data of unknown assemblies by an electrical analysis with a Condor flying probe test system
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Precise 3D Profilometry
µscan
Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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Single-Point Kelvin Probe
Our Single-Point Kelvin Probe system (KP020) is the introductory system in the KP Technology product family. The off-null signal detection method allows high-quality measurements of the Work Function/Fermi Level of materials.
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Probe Card Analyzers
PB1500
The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.
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InfiniiMax III+ Series Probe Amplifier, 4 GHz
N2830A
The N2830A Series InfiniiMax III+ probing system is the next generation of InfiniiMax probing, greatly expanding the measurement capability and usability of a probe capable of measuring all components of a differential signal. The built-in InfiniiMode technology allows customers to switch differential, single-ended, and common mode without adjusting probe tip connections.
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Multi-Cell Test System
Cellcia
Next-generation wafer probing system for 300mm wafers. The multi-layer system structure maximizes the efficiency of testing, further reducing the total testing cost.
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Flying Probe Systems
Smaller production series and fast prototyping requirements combined with zero fixturing costs are factors driving the development of Flying Probe testers. Today, Flying Probe Technology has matured and Columbia can supply single- or double-sided flying probe testers to be used on both loaded and bare PCBs.
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MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
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Failure Analysis
Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Pilot VX
Pilot VX is a flexible, configurable flying Probe test system with an unrivaled set of technologically advanced tools, able to provide the test solutions required by the huge diversity which characterizes today’s electronics.
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Wafer/Chip/Package Semi-automated ESD Tester
400SW
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Sampling Scope Adapter
N5477A
The N5477A sampling scope adapter makes the InfiniiMax III probing system fully compatible with the Infiniium 86100 DCA sampling scope family. With the N5477A, the DCA modules have 30 GHz of probing, increasing their performance and flexibility.
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Device Characterization
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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Fully Automatic MRAM Probe System With Initializers
*This system can measure MRAM characteristics automatically.*Automatically initializes(resets) before and shorten the time of measurement by having a built in initializer.*Generates strong and constant magnetic fields. (Prober: Max 1.5T, Initializer: 2.7T (the highest in the industry)
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Precision Flying Probe Platforms For Automated Test Applications
Flying Probe technology is used to automate the testing of printed circuit boards (PCB) that would otherwise have to be tested manually. Adding a Huntron Access Prober to your test procedure will significantly decrease test times therefore increasing productivity.Access Probers can accurately place a probe on test points with high accuracy achieved using micro-stepping motors and linear laser encoders. Probing the smallest surface mounted devices is possible. Huntron Access Probers can automate your unique test process using the standard probe or by adding a custom probe of your design. Huntron offers three Flying Probe system configurations based on PCB size and test head requirements.
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Tunable Laser Hydrogen Chloride Analyzer
TX-100
Laser HCl analyzer with a probe type optical system which employs direct insert method. TX-100 is suitable for monitoring HCl concentration in incineration plants and the control of HCl removal process in various industries including cement factories and petrochemical plants, etc.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Four-Point Probe
Materials Development Corporation
Materials Development Corporation offers the complete line of Four Point Probe systems from AIT. Systems are available to measue up to 12" diameter (300 mm) wafers as well as specialty systems for Photovoltaic wafers and substrates. For more information on these systems, contact MDC.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
