TestStation Product Family
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Product
TestStation Multi-Site Inline
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TestStation Multi-Site Inline is the most productive, lowest cost in-circuit test solution. This "zero-footprint" inline test system provides true 2x-4x parallel test, delivering 200% to 400% greater productivity, and 40% to 50% lower total cost of test.
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Test System
UltraFLEX
Test System
The UltraFLEX test system delivers the power and precision you need for complex SoC devices built for mobile applications, networking, storage or high-end processing. Choose UltraFLEX when your device mix and throughput goals demand the highest speed, precision, coverage and site count.
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Unlisted Product
Test System
J750
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Teradyne’s J750 platform is the industry standard for cost-effective test of a broad set of diverse microcontroller, FPGA and digital audio/baseband devices. The system is widely available at more than 50 OSAT locations and is supported by a complete set of production interface solutions for wafer sort and final test.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Unlisted Product
Test System
ETS-88
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The ETS-88 is a new breed of high-performance multisite production test equipment that focuses on high-volume mixed-signal commodity and precision devices. Highly scalable, the ETS-88 provides four reconfigurable test heads that allow customers to run up to four independent applications simultaneously. The ETS-88 is fully compatible with Eagle's product family, using the same pattern-based floating resources and Eagle Vision Software that customers expect from an Eagle platform.
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Unlisted Product
Test System
ETS-200T / ETS-200T-FT
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The ETS-200T / ETS-200T-FT discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. Both the ETS-200T and the ETS-200T/FT provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter. Raptor™ software reduces program generation by providing a graphical user interface that does not require any programming experience combined with a robust set of test libraries and proven test techniques to increase test volumes and reduce cost of test.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Unlisted Product
Test System
MicroFLEX / FLEX
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The microFLEX and FLEX test systems deliver cost-efficient multisite production test for devices operating under 200 MHz digital speed. Choose microFLEX / FLEX for testing mid-range devices for power management, automotive, audio and video. With microFLEX / FLEX, you optimize capital investment while achieving superior performance and throughput.
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Unlisted Product
Test System
ETS-88TH
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Teradyne, Inc. introduces the ETS-88TH, the latest addition to the ETS-88 product line designed to test IGBT, MOSFET, and power module devices. The ETS-88TH provides an overall lower cost of test with the ability to combine AC and DC testing in a single device insertion. "The ETS-88TH has proven superior AC test performance for discrete and power module devices while lowering the cost of test for customers,” said Steve Price, Business Development Manager for Teradyne’s Consumer Power Business Unit. “With the AC-2500 instruments, the low inductance path and fast waveform transfer, customers benefit by providing higher device specifications, greater test coverage, and higher throughput.”
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Unlisted Product
Test System
ETS-800
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The ETS-800 test system is a next-gen automotive test platform with the industy's highest throughput and fastest time to market. The platform covers a broad range of analog, digital, and mixed-signal applications such as Automotive SOCs, Power Management ICs, and general purpose analog and mixed-signal devices. The system provides an air-cooled test head containing four sectors of instrument slots. Each sector contains 10 slots for a total of 40 test head slots to accommodate a robust suite of instruments.
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Product
Storage Test
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Teradyne, Inc. is a leading global supplier of Storage Test solutions. Since delivering our first Hard Disk Drive tester in 2007, we have been supporting our customers in producing the best HDD products in the market. Enabled by our scalable high-density architecture, high-speed automation, precision HDD handling, and carefully controlled test environment, our customers have access to a single platform for all their HDD tests that can keep up with their aggressive production schedules.
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Unlisted Product
Functional Test System Platform
Spectrum-9100
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The Spectrum-9100 functional test platform is designed to meet the testing demands of today's sophisticated defense and aerospace electronics. The system is optimized to support a range of products from legacy products designed in the 1970's through the latest state-of-the-art products with GHz real-time processing requirements. Configured with Teradyne's state-of-the-art VXI and PXI instrumentation, along with carefully selected third-party instrumentation, the Spectrum-9100 offers the best proven solution for testing high-mix products.
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Product
High-Speed Memory Test Solution
UltraFLEX-M
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The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Product
Fastest In-Circuit Test Platform
TestStation
Test Platform
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Unlisted Product
Functional Test System Platform
Spectrum HS
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The Spectrum HS functional test platform is designed to meet current and future defense and aerospace test demands. The Spectrum HS employs an open architecture that allows Teradyne engineers to quickly produce tailored configurations to meet customer-specific requirements. With a suite of modular building blocks for the system's infrastructure, the Spectrum HS can be sized to meet today's needs, while ensuring that flexibility exists to scale the system to handle future test requirements.
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Unlisted Product
High Speed Automation for TestStation
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Teradyne's TestStation High-Speed Inline Automated Handler is compatible with TestStation Multi-Site Inline configurations designed for the most productive and lowest cost in-circuit test package.
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Unlisted Product
TestStation
Rackmount
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TestStation Rackmount (TSR) is designed for easy integration into high-volume automated manufacturing lines. This solution is a collection of specifically designed hardware modules that can be easily integrated into standard or custom automation handling equipment.
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Product
Automated Inline In-Circuit Test Solutions
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Automated versions of Teradyne’s TestStation systems are designed for short takt time automated lines. The TestStation Automated Inline Handler, coupled with a TestStation Test Insert forms a combined integrated solution for any mix, any volume PCBA manufacturing.
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Product
TestStation Rackmount
TSR
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TestStation Rackmount (TSR) is designed for easy integration into high-volume automated manufacturing lines. This solution is a collection of specifically designed hardware modules that can be easily integrated into standard or custom automation handling equipment.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Offline In-Circuit Test Solutions
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TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.



























