Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
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Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Compliance Test Systems
LMG Test Suite
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ZES ZIMMER Electronic Systems GmbH
The ZES ZIMMER test system LMG Test Suite tests in accordance with the currently valid version of EN 61000-3-2/-12 or EN 61000-3-3/-11 and also supports measurements per ECE R-10.4 Annex 11 (e.g. electromagnetic compatibility of vehicles). As a manufacturer of precision power measurement technology, we are represented on the international standards committee. As a result, changes in standards are immediately incorporated into our test systems.
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Battery Test Systems
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Was designed to meet the specific demands of our loyal customers. This system is used to test both single cell batteries as well as super-capacitors.
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VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Function Test Systems
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These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Product
Optics Test Systems
IR Autocollimator
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Optik Elektronik Gerätetechnik GmbH
The infrared autocollimator was specially designed for the 1550 nm wavelength range. In conjunction with the CROSDETECT evaluation software, it achieves a measuring accuracy of 1 arcsec with a resolution of 0.1 arcsec. The camera used is suitable for the wavelength range from 900 nm to 1700 nm.
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Product
Electrodynamic Vibration Test Systems
CV-series
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CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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Product
Optics Test Systems
Mirror Collimator And Autocollimator
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Optik Elektronik Gerätetechnik GmbH
Mirror collimator and autocollimator for the entire wavelength range from UV to MIR The compact mirror collimator can be used both as an autocollimator and as a telescope.
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Product
Optics Test Systems
MTF Measuring Device For Endoscopes
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Optik Elektronik Gerätetechnik GmbH
Manual MTF measuring device for endoscopes. The measurement setup is based on modular individual components that can be arranged on a breadboard according to the type of endoscope (angle between light entrance and eyepiece).
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Product
Memory Test Systems
T5503HS2
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Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Vehicle Test Systems
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What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Conformance Test Systems
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With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
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Product
Battery Test Systems
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Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10
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Product
Test Systems
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This measurement system is the state-of-the-art acoustical analyser from Norsonic. Using the experiences and accumulated know-how from the previous generations of analysers, Norsonic is offering a multi-channel system with focus on user friendliness, high efficiency, and accurate reporting. The system has been designed for field testing as well as demanding accredited lab measurements.
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Portable Test Systems
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We refer to test meters with an integrated source as test systems. Test systems are particularly useful when you need custom current and voltage values when testing meter installations, but only want to use a single device.
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Vibration Test Systems
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HIACC Engineering & Services Pvt. Ltd.
Designed to simulate real-world vibration, shock, and environmental stresses for product reliability testing.
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Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others. Combined with the most comprehensive suite of hybrid characterization techniques, the TI 990 TriboIndenter, TI 980 TriboIndenter, TI Premier Series, and TS 77 Select nanoindenters will keep your materials development at the forefront of technology.
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Cleanliness Test Systems
CM Series
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The Contaminometer (CM Series) test systems were originally developed by Protonique, the business of industry guru Brian Ellis. They also featured in the early development programmes of "cleanliness measurement" carried out by the US Department of Defense at China Lake in the 1970s.
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Test Systems
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Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Functional Test Systems
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Acculogic offers commercial functional test systems for a broad range of manufacturing test applications, including automotive and military-aerospace.Designed for production testing, our solutions are optimized for throughput, reliability, repeatability, and cost
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AVL Battery Test Systems
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In modern electrified powertrains (xEVs), huge demands are placed on batteries. These electrochemical energy storage and conversion devices must meet market requirements such as long-lasting high power and energy performance, and dynamic charge and discharge processes.
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Mixed Signal Test Systems
MTS2010i
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The MTS-2010i are a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Solar Test Systems
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AMETEK Scientific Instruments manufactures a range of application specific XM (Xtreme Measurement) products focused on solar cell / photovoltaic research (developed in collaboration with Professor Laurie Peter of the University of Bath, UK). These products are so versatile that they can also be used for photoelectrochemical (PEC) water splitting applications; and make use of Solartron’s unique high performance XM specified potentiostats and frequency response analyzers to provide a full complement of techniques for research into energy, corrosion and analytical electrochemistry.
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Multi-Stage Functional Test Systems
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Circuit Check’s bi-level and multi-stage fixtures combine multiple test levels in a single fixture using controlled actuation and selected probe travels for powered and unpowered tests.
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AirTech Test Systems
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Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
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Line Noise and Vibration Test Systems
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The sound and vibration characteristics of your product can be used to identify many common mechanical and assembly defectives.
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Electrodynamic Vibration Test Systems
DC-series
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Depending on the reference PSD or other operating conditions such as the specimen, one part of the controlled response may deviate from the reference PSD





























