Fine Pitch Probes (300µm - 500µm) FP300D2901B015G030L057

1023005 - FEINMETALL GmbH

The Fine Pitch Probes (300µm - 500µm) FP300D2901B015G030L057 represent a sophisticated solution designed for high-precision applications in electronics testing and assembly. With a double plunger probe configuration, these probes are engineered for flexibility and high temperature resilience, operating efficiently within a temperature range of -45°C to +120°C. The compact design features a pitch of 0.40mm (16 mil), making it ideal for densely packed circuitry. The advanced materials utilized, including beryllium copper for the plunger and nickel plating for the barrel, ensure durability and reliable performance even under rigorous testing conditions.