Product

Auxiliary Equipment For Probing Machines

-

Tokyo Seimitsu Co., Ltd.

Tokyo Seimitsu Co., Ltd.

We have a lineup of products that support the probing process.

Product

Probing Machines

-

Tokyo Seimitsu Co., Ltd.

Tokyo Seimitsu Co., Ltd.

Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.

Product

Topside Probing for Functional Test Fixtures

-

Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.

Product

Magnetic Probing Systems

MPS-C-300 and MPS-C-350

-

MicroXact, Inc.

MPS-C-300 and MPS-C-350 - MicroXact, Inc.

MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.

Product

CMM Contact Measurement (Probing)

-

Exact Metrology

Exact Metrology

A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.

Product

Vacuum Probing Systems

-

SemiProbe

SemiProbe

Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the  Vacuum Probing System. All key modules are interchangeable and upgradeable.

Product

Topside Probing In-Circuit Test Fixtures

-

Circuit Check, Inc.

Circuit Check, Inc.

Circuit Check matches top side test targets to your specification and needs. The Signature Series pneumatic drive fixture is the industry standard for precision, accuracy and repeatability.Today’s fifth generation Pneumatic drive supports as many as 8,000 test probes with centerline spacing to 25mil, and contacting test pads as small as 0.014″.

Product

Probing, Monitoring & Setting

-

Marposs S.p.A.

Marposs S.p.A.

Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.

Product

Robotic Probing of Circuit Cards

-

BCO, Inc.

BCO, Inc.

System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.

Product

Probing Adaptors

-

Nexus Technology, Inc.

Nexus Technology, Inc.

Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.

Product

Twist Proof Probes (F756) F75684B0004G150

1011580

-

FEINMETALL GmbH

1011580 - FEINMETALL GmbH

The Twist Proof Probes (F756) F75684B0004G150 are designed to deliver precision and reliability in various applications, with a basic contact probe structure that ensures optimal performance even under extreme conditions. Engineered to withstand temperatures from -45°C to +200°C, these probes feature a pitch of 2.54 mm, ensuring compatibility with a range of devices. The careful design encapsulates technical specifications such as a continuous current capacity of 5.00 A and a typical contact resistance of just 25.00 mOhm, marking them suitable for high-efficiency operations.