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Product
Probes
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Replacement or Additional 9V 230V/110V Power Supply. Requires a standard IEEE mains interface cable
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Product
Power Probes
RkT Thermopile Series
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The RkT Series thermopile power probes are ideal for measuring Nd:YAG, CO2, and other mid-power lasers. The probes are designed to withstand average power densities up to 20kW/cm2 (15MW/cm2 peak pulse power density). The flat UV to far-IR spectral response allows the probes to measure broadband sources as well. Measure the power of cw sources or the average power of sources pulsed at 5Hz or greater.
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Product
Interface Probes
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Low resistance used in: *ICT Testers *Functional Testers *Special Purpose Machines
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Product
Contact Probes
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Rika Denshi Group Contact Probes - specialty probes including fine pitch testing, high frequency testing, high temperature testing, kelvin test, and high current test, as well as standard probes for 0.4mm-, 0.5mm-, 0.65mm-, 0.8mm-, and 1.0mm pitch.
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Product
Probes PH
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Durable sensors designed for continuous, in-line measurement of acidity or alkalinity in industrial liquids.
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Product
Analyzer Probes
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The following probes are available for the MA51x0 and MA41x0 series analyzers. These probes are designed for low-voltage and high-speed midbus probing or probing with an interposer. The following JEDEC memory standards are widely used by these probes: DDR5 (JESD79-5), DDR4 (JESD79-4), DDR3 (JESD79-3), LPDDR5 & LPDDR5X (JESD209-5), LPDDR4 & LPDDR4X (JESD209-4), and LPDDR3 (JESD209-3).
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Product
DDR3 MSO Probes
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The DDR3 DIMM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR3 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR3signals for convenient analog probing.
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Product
Transducers and Probes
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Olympus NDT probes and transducers are high-quality inspection equipment available in a range of frequencies, configurations, connection styles, and cable types. All our probes and transducers are lightweight but solidly constructed.
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Product
Test Probes
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A physical device used to connect electronic test equipment to a device under test (DUT).
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Product
Raman Fiber Probes
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For ultimate flexibility, fiber-coupled Raman probes offer a compact design and a rugged, robust construction for a wide range of applications. With an optional integrated camera, the user can locate a precise region of interest prior to analysis. Also available are immersion probes and non-contact optics.
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Product
Temperature Probes
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Our Temperature Probes are ideal for the Instrumentation, medical, communication, machine builder and HVAC industries.
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Product
Scanning Probes
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Scanning probes can acquire several hundred surface points each second, enabling measurement of form as well as size and position.
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Product
ICT / FCT Probes
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*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Product
Hall Effect Probes
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Magnetic Instrumentation manufactures Hall Effect Probes in a wide range of styles and sizes. Probes are supplied with magnetic, electrical, temperature stability and calibration data for each measurement range.
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Product
Microwave Probes
S-Probe
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S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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Product
Electrical Resistance Probes
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Electrical resistance (ER) corrosion probes are commonly used in petroleum, chemical processing, and other environments where on-line corrosion rate readings are required. Whereas test coupons must be removed from the process for evaluation, corrosion probes can allow corrosion rate determination without probe removal.
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Product
Other Passive Probes
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Probes connect the input of the oscilloscope to test points on the device under test (DUT). There are many types, including: high impedance passive, low capacitance, single-ended active, differential active, high voltage, and current probes. This is the first in a series of three articles on probe selection and application, and will focus on passive probes. Part 2 and part 3 will address active probes and current probes, respectively.
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Product
Test Leads and Probes
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Test leads and probes are an intergral part of a complete measurement system and extend the capabilities of your digital multimeter.
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Product
Touch-Trigger Probes
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Touch-trigger probes measure discrete points, making them ideal for inspection of 3-dimensional geometric parts.Renishaw provides a comprehensive range of systems to meet the application needs and budget constraints of all users, from simple feature checks on manually operated CMMs, to complex part measurement on high-speed computer controlled machines.
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Product
Oscilloscope Probes and Accessories
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Teledyne LeCroy has a wide variety of world class probes and amplifiers to complement its product line. From the ZS high impedance active probes to the DH Series Differential High-bandwidth Probes which offers bandwidths up to 30 GHz, Teledyne LeCroy probes and probe accessories provide optimum mechanical connections for signal measurement.
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Product
Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Microscopic Probes
M12PP
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CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
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