Electron Microscopes
scientific instruments that use a beam of highly energetic electrons to examine objects on a very fine scale.
See Also: Transmission Electron Microscopes
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Wireless Electronic Flight Bags
webFB
The ultra-compact webFB easily fits in the palm of the hand, yet incorporates the capabilities of both an AID and a wireless server. The built-in AID safely gathers essential data from the aircraft's ARINC 429 and 717 databuses and conveys it to custom software or EFB apps hosted on the internal server. Using a wireless connection to portable EFB tablets, the webFB securely delivers this valuable information right to the fingertips of the flight crew.
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4500~6000W DC Electronic Loads
JT634 Series
Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
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Electronic Line Stretchers
Simplify VCO measurements with controlled phase shifts from 180 to 1300 MHzOver 360° phase shift of the reflected signalNormalized and stable magnitude of the reflected signalVoltage controlled for automated applications
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DC Electronic Load
3110 Series（250W~700W）
Each 3110 Series stand-alone load has its own control and display panel, CC / CR / CV / CP/ Dynamic modes, also can be controlled intranet via RS232 and USB interface.
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Electronic Ballast Analyzer
WT3000
• It has 8 windows to display each parameter of input and output characteristics • Frequency response for testing input current up to 1MHz, suitable for precise testing of various kind of electronic ballast • WT3000 has expanding analysis for envelope wave. • Symmetry analysis for envelope wave’s crest factor of lamp current • Sampling at ultra-high speed, dynamic analysis single frequency curve, highest sampling frequency is up to 10MHz • Portable with built-in chip micro-processor, particular suitable for development and spot production • RS-232C standard interface can be connected to PC, English version software can run in WinXP or Win7
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250 Watt Electronic Load Module
N3307A
The Keysight N3307A is a 250 W (0-30A, 0-150V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3307A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3307A can also digitize waveforms.
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DC Electronic Load, Single-Input: 150V, 40A, 250W
EL33133A
The Keysight EL33133A bench DC electronic load provides a single input and a built-in data logger. Provide static or dynamic load test up to 40 A and 150 V. Display results in a meter view or over time using the built-in data logger.
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High Power DC Electronic Load
34000C Series（6KW~24KW）
34000C Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store / Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface.
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Heating Microscope
Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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Electronic Assembly
WinSoft employees succeed in some of the most demanding assembly operations - from aerospace disciplines, automotive, electronic manufacturing services and consumer products to COTS products.
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DC Programmable Electronic Load
ELCH300
- VFD display- High resolution 0.1mA/1mV- Voltage range 0V to 500V- Working mode CV/CC/CW/CR/OV/OC/- OP/OT protection- Communication: USB/RS232/GPIB
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Electronic Ballast Automatic Test Equipment
ATE-1
Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
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Workshop Equipment for Electronics
PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 7mm, 2 Port
85091D
The Keysight 85091D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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DC Electronic Load Modules For The N6700 Power System
Test devices that store or convert energy by adding a DC electronic load to your Keysight N6700 Series power supply. The Keysight N6790 Series electronic load modules can perform a static or dynamic test and are available in two sizes: single-wide 100 W and double-wide 200 W modules.
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Electronics
Flann provides control processors and switch drivers that support all Flanns current range of programmable attenuators, phase changers and waveguide switches
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Electronic Brake Meter
2000-R
The Bowmonk 2000-R is our next generation electronic brake meter, featuring a built-in printer, keyboard, GPS receiver, and coming soon built-in Wi-Fi for automatic uploading of brake test results. Significant processing power and on-board storage enables the Bowmonk 2000-R to be customised for various applications. The Bowmonk 2000-R also supports an optional pedal force transducer to measure the force applied to the vehicle's footbrake during braking. Using the pedal force transducer will also identify any "braking delay" - the time between depressing the brake pedal and the brakes being applied.
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Indicators - Electronic
An electronic device used to read an input value from a measuring device and show a displayed value.
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DC Electronic Loads
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
NGI DC Electronic Loads
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Inverted Metallurgical Microscope
GX53
Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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OEM, Embedded, and Custom Electronics
Picosecond timingPrecision analog and mixed signal processingDigital delay and pulse generationHigh speed photonics and fiberoptic timing distributionAerospace instrumentation and simulation
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Programmable DC Electronic Load - (Economical)
63200E Series
The 63200E series are high power DC loads that include a choice of three operating voltages, 150V, 600V and 1,200V, with power levels from 2kW to 24kW and up to 2,000A in a single unit. Power levels can increase up to 240kW when multiple units are paralleled.These high power loads are designed for testing a wide range of EV products including DC charging stations, car battery discharge, on board charger power components, and other power electronics components. With its high power capabilities, parallel control and dynamic synchronization functions make this load ideal for automotive batteries, fuel cells and more. The 63200E load's master/slave control application enables units with the samevoltage specification to be used in parallel and synchronized dynamically to meet the power testing requirements. In addition, a 255-set data storage function has been built-in for recall of the stored settings at any time. When used in automated testing, the save and recall functions can save a great deal of time.
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Electronic Controllers
CAES designs and manufactures stepper and brushless DC controllers for aerospace applications. A variety of interfaces (1553, RS422), input voltages, and drive schemes are available. Custom requirements are welcomed.
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Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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High Power DC Electronic Load
63200A series
The 63200A series high power DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more. The 63200A series have three operating voltage choices, 150V, 600V & 1,200V, with models covering power levels from 4kW to 24kW and up to 2,000A in a single unit. The DC loads have unique user defined waveform (UDW) capability and external analog modulating input for s imul a t ing re a l-wor ld, cus tom waveforms. Another distinct feature is the dynamic auto-frequency sweep function, which enables detecting a UUTs worst case output deviation across a wide range of current frequencies. In addition, a 255-set of data storage function has been built in for recall of the stored settings at any time. For automated testing, the save and recall functions can save a great deal of time.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Electronic Engineering
By combining our core skills in electronic and electrical engineering we can design and support all aspects of test and measurement equipment.
