Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Product
Surface Photovoltage
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The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
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Product
Non-Contact Mapping Life Time System
MWR-2S-3
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The device is designed for express non-destructive contactless local measurement of non-equilibrium charge carrier effective lifetime in silicon substrates, epi-wafers and solar cells at different stages of manufacturing cycle. It can be used for incoming and outcoming inspection of silicon ingots and wafers, tuning and periodic inspection of semiconductor and solar cell technology quality. Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as a probe.
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Product
PXIe-4162, 12-Channel, ±24 V, Precision PXI Source Measure Unit
785680-01
Analog Input Module
PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Product
Dynamic Ultra Micro Hardness Tester
DUH-210/DUH-210S
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A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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Product
Moisture Analyzer
5800
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The 5800 is ideal for high-purity gas production, semiconductor gases, and the production, storage and transmission of olefins. It is suitable for use in industries including hydrocarbon processing, industrial gas and semiconductors.
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Product
Micro Volume pH Monitor
UP-100
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Redevelops HORIBA's founding pH measurement technology using new ultra-small capillary electrode. HORIBA's UP-100 affords ultra-low sample consumption of just 500 uL/measurement, enabling continuous pH monitoring for a variety of critical manufacturing processes that include Semiconductor (Cleaning, Etching and Plating); Chemical Manufacturing, Bio, Pharm, Food Processing, etc.Designed for 6 month continuous operation without operator intervention for minimizing downtime.
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Product
Patented DPEM Process for Die Removal
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DPEM (Decapsulate Plastic Encapsulated Module) is DPACI’s patented Turn-Key Solution to replacement of obsolete high reliability devices in legacy systems. From dissolving the plastic encapsulation of a semiconductor device to re-bonding new wires onto a chip or package lead frame, complete solutions are offered. DPACI retains reliability test data as well as customer testimonials for the process and can share this information on a need-to-know basis.
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Product
Semiconductor Testing
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Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Product
3.4 MP GMSL Camera (supports Upto 15 Meters)
NileCAM30_TX2
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NileCAM30_TX2 is the four board solution containing the camera module, serializer, deserializer and TX2 base board. This camera is based on AR0330 CMOS image sensor from ON Semiconductor®. The NileCAM30_TX2 comes with 3 meters or 15 meters coaxial cable with FAKRA connector at both ends of serializer/deserializer board. The NileCAM30_TX2 has an S-mount (M12) lens holder which allows customers to choose and use the lens according to their application requirement.
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Product
Light and Energy Meter
Model 656
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OAI Model 656 Meter is designed for use with all mask aligners and flood exposure systems. For over 45 years, OAI is a world leader in UV Light & Energy Measurement Instrumentation used for reliable accurate calibrated control of the photolithography processes in the Semiconductor, MEMS, Wafer Packaging and Wafer Bumping Industries.
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Product
PXI 8x SPST High Voltage Reed Relays
40-310-001
Reed Relay
The 40-310/320 range of high voltage switching modules will hot switch up to 750V peak and cold switch up to 1000V peak in either general purpose relay (40-310) or multiplexer (40-320) configurations. These modules contain high-quality reed relays with switching ratings comfortably higher than the 40-310/320 specification. Applications include; circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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Product
ANSI X3.28 to Modbus RTU Converter
Model 2399
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* Converts ANSI X3.28 commandslinto Modbus RTU packets.* New 32 Address Mode supports multi-channel Modbus Controllers like the Watlow MLS300.* Control Modbus RTU devices from any ASCII serial source.* Serial ports support RS-232 and 2-wire/4-wire RS-485 signals.* Includes serial baud rate conversion.* Internal logic is IEEE-488.2 compatible and uses SCPI commands for configurtion setup.* 2399 mounts on a DIN rail or on any flat panel.* Inexpensive way to maintain manufacturing equipment such as semiconductor fusion chambers, etc as the ANSI Controllers become obsolete.* Application Note AB23-3 describes how to use the 2399 to replace obsolete Watlow Controllers in the Axcelis/Fusion Gemini Asher.* 2399 Serial Keyboard Program lets you control and setup the 2399 and test the ANSI modes.* 239x Table Loader Program uploads ANSI Command Table entries from an Excel csv file.
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Product
ST/MT Family
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MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR, SiC, GaN, etc) packaged and unpackaged (discrete, module and substrate). ST System is a test equipment suitable to verify stability or drift of all static parameters of discrete power semiconductors.
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Product
Custom Solutions - OEM Raman
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For years, HORIBA Scientific’s OEM team has been the preferred, reliable and consistent supplier of OEM spectroscopy components. Our know-how in Raman (We are Number #1!) has made it into our miniature spectrometers and systems for portable Raman applications (Process control, Security, Pharmaceutical, Medical, Semiconductor…).
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Product
Semiconductor Thermal Analyzers
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Analysis Tech Semiconductor Thermal Analyzers measure semiconductor junction temperatures using the electric method of junction temperature measurement on all types of semiconductor devices.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
Industrial Resistivity Meter
HE-480R(W)
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The HE-480R industrial resistivity meter features the high-precision temperature compensation function.Its high-performance temperature compensation makes it ideal for sequential monitoring of ultra-pure water used in manufacturing processes in the semiconductor field, and many other fields, including the areas of electrical goods, foods and medicines. The measurement range is from 0 to 100.0 MΩ・cm.
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Product
High Precision, High Stability Chemical Concentration Monitor
CS-700
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The HORIBA CS-700 chemical concentration monitor enables high performance measurement of the individual chemical constituents of complex chemistries used in the leading edge Semiconductor Manufacturing Processes.By improving HORIBA's renowned spectroscopic measurement technology, the CS-700 realizes up to 5X improvement in measurement performance.
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Product
3.4 MP Google Coral Camera
E-CAM30_CUCRL
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e-CAM30_CUCRL is a 3.4 MP 4 lane MIPI CSI-2 custom lens camera board for Google Coral development board. This Google coral camera is based on 1/3" inch AR0330 CMOS Image sensor from ON Semiconductor® with 2.2 µm pixel.
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Product
PXIe-6570, 100 MVector/s, PXI Digital Pattern Instrument
785283-01
Digital Pattern
100 MVector/s, PXI Digital Pattern Instrument—The PXIe‑6570 is designed for semiconductor characterization and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. The PXIe‑6570 also includes debugging tools like Shmoo, digital scope, and viewers for history RAM, pin states, and system status.
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Product
Semiconductor Curve Tracer
CS-10000 Series
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This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
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Product
Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
CD-SEM
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Our CD-SEM tools measure the width, height, sidewall angle, etc. of wiring patterns on semiconductor photomasks and wafers.
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Product
Rad Hard GaN FETs
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Wide band gap semiconductor technologies such as Gallim Nitride Field Effect Transistors (GaN FETs) have been gaining interest for power management and conversion in space applications. These devices feature higher breakdown voltage, lower RDS(ON) and very low gate charge enabling power management systems to operate at higher switching frequencies while still achieving higher efficiency and a smaller solution footprint. There is an additional benefit from GaN devices that make them attractive to the space market. These devices are inherently immune to total ionizing dose radiation.
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Product
DUT Boards
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RTI designs and manufactures DUT boards for many types of special purpose test equipment including: ESD test systems, special purpose functional testers, automated curve trace equipment, as well as standard semiconductor test equipment. All designs are performed in-house using PCB design software (Mentor PADS, CAM350) and 3D mechanical design software (Solid Edge) if required. PCB fabrication is sub-contracted to one of our long-time fabrication partners.
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Product
CiCi-Raman-NIR Spectrometer
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HORIBA Scientific is the world leader in Raman spectroscopy, with a long history in the technique. HORIBA OEM has pioneered Raman systems for spectroscopy, designing and manufacturing them for over four decades. We provide miniature spectrometers and systems for industrial applications such as process control, security, pharmaceutical, medical and semiconductor. The CiCi-Raman-785 is our high performance spectrometer featuring an aberration-corrected concave holographic grating configured with Horiba Scientific's Syncerity™ TE-cooled CCD camera with a VIS-NIR 2048 x 70 detector, in a TE-cooled Head at -50° C.
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Product
Materials Test Systems
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An impedance analyzer is a device that uses a programmable AC voltage / current source, together with voltage and current measurement circuits, to characterize sample impedance over a wide range of frequency. An example of this being the world famous Solartron Analytical 1260A Impedance Analyzer that provides EIS impedance characterization over more than 12 decades of frequency from uHz to tens of MHz. Impedance Analysis characterization is a key technology that enables new materials development for semiconductors, smart-materials, ferroelectrics, piezo-electrics, solid oxide, solid electrolytes, ceramics, polymers, OLED and many more materials.
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Product
Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN
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Optik Elektronik Gerätetechnik GmbH
Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
