Semi-conductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
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Product
HF / HCl Concentration Monitor
HF-960H
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The HF-960H accurately measures concentrations of hydrofluoric and hydrochloric acid used in semiconductor manufacturing and other processes. The dedicated FES-510 series sensor is made from materials that are highly resistant to chemicals, making this unit ideal for the management of hydrofluoric and hydrochloric acid, even in high concentrations.
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Product
Semiconductor & Electronic Systems Test and Diagnostics Services
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Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Product
Semiconductor Probe
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Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Product
Semiconductor Test
Ismeca NY32
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32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
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Product
Amplifiers
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We have designed and manufactured amplifiers using all major semiconductor materials, LDMOS, GaN, GaAs, and InP, to produce narrow, wideband, and pulse, receive and transmit amplifiers from 1 MHz to 220 GHz and power levels from mW to over 10 kW.
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Product
Low-leakage Switch Matrix Family
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Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Product
All-in-one PMAC Brick
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Brick PMAC's combine a PMAC controller with either 4 or 8 servo drives in one package used in industrial automation and semiconductor manufacturing.
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Product
High-Resolution Precision SMU (10 FA, 210 V)
PZ2110A
Source Measure Unit
The Keysight PZ2110A is a precision source / measure unit (SMU) that expands precise measurements from conventional static measurements and pulsed measurements, to fast dynamic measurements. It is ideal for a wide variety of current versus voltage (IV) measurement tasks that require both high resolution and accuracy. The PZ2110A can accurately perform characterization, parametric tests, and reliability tests of semiconductors, active / passive components, and general electronic devices.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
STPOWER RF LDMOS Transistors
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ST offers a broad portfolio of RF LDMOS (lateral double-diffused metal oxide semiconductor) transistors operating from a supply voltage of 7 to 50 V. They target applications in the 1 MHz to 4 GHz frequency range and feature high peak power up (>1 kW) and high ruggedness capability.
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Product
Semiconductor CharacterizationSystem
Keithley 4200
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Materials Development Corporation
The MDC CSM/Win-4200 System integrates the extraordinary power of the CSM/Win softwarewith the power of the new Keithley 4200-SCS. Measure capacitance, voltage, and current down to sub-femtoamp levels.
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Product
Semiconductor Testing
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The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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Product
1.3 MP Custom Lens NIR Camera Module (Monochrome)
e-CAM10_CU0130_MOD
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The e-CAM10_CU0130_MOD is a 1.3 MP NIR Camera module (Monochrome) based on the Aptina / ON Semiconductor AR0130CS CMOS image sensor with S-mount lens holder attached to it. The AR0130 is a 1/3” Optical Form factor, Electronic Rolling Shutter CMOS sensor with enhanced sensitivity in the Near Infrared region and superior low light performance. The e-CAM10_CU0130_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM10_CU0130_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Product
E-Chuck Supplies
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Advanced Energy's Trek e-chuck supplies have been a staple in the semiconductor industry for decades. They allow you to improve throughput, virtually eliminate sticky wafer and wafer popping issues, and reduce backside gas errors.
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Product
Trace Moisture Analyzers
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Used primarily with air separators, medical gas, semiconductors and in pharmaceutical settings, Edgetech Instruments provides both stationary and portable units used to accurately measure moisture levels in dew point and PPMv units.
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Product
13MP Jetson TX2/TX1 Camera Board
E-CAM130_CUTX1
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e-CAM130_CUTX1 - 13MP Jetson TX2/TX1 camera board is a 4-lane MIPI CSI-2 camera solution for NVIDIA® Jetson TX2/TX1 developer kit. The e-CAM130_CUTX1 Board uses 13MP custom Lens camera module based on AR1820 CMOS Image sensor from ON Semiconductor. This camera daughter board can be directly interfaced to the NVIDIA® Jetson TX2/TX1 developer kit. The e-CAM130_CUTX1 is a 13MP color camera with the S-mount (also known as M12 board lens) lens holder.
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Product
5.0 MP NVIDIA® Jetson Nano™ Camera
E-CAM50_CUNANO
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e-CAM50_CUNANO is a 5.0 MP 2-lane MIPI CSI-2 fixed focus color camera for NVIDIA® Jetson Nano™ developer Kit. This camera is based on 1/2.5" AR0521 CMOS Image sensor from ON Semiconductor® with built-in Image Signal Processor (ISP). This powerful ISP helps to brings out the best image quality from the sensor and making it ideal for next generation of AI devices.
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Product
Non-Linear Junction Detector
ORION™ HGO-4000
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The ORION HGO-4000 is REI’s original high gain Non-Linear Junction Detector for special applications. The ORION HGO-4000 can locate listening devices and semiconductors in walls floors, ceilings, fixtures, furniture or containers and provides a user the capability to detect hidden electronic devices, regardless of whether the device is radiating, hard wired, or even turned off.
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Product
Inspection & Metrology Platform
Neon
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Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.
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Product
Semiconductor Package Inspection System
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NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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Product
Thermal Conductivity Analyzer
Model 2000B
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Teledyne Analytical Instruments
The Series 2000 represents a complete line of Thermal Conductivity Detector (TCD) based analyzers which can be applied in a wide range of applications and industries. By using field proven filament-based and semiconductor based TC detectors, Teledyne is able to continuously monitor hydrogen and a variety of other gases of interest in either binary or multi-component sample gas streams.
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Product
Test Probes
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Petracarbon is a leading supplier and provider of spring contact probes and semiconductor test sockets.
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Product
Semiconductors
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Multiphysics Analysis Solutions for Chips and 3D IC Systems. Ansys cloud-native solutions provide unparalleled capacity to speed up completion times for even the largest finFET integrated circuits (IC) and 3D/2.5D multi-die systems. These powerful multiphysics analysis and verification tools reduce power consumption, improve performance and reliability, and lower project risk with foundry-certified golden signoff verification.
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Product
Differential Picosecond Pulse Generators
PicoSource PG900 Series
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The fast-transition pulse can stimulate a transmission path, device or network with a broad spectrum signal in a single instant. Such a pulse is very useful for many of the high-speed broadband measurements that we need to make; for instance in time-domain reflectometry, semiconductor test, gigabit interconnect and port test and in radar.
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Product
USHIO Infrared Laser Diodes (705nm - 852nm)
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The Optoelectronics Company Ltd
USHIO OPTO's new 705nm, 40mW laser diodes, HL7001MG and HL7002MG are the first ever 705nm semiconductor lasers and are suitable for biomedical light sources. For more information, see HL7001MG/7002MG overview.
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Product
PED Systems
Pulsed Electron Deposition
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Is a process in which a pulsed (80-100 ns) high power electron beam (~1000 A, 15 kV) penetrates approximately 1 μm into the target resulting in a rapid evaporation of target material. The non-equilibrium heating of the target facilitates stoichiometric ablation of the target material. Under optimum conditions, the target stoichiometry is preserved in the deposited films. All solid state materials – metals, semiconductors and insulators, including those transparent to laser wavelengths in PLD – can be deposited as thin films with PED. By combining PLD and PED, the range of complex materials that can be prepared as thin films can be greatly enhanced.
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Product
High Precision TMAH Concentration Monitor
HE-960H-TM-S
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Accurately measures the concentration of TMAH (Tetra Methyl Ammonium Hydroxide), which is the main component of the photoresist developer solutions in semiconductor manufacturing. Repeatability: within +/- 0.003%. Measurement range : 0 - 3 %. Have the chemical resistant carbon sensor.
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Product
Generators and Sources
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For general purpose standalone applications or as core components in a high speed test and measurement system, Yokogawa sources and signal generators are highly accurate and functional. The integration of source and measurement into a single unit greatly simplifies the test process. Semiconductor devices, sensors, displays or batteries etc can therefore be quickly and easily characterized.
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Product
LV Iron Core Line & Load Reactors
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Line and load reactors are generally serial-connected to the input and/or output terminals of three phase equipment such as motor speed controllers, inverters and UPS systems. These equipment make use of semiconductor switches such as IGBTs, thyristors, and diodes and therefore create harmonic distortion and high switching over-voltages (dv/dt). Use of such equipment has been becoming more widespread as the technology advances. However, the negative effects of these equipment should not be overlooked.
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Product
OEM DC Power System For Semiconductor
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AMETEK Programmable Power, Inc.
*Single Package 6-Pack of 600W power supplies*Complete self-contained controller operates independently once pre-set*Capable of ramps and sequences*Capable of inter-channel dependent operation*DeviceNet Interface*Solid State polarity switching





























