Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Lamp Cap Temperature Rise Test System
TMP-L
TMP-L is according to IEC60360-1998 and GB2512-2001 (Standard method of measurement of lamp cap temperature rise). It is used to test the working and environmental temperature as well as temperature-rise of the burner and lamp. It meets the requirement of IEC and GB Standards.
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PXI Express Gen3 Controller
PXIe-3988
The ADLINK PXIe-3988 PXI Express embedded controller, based on the 9th gen Intel® Xeon® E processor, is specifically designed for hybrid PXI Express-based testing systems, delivering maximum computing power for a wide variety of testing and measurement applications. By utilizing the Intel® Xeon® E-2276ME processor (6 cores, 12 threads) with up to 64 GB of 2666 MHz DDR4 memory, the PXIe-3988 easily performs execution of numerous independent tasks simultaneously in a multi-tasking environment.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Pneumatic Horizontal Shock Test System
KRD12 series
The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Type 39 E-Frame Development Platform, 2 Slot 6U VPX
39E02PSX94Y2VCEX
The Type 39 E-Frame test platform supports 6U or 3U VPX based system development. With a rugged aluminum construction, the versatile concept chassis design allows easy access for test and system architecture development for up to 12 slots.
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FET Solid State Switch, 300 kHz to 8 GHz, SPDT
U9397A
The Keysight U9397A solid state switch maximizes your frequency range from 300 kHz up to 8 GHz, offering excellent performance with high isolation, low SWR and fast switching speed. Applications include instrumentation, communications, radar, and many other test systems that require high speed RF and microwave SPDT switching.
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PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 3.55kΩ
40-298-023
The 40-298-023 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Software Drivers and Application Software Packages
In test system development, the best hardware is only usable if its software control environment is robust and easy-to-use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Load Banks
Power Test Dynamometer offers a complete high capacity load testing solution with our load bank and gen set testing systems. Capable of testing generators and AC/DC power sources, our load bank systems safely apply electrical loads across the entire spectrum of operation. By offering a one-stop-shop for your Load Bank and it's accompanying data acquisition software, Power Test is committed to Making Your Testing Easy.
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Digital Closed Loop Control Thermal and Mechanical Testing System
3800 System
The Gleeble 3800 is a fully integrated digital closed loop control thermal and mechanical testing system. Easy-to-use Windows based computer software, combined with an array of powerful processors, provides an extremely user-friendly interface to create, run and analyze data from thermal-mechanical tests and physical simulation programs.The result is a system unequaled for physical simulation and thermal-mechanical materials testing.
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Transmission Performance/Endurance Test System
This system is suitable for vehicle drive test with only the transmission unit in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling engines, tires or vehicles other than transmission. The engines, tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
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RF ATE
IFF-7300S Series IFF/Crypto/TACAN Automated Test System. IRIS 2000/IRS 1200 ATE Software Revision Service. RF Expansion Module (RFEM).
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Fully Automated In-line Test System For LED Light Engines
We are pleased to announce that we have received an order for the supply of a fully automated in-line test system for testing LED light engines from ASD Lighting, based in Rotherham. The solution provided, consists of an in-line handler fitted with a vision system. The camera software is capable of learning the position of all LED’s on a new pcb, thereby reducing the time to introduce a new product. In addition to identifying the location of any missing or faulty LED’s the tester measures the colour temperature of every pcb. An image is taken of faulty units with the location of any missing LED’s identified
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PXI Precision Resistor Module 6-Channel, 2.5 to 102k
40-297-040
This 6-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781420-11
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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LED Optical Aging Test Instrument
LEDLM-80PL
LEDLM-80PL LED Lumen Maintenance and Aging Life Test System is designed according to standards of IES-LM-80, IES-LM-82, TM-21 and GB2312-80, and the software is developed base on Arrhenius model. LED has the features of long life, but with the different working condition and drive current, its life will be different, but generally the life will be around 50K hours. Differ from the traditional lightsource, LED light will decay gradually rather than extinguish instantly, so in the standard of LM-80, it introduces L70, L50 and etc.
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PCI 4-Channel Precision Resistor Card
50-297-102
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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LED Tester For Chip And Wafer
Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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MEMS Test System Development
olidus Technologies’ can design and build a test system customized for your exact needs, using our own or off the shelf components:Custom MEMS Test Systems. We can integrate and assemble test equipment and handling systems to fit your requirements. Custom MEMS Test Software. We can write custom software for device-specific calibration and testing, interfacing various instruments and handling systems, or create a customized GUI. We can also adapt our standard STI Test Software to work on your hardware system.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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PXI 34x4 Signal Insertion and Monitor Matrix
40-525A-001
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also availablein a 16x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system. Each pass thru connection from LX to X can be open or closed to allow the programmatic disconnection of the signal to check the response of the UUT. The matrix can be used to connect test equipment, such as a DMM or scope, to monitor the pass thru signals via Y connections while the LY connections can be used to insert a fault condition or insert external signals. When external signals are injected the LX connections can be opened and the LY connections closed.
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Automatic Transformer Comprehensive Test System
TH2837LX
Changzhou Tonghui Electronic Co., Ltd.
Automatic Transformer Comprehensive Test System
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Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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EMI Test System
TS9975
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Midirack - Installed Peripherals
OTP2-Modul-Nr044
The extension of the module can create new possibilities for your test system.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
