Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Scanning Electro-chemical Microscope
920D
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The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Digital Microscope
VHX-6000 Series
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Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
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Particle Analysis for Liquids
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With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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High Content Screening Instruments
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Get the sensitivity and throughput you need to image more samples and analyze more parameters with high content screening. Our high content screening instruments help you answer the most complex biological questions. With powerful yet simple imaging and analysis capabilities for a wide range of applications -- from basic research to assay development and screening -- these powerful high content screening microscope systems produce the highest possible image quality to take your research further, in less time than ever before, especially when combined with PerkinElmer's robotic systems and advanced data analytics.
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Digital Microscopes
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Great for capturing and sharing digital information with anyone, anywhere, digital microscopes by Vision Engineering are built with quality to last a lifetime. Powerful and easy to use, their versatile, operator-friendly design means they can be repurposed as your needs change, protecting your return on investment.
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Inverted Metallurgical Microscope
GX53
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Designed for use in the steel, automotive, electronics, and other manufacturing industries, the GX53 microscope delivers crisp images that can be difficult to capture using conventional microscopy observation methods. When combined with OLYMPUS Stream image analysis software, the microscope streamlines the inspection process from observation to image analysis and reporting.
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Reticles / Graticules
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With over 30 years experience in the manufacturing of high precision Custom and Standard Reticles for a wide range of applications, APPLIED IMAGE has gained a reputation for delivering precision and accuracy parts on time. Using our state of the art technology, our components are the most precise in the industry. Applications of this technology is useful in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Temperature Controlled Microscope Stages
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Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Microscope Platforms
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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AFM-Raman for Physical and Chemical Imaging
LabRAM Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.
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Micro Vickers Hardness Tester
900-392
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The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
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High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
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Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
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Imaging Systems & Components
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Thorlabs offers a wide selection of laser scanning, widefield imaging, and OCT imaging systems, including multiphoton microscopes, confocal microscopes, electrophysiology rigs, swept-source OCT systems, and spectral-radar OCT systems.
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Confocal Raman Microscope
LabRAM HR Evolution
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The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Portable Microscope With XY Stage, X150 2mm Field Of View
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*Veterinary Worm Egg Counting*Counting of algae and other samples*Easy positioning of the sample*Methodically scanning of slides and counting chambers*Works with standard microscope slides and counting chambers (25x75mm or 1”x2”) and with 32mm wide counting chambers*Allows manual movement of the slide and counting chamber independently in the left-right (X) axis and front-back (Y) axis
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Desktop Fluorescence Microscope
Nanoimager
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The complete package for super-resolution microscopy
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Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Ion Pumps & Controllers
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Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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MultiBeam System
FIB
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An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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MM Fiber Test
KI-TK032
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850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable SC & LC connectors
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Level AFM
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Is a flexible Atomic Force Microscope for scientists. It offers a wide range of modes, sophisticated spectroscopy options and the programming of user defined experiments. Besides standard options found in Anfatec's other AFMs, the level AFM allows to add Anfatec's full range of AFM options, such as KPFM, closed loop operation, automated sample motion, acoustic enclosure, humidity and temperature control ... Each instrument is adapted to the user's specific needs.
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Metallurgical Microscope
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Offering you a complete choice of products which include dg classic trinocular metallurgical microscope, dg victory trinocular metallurgical microscope, dmi classic trinocular metallurgical microscope, dmi excel binocular metallurgical microscope, dmi optima trinocular metallurgical microscope and dmi prime trinocular metallurgical microscope.
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Nanolattice Standards for Analytical Instruments
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
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Tribometers/Abrasion Testers
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AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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SINE M-19 Sinusoidal Array
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The Sinusoidal Array SINE M-19 is a remarkable new test array that achieves 256 cycles per mm while maintaining a significant modulation. It is designed for testing high resolution optical systems such as microscopes. Because its maximum width is 7.5mm, the SINE M-19 is small enough to fit easily onto a standard microscope slide (the TM-G variation is mounted in glass).
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Confocal Raman Microscopes
NRS Series
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Include Class 1 laser safety as standard and share the same comprehensive Spectra Manager™ Suite of measurement and micro-imaging software.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
