Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
-
Product
Electrical Probe Systems
-
INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
-
Product
Light Microscopes
-
Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
-
Product
Automated Semiconductor Wafer Optical Inspection and Metrology
SITEview Software
-
Microtronic SITEview Software is designed from the end-user operator’s perspective and is easy to use, fully featured, and modular. Applications include visual wafer inspection, OCR sorting, wafer defect review, second optical inspection, image storage and retrieval, laser marking, microscope interface, and GEM/SECS II communication and seamlessly integrates with EAGLEview, MicroINSPECT and MicroSORT.
-
Product
Microscope Cameras
-
Leica microscope cameras are remarkable for their fast live image speeds, short reaction times, high pixel resolution, and clear contrast. They can be installed on many of the Leica microscopes and macroscopes.
-
Product
Atomic Force Microscope
XE-PTR
-
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
-
Product
Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
-
Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
-
-
Product
Turn-Up & Maintenance Test Kit
KI-TK083
-
1310/1490/1550 nm PON power meter, VFL pen, inspection microscope, cleaning materials & accessories, SC/APC connectors
-
Product
Near-Field Scanning Optical Microscope Platform
MoScan-F
-
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
-
Product
Soldering Inspection Video Microscope
MS-1000
-
The MS-1000 is a highly portable microscope for exclusive use with BGA, CSP, and QFP. It is highly efficient in inspecting portions which cannot be inspected by the X-ray inspection method.Specifically, it is efficient for inspecting the following conditions: fillets of soldered balls, melted condition of soldered parts, cracks, defective soldering, etc.
-
Product
Level AFM
-
Is a flexible Atomic Force Microscope for scientists. It offers a wide range of modes, sophisticated spectroscopy options and the programming of user defined experiments. Besides standard options found in Anfatec's other AFMs, the level AFM allows to add Anfatec's full range of AFM options, such as KPFM, closed loop operation, automated sample motion, acoustic enclosure, humidity and temperature control ... Each instrument is adapted to the user's specific needs.
-
Product
Multiphoton Laser Scanning Microscope
FVMPE-RS
-
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
-
Product
Z-Axis Drive and Controller
MFC-2000
-
Applied Scientific Instrumentation
The MFC-2000 has been specifically designed to provide a high resolution and highly repeatable, means of controlling the focus/Z position of the microscope stage. Precise control of the microscope's focus is obtained through the use of a closed-loop DC servomotor employing high resolution encoders for positioning feedback. By using closed-loop control of the focus position, there is no chance that the focus point can be lost as can occur with open-loop stepper motors.
-
Product
Cross Sections and Metallography
-
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
-
Product
Digital Slide Scanner
ZEISS Axioscan 7
-
Discover high-performance digital slide scanning tailored to your application needs. Whether your focus is spatial biology at scale, life science research, clinical applications or geology, the Axioscan 7 slide scanning microscope brings you advanced automation capabilities and exceptional image quality.
-
Product
Industrial Microscope Solutions
-
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
-
Product
Dental Surgical Microscopy Solutions
-
Dental microsurgery involves the use of magnification and illumination for an enhanced visualization of anatomical details and fine structures. The dental microscope is an essential instrument used in dental procedures and dental surgery, allowing optimal assessment, preservation and maintenance of tooth structure and oral tissue, as well as minimally invasive procedures.
-
Product
Cubes/Holders
-
IDEX Health & Science stocks filter cubes used in fluorescence microscope platforms from the major microscope manufacturers, including Leica Microsystems, Nikon Instruments, Olympus Corp., and Zeiss Microscopy. Our super-resolution filter cubes set the new standard for laser-based microscopes and are optimized for mounting half-wave flatness, 1 mm thick super-resolution dichroic beam-splitters. Whether you order a custom or catalog filter set, complimentary filter mounting into the filter cube of your choice is performed by the certified staff.
-
Product
Semiconductor & Flat Panel Display Inspection Microscopes
MX63 / MX63L
-
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
-
Product
Probe Station
ETCP1000
-
Installation of “Hot and cool chuck” - Sellectable chuck size : 4inch, 6inch. - Temperature variation : -193°C ~ 300°C (80K ~ 573K) - Additional requirements : Vacuum chamber, LN2 tank(Bombei), microscope, CCD camera, manipulators. - EPS500 is standard model in ETCP1000 probe station.
-
Product
Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
-
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
-
Product
High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
-
Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
-
Product
Atomic Force Microscope (AFM)
CombiScope
-
The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
-
Product
Reticles, Optical Slits, Optical Apertures
-
With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
-
Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
-
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
-
Product
Microscopes
-
A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
-
Product
Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems
Customized Solutions
-
Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.
-
Product
NanoLattice Pitch Standard for Mask Handling Tools (NLSM)
-
The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of CD-SEM and Atomic Force Microscopes (AFM). Make the grade, with the only pitch standard of its kind available below the 130 nm node.
-
Product
Powerful, Fully Integrated Workstationfor Emission Microscopy
PEM-1000
-
The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
-
Product
Micro Vickers Hardness Tester
900-392
-
The 900-392 Micro Vickers Hardness Tester is engineered to produce a clearer indentation and hence a more precise measurement. By means of a 10 × lens and a 40 × lens the 900-392 vickers hardness tester has a wide measurement field and a broad usage range. Equipped with a digital microscope, it shows the measuring methods, the test force, the indentation length, the hardness value, the dwell time of the test force as well as the number of the measurements, all shown on its LCD screen.
