Microscopes
Enlarge view of minute objects.
See Also: Scopes, Microscopy, Fiberscopes, Borescopes, Endoscopes, Oscilloscopes, Stethoscopes, Stroboscopes, Synchroscopes, Telescopes, Vectorscopes, Acoustic Microscopes, Infrared Microscopes, Atomic Force Microscopes
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Microscope Software
Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Multi-Laser Light Source
LS-n
The LS-n is a customizable, compact fluorescence excitation source that provides up to four different laser wavelengths in a single combined output beam, with each laser individually controllable using ANF's custom software. An LS-4 unit (containing four lasers) is included with each standard NFM NanoFluorescence Microscope.
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Microscope Software
Discover more with Olympus microscope software. With intuitive operations that offer a seamless workflow, Olympus microscope software supports your ever-evolving research needs.
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MPO Visual Cable Verifier Kit
KI-TK832
Kingfisher's unique and innovate MPO Visual Cable Verifier Kit is a quick, versatile and inexpensive way to visually check MPO cable installations and patch leads for polarity and continuity, and overall end face condition. Just connect the source, and view the far end with the microscope to observe the repeating color pattern at the far end.
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Scanning Electro-chemical Microscope
920D
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Rapid Automated Modular Microscope
RAMM
Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Probe Station
ETCP1000
Installation of “Hot and cool chuck” - Sellectable chuck size : 4inch, 6inch. - Temperature variation : -193°C ~ 300°C (80K ~ 573K) - Additional requirements : Vacuum chamber, LN2 tank(Bombei), microscope, CCD camera, manipulators. - EPS500 is standard model in ETCP1000 probe station.
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Optical Tweezers
PicoTweezers
Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Probe Card Analyzers
PB1500
The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards. A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe.
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Filar Micrometer
*This item is suitable for the microscope using eyepiece lens with a 23.2 mm (diameter) eyepiece sleeve.
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Magnetic Field Cancelling System
MR-3
3-axis magnetic field cancelling system for electron microscopes (SEM and TEM), electron and ion beam experiments, nanotechnology, biomagnetic investigations, etc. High reliability through rugged analog design. No tedious programming, no chrashs. More than 1000 MR-3 systems sold worldwide.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Laser Scanning Microscopes
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Micropositioning Systems
Mad City Labs micropositioning stages are designed to complement our high precision nanopositioning systems. Our micropositioning stages provide extended range of motion and are designed to provide a stable platform for our nanopositioners. Our product line includes high precision manual stages and fully automated, programmable stages for use with optical microscopes or stand-alone instruments.
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LIFA FLIM System
The Lambert Instruments LIFA FLIM system is the fastest and easiest way to perform Fluorescence Lifetime Imaging Microscopy (FLIM).Available in versatile configurations dependent on your specific applications, the LIFA system offers a turn-key solution for fluorescence lifetime imaging microscopy. Compatible with any fluorescence microscope with a camera output – including microscopes by Leica, Nikon, Olympus, TILL and Zeiss. Set up is quick and easy, with all hardware integrated seamlessly with our dedicated LIFA software, so you can focus on your experiment.The advanced software instantly analyses data and presents the calculated fluorescence lifetimes visually. Recorded images are compatible with ImageJ, FIJI, Matlab and MetaMorph, while detailed statisitcal data can be exported to an Excel worksheet.
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Stereo Microscopes
Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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AOI Handlings System
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
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Double Monochromator
Gemini 180
The Gemini 180 is a fully automated, double additive grating scanning monochromator. The incorporation of toroidal optics provides for optimum throughput and spectral resolution. The Gemini 180 functions as a high power, high purity light source for Fluorescence, detector characterization, and microscope illumination when coupled with one of our Xe Light Sources.
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Your Automated Microscope For Live Cell Imaging
ZEISS Celldiscoverer 7
Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
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Vision Metrology System
NGS 3500Z
This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.
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Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Multiphoton FLIM System
DCS-120 MP
*Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software
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Ultrasonic Flaw Detector
ECHO
The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Microscopes
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Optical Fiber Cable Testing Equipment
Optical fiber consists of a core and a cladding layer, selected for total internal reflection due to the difference in the refractive index between the two. In practical fibers, the cladding is usually coated with a layer of acrylate polymer or polyimide. This coating protects the fiber from damage but does not contribute to its optical waveguide properties. Individual coated fibers then have a tough resin buffer layer and/or core tube(s) extruded around them to form the cable core. Several layers of protective sheathing, depending on the application, are added to form the cable. Rigid fiber assemblies sometimes put light-absorbing ("dark") glass between the fibers, to prevent light that leaks out of one fiber from entering another. This reduces cross-talk between the fibers, or reduces flare in fiber bundle imaging applications Optical fibers are very strong, but the strength is drastically reduced by unavoidable microscopic surface flaws inherent in the manufacturing process. The initial fiber strength, as well as its change with time, must be considered relative to the stress imposed on the fiber during handling, cabling, and installation for a given set of environmental conditions. There are three basic scenarios that can lead to strength degradation and failure by inducing flaw growth: dynamic fatigue, static fatigues, and zero-stress aging.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
