-
product
Air Traffic Control Antennas
Kratos Defense & Security Solutions, Inc.
Kratos’ Air Traffic Control (ATC) radar antennas and pedestals are manufactured in accordance with ISO9001 Quality Assurance to stringent specifications and perform to the exacting standards demanded of them. Kratos’ L-band and S- band Primary Surveillance Radar Antenna Systems are widely deployed and have a proven record of performance and reliability. Utilizing advanced antenna and pedestal design, these surveillance radar antenna systems are fabricated with proven performance advantages.
-
product
VPX, OpenVPX Rugged Platforms
The Versatile Performance Switching (VPX) standard, also known as VITA 46, defines Eurocard form factor systems supporting switched fabrics over a new high speed connector. Intended for embedded systems that meet the extremely harsh environments of military applications where size, weight, and power (SWaP) are critical, ADLINK's VPX line of commercial off-the-shelf (COTS) products enable fast deployment with reduced development burden and costs compared to proprietary systems.
-
product
Star Fabric to PXI Module
41-921-001
This module resides in the Slot 1 position of a PXI chassis and interfaces to the backplane of the PXI chassis. When located in a generic peripheral slot, it can be used to drive two extension PXI chassis.
-
product
Magnetism Detector DET
432
The MAC Magnetism Detector is widely used by steel suppliers and fabricators to determine residual magnetism in iron and steel objects.
-
product
1-Ch 3.6 GHz or 2-Ch 1.8 GHz 12-bit A/D with DDC, Kintex UltraScale - XMC
Model 71841
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Ideal radar and software radio interface solution- Supports Xilinx Kintex UltraScale FPGAs- One-channel mode with 3.6 GHz, 12-bit A/D- Two-channel mode with 1.8 GHz, 12-bit A/D- Programmable one- or two-channel DDC (Digital Downconverter)- 5 GB of DDR4 SDRAM- µSync clock/sync for multimodule synchronization- PCI Express (Gen. 1, 2 & 3) interface up to x8- VITA 42.0 XMC compatible with switched fabric interfaces- Optional LVDS and gigabit serial connections to the FPGA for custom I/O- Ruggedized and conduction-cooled versions available- Clock up to four modules with Model 7194 High-Speed Clock Generator - PMC/XMC- Synchronize up to four modules with Model 7192 System Synchronization and Distribution Amplifier - PMC/XMC- Synchronize up to twelve modules with Model 9192 System Synchronization and Distribution Amplifier- 1U Rack-mount
-
product
Course Length Tester
TF124
TESTEX Testing Equipment Systems Ltd.
Course Length Tester, to determine the accurate length of a complete course of knitted fabric. When the yarn is attached to the clamp and wound round the pulleys, the length indicated on the ruler by the weighted clamp is added to that indicated on the appropriate location in use to give the total length of yarn.
-
product
Tx/Rx BenchBlade
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for logic card characterization. The card includes a HM-ZD male right angle connector segment for access to the Zone 2 connectors of a switch fabric or node card. Edge-launch SMA connectors are utilized for ease of test cable attachment. SMT pads are included on the receive pairs.
-
product
Rubbing Fastness Tester
Sataton Instruments Technology CO., Ltd
Rubbing fastness tester/Crockmeter is professional designed for determining the resistance of the color of textiles of all kinds, including textile floor coverings and other pile fabrics, to rubbing off and staining other materials in dry or wet conditions. Rubbing fastness tester can also be used to determine the color fastness to rubbing of ink, printing, dyeing, etc. There are two modes of manual and automatic for different requirements.
-
product
Dicing And Lapping Systems
In semiconductor fabrication, clean die separation and smooth surfaces can make all the difference. While these steps might come late in the process, they play a major role in how well a device ultimately performs. Dicing and lapping bring the necessary level of precision to cut wafers into individual dies and polish surfaces so everything fits, functions and holds up the way it should in real world scenarios.
-
product
MRM(Mask)
MRM Series
- Fully automated system that can produce masks by automating the mask production process such as fabric supply, molding, cutting, and bonding.
-
product
Bench & Characterization Boards
Engineer, Design, Fabricate & Assemble Custom Boards for:*Device Characterization and Verification*Bench Testing*Failure Analysis*General Laboratory Use
-
product
Auto Bursting Strength Tester
TF142A/B
TESTEX Testing Equipment Systems Ltd.
Auto Bursting Tester, to determine the bursting strength of fabric, woven or knitted fabrics, non-woven, paper and board by the Application of hydraulic load under a rubber diaphragm of a specific area.
-
product
Side Crocking Tester
TF410B
TESTEX Testing Equipment Systems Ltd.
Side Crocking Tester can be applied to the surface of a belt that are made from plastics, leather, and textiles made from all fibers in the form of yarn or fabric whether dyed, printed or otherwise colored. With a timing device which is a minimum resolution of 0.1 second.
-
product
Solid Plastic Portable Gage
100
Dwyer solid plastic portable manometers are precision instruments in inclined and vertical (well-type) styles for the measurement of static pressure, vacuum or differential pressure. To assure the accuracy required in instruments of this type, all machining of bores and wells is to the highest standards of precision backed by Dwyer's years of experience in the fabrication of acrylic instruments.
-
product
Monolithic Laser Combiners & Precision Optics
For more than 40 years, our vertically integrated in-house production teams have relied on collaborative interdisciplinary processes to drive product performance and manufacturability. And we back up everything we do with industry-leading metrology to ensure that the building blocks of our technology – fabrication, coating, and assembly – permanently align to your exacting specifications to deliver consistent, shipment-to-shipment product performance, even in the most demanding environments.
-
product
Leather Thickness Gauge
Crockmeter UI-TX50
Crockmeter (Crock Meter) is used to test color transfer of colored textile (leather, fabric and etc,) to other surface due to rubbing. It is test of colour fastness to rubbing, one of physical testing of textiles.
-
product
Paper Softness Tester ZRD-T1
The ZRD-T1 Paper Softness Tester is a device designed to objectively measure the softness of paper products, such as tissues, toilet paper, or specialty papers. Softness is a complex tactile property influenced by factors like surface smoothness, flexibility, and bulk compressibility. It is widely used in industries such as tissue manufacturing, hygiene product development, textiles, and packaging to ensure compliance with quality standards and end-user comfort requirements. This test instrument conforms to many national and international standards: ASTM D2923: Standard Test Method for Rigidity of Paper – Measures bending resistance to determine stiffness. ASTM D6828: Standard Test Method for Stiffness of Nonwoven Fabrics – Evaluates drape and flexibility in materials like medical textiles or wipes. TAPPI T498: Bending Resistance of Paper (Gurley Method) – Quantifies resistance to bending forces, inversely related to softness. GB/T 8942: Chinese Standard for Softness Testing of Household Paper – Aligns with consumer expectations for tissue and toilet paper tactile quality. ISO 12625-9: Softness Evaluation of Tissue Products (optional add-on).
-
product
Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
-
product
5 port, PCI Express
PEX 9716
Broadcom has extended the reach of PCIe for use as a fabric for data center and cloud computing through its ExpressFabric initiative and platform of hardware and software. ExpressFabric can eliminate expensive bridging devices within the rack, such as adapter cards that translate native PCIe to Ethernet and back to PCIe. Yet ExpressFabric works seamlessly with other standards used within the rack and in rack-to-rack connectivity.
-
product
VPX / Open VPX Backplanes
VPX is a broadly defined technology utilizing the latest in a variety of switch fabric technologies in 3U and 6U format blades. Open VPX is the architecture framework that defines system level VPX interoperability for multi-vendor, multi-module, integrated system environments.
-
product
High-Precision Material Testing Machine Vexus
MT5 Series
Sinowon Innovation Metrology Manufacture Ltd.
Vexus MT5 series of material testing machine is designed in single column with maximum testing force 5KN, it is able to make the material testing about tensile, compression, bending, shearing, bonding strength, peeling, tearing, etc, it is applied to test the material such as rubber, plastic, leather, metal, nylon line, fabric, paper, aviation, packaging, construction, petrifaction, electrician, vehicle and other materials. It is a stable and affordable material testing instruments for the incoming quality control, physical test, mechanics research, material research, etc.
-
product
CXAR Custom Chassis
Cytec has a complete metal fabrication shop and a laser etching machine so we can build custom systems with very low NRE. Module arrangement, custom labeling, custom configurations are done fairly easily and nearly 50% of the systems we build are not shown in our standard product line. Don't see what you need? Just ask!
-
product
ICI Mace Snag Tester
UI-TX07
ICI Mace Snag Tester – ICI Mace Tester is used to test fabric snagging resistance ability. It is suitable for woven and hnitted fabric made from textured or untextured filament yarns and etc. ICI Mace Snag Test Method includes ASTM D3939, JIS L1058, GB/T 11047 and etc.
-
product
Interference Lithography Gratings
Interference lithography is an optical nanolithography technology for the fabrication of extensive periodic nanostructures. Critical dimensions of less than 50 nm can be realized. At AMO two interference lithography tools are installed. One setup for extensive, high quality gratings with fixed periods, the other more flexible tool allows quick prototyping. We offer grating fabrication on silicon, silicon dioxide and other substrates with tailored pitch, etch depth and size.
-
product
4-Channel 200 MHz, 16-bit A/D with Virtex-6 FPGA - 3U VPX
Model 52660
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Supports gigabit serial fabrics including PCI Express, Serial RapidIO and Xilinx Aurora- Four 200 MHz 16-bit A/Ds- Up to 2 GB of DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- 3U VPX form factors provides a compact, rugged platform- Compatible with several VITA standards including: VITA-46, VITA-48 AND VITA-65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled versions available
-
product
97 lane, 25 port, PCI Express
PEX 9797
Broadcom has extended the reach of PCIe for use as a fabric for data center and cloud computing through its ExpressFabric initiative and platform of hardware and software. ExpressFabric can eliminate expensive bridging devices within the rack, such as adapter cards that translate native PCIe to Ethernet and back to PCIe.
-
product
Sub-systems
Our self-contained, in-house components design and fabrication capacities ensure the breadth of sub-assemblies offered from rapid prototyping and proof of concept to full production. Ducommun has produced many high performance millimeterwave band sub-assemblies for commercial and military system applications. Among them, the K and Ka band directional Doppler Radar front ends are in production. Several hundreds of sets have been delivered. In addition, Ducommun has delivered Ka through W band engineering prototypes for plasma detection system, automotive Radar, speed Radar, automatic test set, radio telescope, missile terminal guidance, telecommunication system etc. applications.
-
product
Services
We provide the following systemintegration services: Project design and management, Submittal preparation, AutoCad drawings, Panel design, Panel fabrication, HMI Design, System start-up or commissioning, Maintenance, Troubleshooting
-
product
Probe Cards
PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
-
product
Precision SOT-23 FGA™ Voltage References
X60003
The X60003 FGA™ voltage references is a very high precision analog voltage reference fabricated in Renesas' proprietary Floating Gate Analog technology, which achieves superior levels of performance when compared to conventional band gap, buried zener or XFET™ technologies.
