Product

Test & Burn-In Socket for Devices up to 13mm Square

CSP/MicroBGA

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Aries

CSP/MicroBGA - Aries

Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.

Product

Temperature Probe for Outdoor

TP32MT…

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Senseca

TP32MT… - Senseca

Series of Pt100 1/3 DIN 4-wire or T-type thermocouple temperature probes for outdoor/environmental measurements.

Product

Reference Magnets

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Magnetic Instrumentation Inc.

Magnetic Instrumentation Inc.

Reference Magnets provide a stable and convenient method to verify the accuracy and calibration of Hall Effect Gaussmeters, Teslameters, and Probes.

Product

Scanning Probe Microscopy

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SPECS Surface Nano Analysis GmbH

SPECS Surface Nano Analysis GmbH

As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.

Product

Normal Magnets

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MAGNET-PHYSIK Dr. Steingroever GmbH

MAGNET-PHYSIK Dr. Steingroever GmbH

Standards are used to calibrate measuring instruments. There is a corresponding standard for every measuring device and every probe. Take a look around and discover not only moment etalons and comparison magnets but also other high-quality products from the "Standards" category, which we offer you in the best quality and at absolutely fair prices.

Product

Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)

CMCSK-03-01

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Columbia Elektronik AB

CMCSK-03-01 - Columbia Elektronik AB

Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.

Product

Irradiance Probe

LPRAD01

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Senseca

LPRAD01 - Senseca

The LPRAD01 probe measures irradiance (W/m2) defined as the ratio between the radiantflux (W) passing through a surface and the surface area (m2) in the VIS-NIR (400 nm…1050 nm) spectral range.

Product

Semi-automatic Semiconductor Probe Assembly Equipment

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Insight Scientific

Insight Scientific

The components of the incoming parts are pre-assembled and preloaded to two packages. We use a high-speed four-axis robot equipped with high-precision multi-sensor grips to grab these pre-assembled subcomponents. Under CCD visual guidance, a set of rotary grab devices is equipped to capture top plunger. The device uses a multi-set CCD visual module to ensure accuracy, and the positioning accuracy of each motion link is controlled within 15um.

Product

Bandpass Filter/N

WFIL-B1893-1915F

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Warison Technology inc

WFIL-B1893-1915F - Warison Technology inc

Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.

Product

Wafer & Die Inspection

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SemiProbe

SemiProbe

SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.

Product

Probe Spring Tip (0.8mm diameter tip)

PP005-ST8

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Teledyne LeCroy

PP005-ST8 - Teledyne LeCroy

Probe Spring Tip (0.8mm diameter tip).

Product

Enhanced Time Domain Analysis With TDR

S96011B

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Keysight Technologies

S96011B - Keysight Technologies

Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).

Product

Handheld Surface & Volume Low Resistivity Meter for Conductive Materials

Loresta AX

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OAI

Loresta AX - OAI

The Loresta AX Resistivity Meter a handheld unit measures the low resistivity of samples with consistent accuracy. This resistivity meter measures resistivity using a wide variety of probes. The Loresta AX uses a standard RCF that enables the user to input other RCF''s if known.

Product

Twin Probe Tester

#TES-111

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NSI Industries

#TES-111 - NSI Industries

Twin Prb Tster

Product

Single Lead Adapter

PK106-2

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Teledyne LeCroy

PK106-2 - Teledyne LeCroy

Single Lead Adapter - Probe Kit Accessory.

Product

Omnidirectional Hotwire Probe

AP3203F

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Senseca

AP3203F - Senseca

Omnidirectional hotwire probe for cold environment. Measuring range: air speed 0.02 ÷ 5 m/s, temperature -30 ÷ +30 °C.

Product

Magnetic Field and Permeability Measurement

MAGNETOSCOP® 1.070

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Foerster Instruments, Incorporated

MAGNETOSCOP® 1.070 - Foerster Instruments, Incorporated

The MAGNETOSCOP 1.070 is a portable magnetometer system with microprocessor and probes for measuring the magnetic flux density as an absolute or differential value (gradient). It has a USB port for simple data transfer and an SD card for saving measurement data and parameters. The measuring system also facilitates the recognition and saving of peak values and the adjustment of thresholds for limit values. The unit can be used for series and individual measurements. The data can be easily analyzed and documented with the PC software included in the scope of delivery. The MAGNETOSCOP 1.070 thus facilitates the portable and fast measurement of the relative permeability within the scope of the quality control of stainless steel and low-permeable (non-magnetic) alloys as well as the localization of ferrite enclosures. Changes in material (sulfidation, degradation of lamination, structural changes) can also be proven thanks to permeability comparative measurements.

Product

Immersion Probe

TP35.5AF.5S

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Senseca

TP35.5AF.5S - Senseca

Immersion probe, Pt100 sensor, shield in Inox and PTFE

Product

HandyScope HS6-DIFF With SureConnect: 500 MS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder

HS6-DIFF-500XMS-W5

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TEAM SOLUTIONS, INC.

HS6-DIFF-500XMS-W5 - TEAM SOLUTIONS, INC.

The only oscilloscope in the world that has:- SafeGround, differential input channels that can be switched to single ended.SureConnect, auto-detects a true connection between the probe tip and the device under test.- CMI interface.- USB 3.0 interface, 5Gb/s data transfer- Lowest noise

Product

Profilometer

MicroCam™

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NOVACAM Technologies, Inc.

MicroCam™ - NOVACAM Technologies, Inc.

MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices

Product

Probes

Hygro-i Series

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Tramex Ltd.

Hygro-i Series - Tramex Ltd.

The Tramex Hygro-i ® relative humidity probe is the most advanced, resilient and reusable RH probe on the market today. Used in conjuntion with Tramex CMEX II and MRH III moisture meters, the Hygro-i ® relative humidity probes allow the user to perform in situ and hood type RH testing to comply with ASTM F2170 and British Standards BS 8201, 8203, 5325 for the Flooring Industry, and is ideal for use by Flood & Water Damage Restoration and Indoor Air Quality professionals.