Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Probing, Monitoring & Setting
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Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Probing Machines
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Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Product
Robotic Probing of Circuit Cards
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System provides reliable automatic access to test points on a printed circuit under test providing rapid and accurate diagnostic measurements. Accomplished by an automated test probe with video image capability, under control of application software running on a VXI Test System utilizing LabVIEW. A VXI Prober Interface Module (VPIM), developed to Plug and Play standards, provides interface between prober and VXI Test System.
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Product
Portable Manual Probing Station
Model W4.0 x L6.5
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This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
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Product
Magnetic Probing Systems
MPS-C-300 and MPS-C-350
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MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Product
Stack Probing Sensor
L722
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The Model L722 Stack Probing Sensor coupled with the L612 Digital Recording Moisture Meter makes it easy to reach deep into stickered units of lumber and take accurate moisture readings without the danger of broken pins. Wagner''s electromagnetic wave technology makes it possible to take multiple readings throughout an entire stack in just minutes.
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Auxiliary Equipment For Probing Machines
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We have a lineup of products that support the probing process.
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Step Probes
Step Probe
*Precisely controlled probe travel*Step tip geometry*Replaceable and non-replaceable versions*Plating options available
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25L18-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High 1.50 (43.00) - 9.60 (272.00) Long Travel Bead Probe
BPLT-1HL-9.6
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 350Full Travel (mm): 8.89Recommended Travel (mil): 317Recommended Travel (mm): 8.05Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,450Overall Length (mm): 36.83Full Travel Remark: Standard Spring: 400 mil / 10,16 mm, High Spring: 350 mil / 8,89 mm
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Product
Brute Hight Current Probes
P4301
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1T1-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.10 (31.00) - 2.50 (71.00) General Purpose Probe
HPA-1A
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25B-6.5
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Elevated 1.68 (4.00) - 7.00 (198.00) Bead Probe
BTP-1F-7
Bead Target Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Active Probe, 1 GHz
N2795A
General Purpose Probe
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1L18-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1L-4
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3B-2
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1A-6
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T1-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25T30-6
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Irradiance Probe
LPRAD01
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The LPRAD01 probe measures irradiance (W/m2) defined as the ratio between the radiantflux (W) passing through a surface and the surface area (m2) in the VIS-NIR (400 nm…1050 nm) spectral range.
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Product
High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1V-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Basic Threaded Probe F73416B180G150
1016810
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The F73416B180G150 is a Basic Threaded Probe designed for precision in various applications, specifically tailored for models F723, F733, F734, F735, and F737. This probe combines robust electrical and mechanical specifications to guarantee reliability across demanding environments. Operating effectively within a temperature range of -45°C to +100°C, it is engineered with a continuous current capacity of 10A and maintains a typical contact resistance of only 25 mOhm, ensuring efficient performance and minimal energy loss during operation.
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72H-2
ICT/FCT Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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700 V, 25 MHz High-Voltage Differential Probe (÷10, ÷100)
AP031
Differential Probe
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Basic Contact Probes (100 Mil) F10010S060P150HPRP
1017617
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The Basic Contact Probes (100 mil) F10010S060P150HPRP, with order code 1017617, is a highly precise component designed for various electrical applications. This probe exhibits a pitch of 2.54 mm (100 mil) and operates optimally within a temperature range of -45°C to +80°C, making it suitable for a robust range of environments. The design features a brass handle, ensuring durability and reliability in connection tasks, while the HPRP additional definition indicates its high-performance rating suitable for professional settings.
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Probe Series
GEMINI Series
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Micro LED (µLED) is a disruptive optical technology breakthrough in the display industry. Micro LED displays offer tremendous potential for consumer/ display/ automotive applications because they are brighter, faster, and longer life compared with other emissive devices.
