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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
IOL & Power Cycling Test Systems
Test System
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
PCI Express 4.0 Test Platform
Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
EBIRST 78-pin D-type To 68-pin Female SCSI Adapter
93-006-222
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
PXIe High-Speed Source/Measure Unit, 13 V, ± 1 A or 6 V, ± 3 A, 18 W
M9111A
Source Measure Unit
The M9111A is a 1-slot, 2-quadrant PXIe module that provides stable, glitch-free sourcing and sinking, and high accuracy measurements. It offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. With industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading, the M9111A SMU speeds test time. The high-speed M9111A can change its output voltage, stabilize that voltage, and accurately measure current from Amps down to micro-Amps all in less than 1 ms so that you can move on to the next test as quickly as possible.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
Test Platform
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
PXI/PXIe Fault Insertion Switch, 74-Chan 2A, N/C Through Relays, Fault Buses on M & U
40-190C-012
Fault Insertion Unit
The 40-190C-012 (PXI) and 42-190C-012 (PXIe) are fault insertion switches with 74 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Product
Interface Panel for SLSC
THROUGHPOINT™
Interface
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.
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Product
OTP-Based Test System
Test System
Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
Prototyping & Test Consulting Services Solutions
test
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
PXI/PXIe Fault Insertion Switch, 74-Chan 2A, N/C Through Relays, Fault Buses on M & U
42-190C-012
Fault Insertion Unit
The 40-190C-012 (PXI) and 42-190C-012 (PXIe) are fault insertion switches with 74 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Product
21-Ch 6A-250VA 2-Bus Fault Insertion
YAV90077
Fault Insertion Unit
21 channels 1 thread 6A 250V 2 Fault Insertion Buses Switching up to 250W CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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Product
SAS Protocol Test System
M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
In-Circuit Test System Repairs
Test System
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
3U OpenVPX Sensor Interface Unit
SIU32S
Sensor Interface Unit
The SIU32S is a highly configurable Modular Open Systems Approach (MOSA) rugged system or subsystem ideally suited to support a multitude of Mil-Aero applications that require high-density I/O, processing, communications and Ethernet switching. The SIU32S leverages NAI’s Configurable Open Systems Architecture™ (COSA®) 3U boards and smart function modules to deliver off-the-shelf solutions that accelerate deployment of SWaP-optimized systems in air, land and sea applications.
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Product
PXIe Precision Source/Measure Unit, 1.25 MSa/s, 10 fA, 210 V, 315 mA
M9601A
Source Measure Unit
M9601A PXIe precision SMU is the industry-first precision PXIe SMU enabling faster precise measurement from DC to 20 μs pulse up to 210 V/315 mA with the best-in-class 10 fA resolution and low noise.
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Product
High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)
PZ2120A
Source Measure Unit
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
PXI/PXIe 1000Base-T1 Fault Insertion Switch, 3-Channel
40-203-001
Fault Insertion Unit
The 40-203-001 (PXI) and 42-203-001 (PXIe) are designed to simulate common faults on high-speed two wire communication interfaces such as 1000Base-T1. They support 3 channels of two wire serial interfaces. Each channel pair can simulate an open fault in either or both wires, and using the fault bus switches can simulate short between both wires or a short to one of two externally applied fault connections – such as battery supply or ground - via two fault buses.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
Test Platform
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
USB Modular Source Measure Unit
U2723A
Source Measure Unit
The 3-channel 20V/120mA module can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
