Standards
A controlled reference or acknowledged technical criterion.
See Also: IEC, IEEE, Mil, Interoperability Test, Compliance
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Calibrated Leak Standards
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LeakMaster is a leader in the industry when it comes to the manufacturing of calibrated leak standards (calibrated leak orifices). Each leak standard is meticulously manufactured to a specific leak or flow rate at a predetermined pressure. The purpose of each leak standard is to teach, or calibrate a leak test program, and allow the leak test instrument to memorize the characteristics of a leaking part. These leaks are also introduced into production parts to simulate a “leaking or failed” part condition. LeakMaster supplies a calibrated leak standard with every leak test instrument, and provides recertification services for all of their leak standards
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Primary Standards
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Primary standards (often also referred to as mechanical dead-weight testers, pressure balances or primary pressure standards) are the most accurate reference instruments for pressure. Their functional principle is based on the physical principle of pressure = force/area. Mass pieces placed on the top of a piston-cylinder system are the source of a precisely defined force. By producing a certain (counter) pressure inside the primary standard an equilibrium is achieved: the mass pieces, including the free-running piston of the piston-cylinder system, are floating, which will lead to a very accurate pressure at the test port which measured through piston gauge technology.
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Spectral Radiance / Luminance Calibration Standards
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Standard lamps calibrated in luminance and spectral radiance. Traceable calibrations in the wavelength range from 250 nm to 2500 nm.
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Absolute Contamination Standards (ACS)
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The Absolute Contamination Standard (ACS) is used to calibrate instruments which size and detect particles on the surface of bare silicon wafers. Use ACS to characterize particles, before particles characterize products.
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GPS Frequency Standards
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Precision Test Systems manufacturers' a full range of GPS and GNSS frequency standards that are disciplined to most of the worlds satellite systems.
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Digital & ARINC Standards Display Panel
TA-3001
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This is our soon to be introduced Digital Standards Panel. (2ND QTR) This panel is available with or without a Precision Resolver drive. Included on the panel are four digital displays; TA-902 API, TA903-01 OBI, TA903-02 Distance and a TA903-03 serial distance display. This panel when paired with the TA-3000 GPS/FMS test panel will make one of the most capable testing solutions available today
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Calibrated Diffuse Reflectance Standards
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Diffuse reflection calibration standards in synthetic ODM and ODMP material
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Nanoscale Microscopy Standards
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The nanoscale AFM-CD standard (CD, critical dimension) contains structures to calibrate line widths and periods of AFM (atomic force microscopy) devices.
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Analytical Reference Materials & Standards
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Agilent, now with former Ultra Scientific, offers a comprehensive portfolio of analytical standards, reference materials and certified reference materials for environmental, food safety, elemental analysis, instrument calibration, tuning mixes, and more.Reference materials and certified reference materials are substances that are tested to be homogenous and have fixed values of its concentrations. These standards are a critical component of your application workflow - from sample prep, instruments, columns, supplies, and services. The success of your analysis depends upon the quality of your reference material. All Agilent standard reference materials have been manufactured to the highest quality in an ISO 9001, ISO 17025 and 17034 accredited facilities to ensure the accuracy of your analyses.If you need a custom reference material, partner with us to design and develop a custom standard to your specifications.
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Nanolattice Standards for Analytical Instruments
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The NanoLattice™ (NLSM) 100 nm pitch standard utilizes gratings with near perfect periodicity to calibrate magnification and scan linearity of Electron and Atomic Force Microscopes (AFM). Make the grade, with the highest quality pitch standard of its kind available.
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Light Sources & Calibration Standards
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Photometric Solutions International Pty Ltd
We offer a range of specialised and customised light sources for various applications.The spectral range goes from 200 nm to 40 µm.
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Open Network Standards
ControlNet
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ControlNet is one of three open network standards (DeviceNet, ControlNet and EtherNet/IP), all of which use a common application layer, the "Common Industrial Protocol" (CIP). The Family of CIP Networks is specified and published by ODVA (Open DeviceNet Vendor Association - http://www.odva.org) and CI (ControlNet International - http://www.controlnet.org).
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Spectral Irradiance / Illuminance Calibration Standards
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Standard lamps calibrated in illuminance and spectral irradiance. Traceable calibrations in the wavelength range from 200 nm to 2500 nm.
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Viscosity Standards
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Brookfield Viscosity Silicone and Oil Standards provide a convenient, reliable way to verify the calibration of your Brookfield laboratory viscometer/rheometer.
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Low Voltage EMC Standards Tester
LVTGO-VBS
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LVTGO-VBS is a range of low voltage battery simulation units for robustness and EMC standards testing. It helps engineers to meet standards stipulated by a range of manufacturers, such as JLR, Ford, VW, BMW and Mercedes-Benz.
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Uniformity Calibration Standards
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Integrating sphere light sources with halogen lamps or LEDs for generating luminous fields with uniform luminance distribution. Traceable calibrations of luminance or spectral radiance in the wavelength range from 250 nm to 2500 nm.
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800MM 31.5In Digital Level Bevel Gauge w/ LCD Backlight Screen, Level Bubbles IP54 Standards
DL411
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Advance Plus Trading Co., Ltd.
Model Number: DL411 Key Specifications/Special Features: 800MM 31.5INCH Digital Level with level bubbles, 2 hand shanks, LCD bright backlight display, IP54 standards 1. 800mm 31.5inch level with 2 bubbles, 800*28*64mm（L*W*H）, net weight: 700g;2. Resolution: 0.05°;3. Horizontal level measuring range: 0 to 360°;4. Accuracy: ±0.3°;5. Measures angle in degrees, IN/FT, mm/m, % slope or pitch;6. Audible tone at level, plump and setting angle;7. Automatic shut-off after 3 minutes;8. Backlight LCD;9. Self checking accuracy;10. Self calibration;11. Hold-function to freeze the measurement;12. Memory recall (9 measurements);13. 2pcs Handshanks design, easy to take and use;14. 2pcs high accuracy horizontal & vertical bubbles, clearly to check;15. Operated by DC 3V (2*LR03 AAA 1.5V batteries, not included); 16. IP54 waterproof & dusyproof industrial standard.
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ITO Sheet Resistance Standards (ITOSRS)
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Indium Tin Oxide Sheet Resistance Standards (ITOSRS) from VLSI Standards are NIST-traceable products, intended for calibration of both contact and non-contact sheet resistance measurement tools used in the LCD, flat panel and touch-screen markets.
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Standards and Regulations
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Is your organization ready to engage in the world of autonomous and electric vehicles?
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Software Development Standards Compliance Solution
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The most comprehensive development compliance solution; FDA, DO-178B/C, MISRA, JSF, PCI-DSS, ISO, IEC, and more. ntegrate compliance policies into the SDLC and team workflow. Accurately and consistently automate verification and validation tasks
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Multi-Element Standards
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These multi-element standards consist of multi-layer thin film coatings, one on top of the other, upto a maximum of 6 elemental coatings. It is generally recommended to have coating thicknesses < 20 µg/cm2, so as to cause negligible notable matrix effects, in particular absorption of X-rays emitted in lower deposits by those covering them.
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Spectral Radiant Flux / Luminous Flux Calibration Standards
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Standard lamps calibrated in luminous flux and spectral radiant flux. Versions with 2-Pi and 4-Pi emission characteristics. Traceable calibrations in the wavelength range from 200 nm to 2500 nm.
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Reflectance Standards
STAN Series
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Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
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UL Standards Testing and Certification
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If you are selling your product in the United States, your product must comply with the applicable nationally accepted UL standards. F2 Labs can evaluate and test your product, help you through the UL certification process and enable you to certify your product to the UL requirements through a Nationally Recognized Test Lab (NRTL).
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Calibration Standards
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The accuracy of any spectroradiometric measurement can only be as good as that of the standard source used to calibrate the system.
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Resistance Standards
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Ohm-Labs manufactures reference grade resistance standards from 10 micro-ohms to 10 teraohms. Each range of standards utilizes the latest advances in materials and processing for high stability and immunity from changes in ambient environment. All products are supplied with ISO17025 accredited calibration.
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Gas Flow Standards
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Fluke Calibration offers molbloc/molbox gas flow calibration systems to calibrate flow meters and controllers over a very wide range of flows. The systems are fast, precise and transportable and can be fully automated using COMPASS for Flow software. molblocs, which are the heart of the measurement system, are mechanically stable, gravimetrically calibrated laminar flow and sonic nozzle elements.
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Standards Reference for Test Systems PXI Card
GX1034
PXI Card
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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Coating thickness XRF Standards
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We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
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NanoCD Standards (NCD)
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The NanoCD™ (NCD) is the first commercially available standard to provide line width accuracy calibration at the 45 nm, 65 nm, 90 nm and 130 nm nodes. Use these standards for tool matching, calibrating the width of a CD-AFM tip, or CD-SEM diagnostics.
