Fixtures
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See Also: Fixturing, Test Fixtures, Mechanical Fixtures, Vacuum Fixtures, Jigs
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Main Air Data Test Fixture for ADC's
TA-245
This is the Main Air Data Test Fixture as shown in the AZ-241 repair manuals and will allow by the book testing of the units.
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Manual Fixture Kit
230355 – CMK-06
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Vector Network Analyzer
SNA5000A
The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Training/Verification/Demonstration Fixture | CableEye Cable Harness Tester
Item 802 (CB-T2)
This multi-purpose CBT2 fixture can be used for operator training, tester system verification, and facility verification.
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High Speed Spin Fixture
1571P Series
The Model 1571 High Speed Rate Table System is designed to provide a precision high velocity testing solution for the development and/or production testing of inertial packages or their components.
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EBIRST 50-pin D-type Verification Fixture
93-005-101
The 93-005-101 50-pin D-type Verification Fixture is an accessory for the eBIRST range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Standard & Custom Test Fixtures
Both standard and custom Test Fixtures from OAI enable the user to integrate the solar cell with the I -V tester. Fixture configurations range from from simple hold down devices to temperature-controlled fixtures with front and back side contact. We invite you to contact an OAI Application Engineer for help with your fixture design. With our expert guidance, you can expect maximum performance from your I -V Tester and Solar Simulator.
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CableEye® HV-Rated QuickMount™ Housing for CAMI Connector Boards
CBH2
CAMI Research Inc. (Acton, MA) has released a High-Voltage (HV)-rated QuickMount housing (CBH2) for its CableEye® automation-ready, cable and wire harness testing systems. As a free-standing, quick-release board fixture, it allows users to connect CAMI’s test interface boards to the 64-pin headers of any expansion module - even at some distance. The housing may be used with any CableEye model and is rated to 2100 Vdc / 1500 Vac.
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High Node Count In-Circuit Test Fixtures
HNC Test Fixture
Circuit Check continues to be a leading edge provider of custom engineered test solutions with our new Keysight i3070 HNC test fixture. Working with Keysight Technologies during the development of their HNC adapter in 2011, we were the first test fixture provider to offer customers with a solution to test large node count boards. High node count test fixtures can handle greater than 10,000 probes.
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Test Fixture with API
TA-14VG
The TA-14VG test fixture is based on the requirements for the Integrated Test Procedure for the VG-14A assembly as shown in the OEM maintenance manual. The panel also contains a test point breakout for the units main connector as well as one for the VG-401 base. The VG-401 breakouts provide an in series connection that will allow easy access to the gyro's signals and also provides a way to monitor rotor current. The panel also contains a variac to allow for line voltage adjustment.
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Ethernet Test Fixtures & Software
We have developed a series of custom testing tools as part of our dedication to performing the most comprehensive Ethernet testing in the industry. These tools allow for testing at lower layers than most commercially available tools and are available for use in your own testing labs. In addition, we have an extensive amount of T&M partner test tools which members of our Ethernet testing services also have access to.
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ITA, G12, Front Mount, 12 Module With Protective Cover
410104322
The G12 ITA can be used with all G12 Receivers. The ITA can be used in a number of applications to accomplish the required connection to the Unit Under Test (UUT). You can mount a VPC Enclosure or customize your own fixture to be attached to the ITA. These are front mounted for ease of installation. A wide range of ITA modules are available separately for user configuration.
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Breakdown Voltage Tester
ZDS-50B
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.5-2008/IEC60851-4; Inspection standard: JB/T4279.11-2008Used to test the breakdown voltage performance under room temperature of enameled round and flat wires with nominal conductor diameter of 0.018mm and above;Three voltage rise speeds are available: 20V/s, 100V/s and 500V/s, with error being ±5%;Three test methods can be adopted: round bar method, twist pair method and ball method;Clamp a group of test samples (5 for each) once, available to complete breakdown or withstand voltage test for any of sample one by one or individually; breakdown voltage and withstand voltage time would be automatically saved for future enquiry; all operations would be automatically completed;Capable of conducting high temperature breakdown voltage test in combination with RDS-50 thermal-state voltage tester;LED would automatically display test results and automatically return;During sample breakdown, breakdown voltage indication value would be automatically locked, free from flashing, and the test result is distinct and relatively clear;Equipped with test fixture for round rod method and twist pair method as well as the test weight for round rod method;Equipped with ball method test device (steel balls are prepared by user);Test door is provided with safety interlocking device, compliant with relevant regulations on high voltage testing equipment.
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GB-GRAM/GB-GRAM-M Interface Card
Valiant 153M
Valiant 153M is a GB-GRAM/GB-GRAM-M (GB-GRAM/M) interface card that allows the simultaneous operation and testing of a commercial- off-the-shelf (COTS) receiver and a GB-GRAM/M. Both receivers are powered and communicate using a single USB mini cable. By integrating a COTS receiver onto the Valiant 153M, users can perform cross-checks to determine if the military receiver is connected and communicating data properly. Both receivers communicate via the onboard USB mini or RS-232 serial connectors. The Valiant test fixture was designed to be nearly the same size as the GB-GRAM/M type I card.
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PXIe-5650, 1.3 GHz RF Signal Generator
781215-01
The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Flying Probe PCB Test and Repair System
GRS500
Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
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Audio Panel/Amplifier Test Fixture
TA-200
The Model TA-200 test panel was designed to allow Avionics shops the capability to test and troubleshoot both today's new generation audio panels as well as the standard audio panels of the past. The testing of these panels over the years has always proven to be a very time consuming job for most shops because of the limited capabilities of any past test panels.
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Enhanced Time Domain Analysis With TDR
S96011B
Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).
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Automated Bare Board Tester with Built-In Camera
QTOUCH2404C
Qmax Test Technologies Pvt. Ltd.
Qtouch2404C – Automated Bare Board Tester with in-built camera is designed to make automatic image capturing and probing of bare PCBs. It is designed to move on X,Y,Z directions making it possible to probe every test point. Flying Probe Tester is designed for testing high density fine pitched Single Sided / Double Sided and Multilayer PCBs for continuity and isolation using moving probes fixture –less technology.
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Actuation Methods for In-Circuit Test Fixtures
Commonly referred to as In-Circuit Test (ICT), loaded board test can be defined as the task of measuring values of components that have been installed on a printed circuit board (PCB). A second basic category of loaded board test measures simple open and shorts on the board to verify manufacturability standards. Circuit Check supports all forms of in-circuit test strategies with its Performance Grade and Value Line test fixtures.
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Sample Preparation
Careful attention to specimen preparation is critical to obtaining top quality test data. Pacific Testing Laboratories has, what it believes to be, the most extensively equipped machine shop in any commercial laboratory. Its function is dedicated to fabricating test specimens and fixturing. Principal equipment includes diamond coated tooling, surface grinders, milling machines, lathes, a 30 ton precision press, laboratory presses, and a 4-axisCNC milling machine.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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3D Inspection Service
The reference data may come in the form of a table, with values at specific points or features, a cad model, or 3d scan. 3D inspection services may require datum measurements, where the part to be inspected is located in a fixture that is specifically designed to orient the part by an ordered method. In some cases, the part may have features that are designed specifically to be referenced by datums, if no functional feature of the part provides a clear reference.
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110 GHz, 1.0 Mm (m-f) Test Port Cable 10 Cm
11500JK10
Connect test ports to devices, fixtures, or probe tips with this 10-cm cable
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SIMRC - RS232 to I2C Converter PCB
1080-001
Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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Universal Cable/Harness Tester
LX-686
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,．·Up to 1500Vdc/1000Vac Test Voltage ,．·256 Max. Test Points , (Max of all series)．·500 Max Files Memory,support USB or PC unlimited expansion,．·Arc detection level 0-9 ,auto prompt．·Adopted high resolution colour 640*480 TFT LCD ,．·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire.．·Auto Scan and Auto Pin Search ,．·The system provides advanced instant open-circuit, short-circuit, continuity test,．·Intermittent Conductance Test,．·Intermittent Open/Short Test ,．·Full Programming Sequence Test ,．·Versatile I/O Ports for application ,．·Statistics and Print Function,．·Provide REMOTE interface, communicate with PLD auto test fixture,．·Provide personalized customization according to different requirements,
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3-Component Quartz Force Rings And Links
Three-component dynamic force sensors are offered in both ICP® and charge output configurations for dynamic and quasi-static force measurement applications. Each utilizes an array of precision aligned, quartz sensing crystals. Measurements along the z-axis are proportional to applied compression, tension and impact forces. Measurements along the x and y axes are proportional to shear forces that are imposed upon preloaded crystals by the test fixture.
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Automated Interferometer with Floating Pastille Technology
DAISI MT FP
The Daisi MT FP combines the Daisi MT-V3 with the new Floating Pastille fixture technology from DATA-PIXEL (patent pending). This major technological breakthrough for multi-fiber connector fixtures is perfectly suited for highly accurate X/Y endface angle measurements.
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Environmental Chambers
3119-600 Series
The Instron environmental chambers are precision thermal enclosures designed to integrate with static or dynamic test systems, enabling evaluation of material behavior under controlled non-ambient conditions. They circulate hot or cold air over specimens and grips using forced-convection to maintain stable temperatures. These chambers are available in a variety of standard sizes (or can be customized), and are compatible with extensometers, grips, and fixtures to provide a turnkey solution for temperature-dependent testing from subzero to elevated conditions.
