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Product
Test Interface Solutions
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As the leading independent provider of pick-and-place handler change kits, we provide the best quality and affordable kit using only the most robust materials.
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Product
ULTRA® Contactors
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ULTRA CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Product
RF Solution Integrated Handler
3240-Q
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The Chroma 3240-Q is a unique and innovative handler with integration of RF/Wireless isolation chamber.
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Product
Digital Low Resistance Tester
TH2512
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Shenzhen Chuangxin Instruments Co., Ltd.
The TH2512 series digital dc low resistance tester i s an intelligent, wide range, high-precision tester which suitable for transformer, inductor copper resistance, relay contact resistance, switches, connectors, wire resistance, contact resistance component solder contact resistance, PCB line, welding hole resistance and metal detection, etc. It’s applied to the production line and can use HANDLER interface and GPIB interface (option) output good/bad signal, in order to improve production line automation testing capability.
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Product
ATOM Handler
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The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
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Product
ROV Thickness Gauges & Probe Handlers
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ROV Thickness Gauges & Probe HandlersCompleting the Cygnus ROV Mountable thickness gauges, a range of ROV Probe Handlers have been developed to offer an engineered probe handling solution. Each probe handler will work with a thickness gauge of the Cygnus ROV Mountable range listed below.
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Product
Logic Test Handler
M620
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- Maximized Productivity- Handles various device size- Short conversion time- Easy mantenance- Minimized footprint
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Product
Power Discrete Tester
Mostrak-2
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M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
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Product
High-Performance Strip Handler
MCT SH-5300
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SH-5300™ high-performance strip handler for testing advanced semiconductor packages, LEDs, MEMS sensors, and traditional ICs. It can handle a vast array of strip and laminate lead-frame sizes. Capable of tri-temp testing -55˚C to +160˚C and ambient testing to +160˚C.
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Product
High-Speed Laser Mark Handler
MCT MH-3300
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MH-3300™ high-speed laser mark handler is used for marking of 2DID codes on the lead frame in support of strip testing, marking of reject devices, and for final package marking in strip test or assembly operations. The MH-3300 offers unparalleled throughput performance and the best cost-of-ownership in the industry.
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Product
Automatic System Function Tester
3240
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Chroma 3240 is an innovative handler for high-volume multi-site IC testing at the system level.
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Product
Wafer Level Test Handler
Kronos
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Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Product
TestStation Automated Inline Handler | In-Circuit Test Solution
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Teradyne’s High-Speed Inline Automated Board Handler with TestStation Multi-Site Test Insert is designed for productivity, fast change-over, and low operating cost. Our in-circuit test solution fits seamlessly into automated production lines to provide “hands-off-lights-out” operation.
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Product
DC-Resistance Meter
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High-stability internal resistance of the battery Meter.The main battery internal resistance and battery voltage. This product can simultaneously measure the resistance and voltage and to compare battery internal resistance and open-circuit voltage.The CHT3560 standard RS232C and HANDLER interface automated measurement fast and accurate judgment the battery deterioration of the situation, sorting products suitable for battery assembly line and factory inspection. Low resistance characteristics can be used to characterize the mechanical and electrical components down low current test conditions.
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Product
MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Product
High Parallel Tri-Temp Pick-and-Place Handler
Delta MATRiX
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Cohu’s MATRiX handler has a highly flexible test site configuration that’s well suited for a wide range of test applications, including analog ICs with short test times and high throughput, automotive devices requiring accurate thermal control, small pitch wireless-communication products, high parallel microcontroller testing, MEMS device testing, and many other device market segments with their unique requirements. The MATRiX has a highly flexible test site configuration that enables customers to reuse existing load-boards, including boards made for competitor’s legacy handlers.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
Equipment Front End Module Wafer Handler
Sigma EFEM
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Integration transforms the bond tester into a fully automated system. We offer various types of EFEM (Equipment Front End Module) wafer handlers, to combine with a Sigma W12 for operator-free bond testing.
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Product
Clinical Microplate Instrumentation
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Clinical microplate instrumentation provides high efficiency and performance for your clinical diagnostic workflows. From ELISA microplate readers and washers, to multifunctional liquid handling, multimode detection and automated microscopy, Agilent BioTek microplate instruments and software are designed for ease of use in setup and operation, while providing powerful analysis for quick, high-quality results. For even greater automation and higher throughput, microplate stackers, handlers and automated incubators transform a benchtop instrument into a walk away automated system.
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Product
Modular Gravity Handler For Small Devices
Rasco SO2000
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Modular designed gravity handler with various input and output possibilities. SO2000 can handle the smallest possible packages for gravity and provides a broad range of Sensor and MEMS applications.
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Product
Die-To-Wafer Bonding Systems
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Several different D2W bonding methods are available and selected depending upon the application and customer requirements. In direct placement D2W (DP-D2W) bonding, the singulated dies are bonded to the target wafer one by one using a pick-and-place flip-chip bonder. Plasma activation and cleaning of the surfaces of the dies on the handler wafer are essential steps for establishing a high-yielding bond and electrical interface between the dies and target wafer. This is where the EVG320 D2W activation system comes in.
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Product
Milliohm Meter
16502
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Chroma Systems Solutions, Inc.
Basic accuracy : 0.05%Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurementDC test current output mode is used to fasten measurement speed for inductive DUTDry-circuit test current output mode (limited Max. 20mV) is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 50mVTemperature correction (TC function) regardless of material or temperatureUseful temperature conversion function for motor/ coil evaluation4 channels R scan with balance check function for fan motor (combined with A165017 option)0.001mΩ~1.9999MΩ wide measurement range with 4½ digits resolutionStandard RS-232 interfaceOptional GPIB & Handler interfaceBin-sorting functionComparator and pass/fail alarming beeper functionLarge LCD display (240 x 64 dot-matrix)Friendly user interface
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Product
Universal Manipulator
LSC
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The LSC is a versatile universal manipulator, compatible with probers, vertical plane handlers, and dock-from-below test systems.
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Product
In-Line / Board Handler
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Circuit Check’s in-line board handler fixturing exceed the high performance requirements associated with high-volume production. Circuit Check supports in-line fixturing for all the leading ICT handlers including Keysight 5i, Teradyne TSh Multi-Site, IPTE and Pematech. Circuit Check is the go-to partner for in-line functional test fixtures to speed production throughput.
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Product
Tabletop Single Site Test Handler
3111
Test Handler
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
Turret Test And Scan Handlers
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Turret platforms for semiconductor test, inspection and packaging.
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Product
Hybrid Single Site Test Handler
3110
Test Handler
Chroma Hybrid Single Site Test Handler 3110 is a full range ATC (Active Thermal Control) test handler capable of handling device bodies up to 120x120mm with 450kg force load.
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Product
Test Handler
ETH
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The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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Product
Single Head Component Testers
34XX
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Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
