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Product
Signal Splitter
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The Dynamic Signal Buffered Splitter protects sound and vibration sensor acquisitions from the unwanted effects of a parallel troubleshooting or diagnostic instruments. G Systems Dynamic Signal Buffered Splitter provides buffered and unbuffered outputs connected to the same signal input. Up to 16 sensors, typically accelerometers, proximity probes, microphones, and pressure transducers, may be connected to the 16 signal inputs.
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Product
Mezzanine System
3560
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ECM P/N 3560 provides four independent I2C channels. For ease of development a PCA9564 interface IC converts parallel data to I2C serial communication. Additionally an LTC1694 I2C accelerator IC decreases the rise time of the passively pulled up I2C bus allowing for greater capacitive loading or higher bus speeds. Each channel is comprised of SCL, SDA and two Grounds.
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Product
Hyperspectral Cameras With USB3 Vision
XiSpec
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*Smallest Hyperspectral camera - Compact, lightweight with only 26.4 x 26.4 x 31 mm, 32 grams (1)*Cost efficient - Excellent value and price through utilizing new imec hyperspectral imaging technology*Cool economy - Low power consumption with 1.6 Watt, minimal heat dissipation, ideal for UAV / UAS*All-around support - USB 3.0 support for Windows 7 and 10, macOS, Linux, ARM*Powerful potential - Highest spatial and spectral resolution, possible with 5Gb/s interface*Optimized - 2048 parallel, "on-chip" integrated spectroscopes with 100 points of spectral resolution each*AIA standard - USB3 Vision standard compliant*Industry standard interface - Compatible with USB 3.0 SuperSpeed specification*Fastest Hyperspectral camera - High speed, high frame rate: based on 170 fps at 2.2 Mpix resolution*Connectivity and Synchronization - Programmable optoisolated input and output, 3 status LEDs*Easy deployment - Range of accessories and wide hardware and software integration*Highly Customizable - Variety of sensor options, which can be further adjusted to match requirements*Interoperability increase - Continuous embrace of new software and hardware partners
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Product
5.0 MP Custom Lens Camera Module (Monochrome)
e-CAM50_CU9P031_MOD
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e-CAM50_CU9P031_MOD is a 5 MP custom lens monochrome camera module based on Aptina's MT9P031 CMOS image sensor with S-mount lens holder attached to it. The MT9P031 is a 1/2.5" Optical Form factor, Electronic Rolling Shutter CMOS sensor. The e-CAM50_CU9P031_MOD is designed to connect with any Application Processor that has parallel digital video interface. The standard S-Mount lens holder can accommodate a wide range of lenses based on the customer choice. e-CAM50_CU9P031_MOD’s S-Mount holder can also house a fisheye lens or a zoom lens to meet their application requirements.
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Product
Basic Power Supply - 80 W Max Output Power
NGA100
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The R&S®NGA100 DC power supplies are linear, compact and easy to use in diverse scenarios. All models have excellent readback accuracy with a low-current range for demanding measurements. Data logging, arbitrary waveforms, built-in statistics and remote sensing features make the instruments ideal for various bench applications, such as:- R&D;- Creating IoT low power designs - Manufacturing- Education- General purpose use casesEquipped with a number of different remote interfaces, including USB and Ethernet, R&S®NGA100 DC power supplies are also great for automated tests. The channel fusion feature extends voltage and current range. Get up to 200 V with the R&S®NGA142 in serial mode and up to 12 A with the R&S®NGA102 in parallel mode. Advanced protection functions keep devices connected and power supplies safe.Choose the DC power supply for your use case by selecting the base unit and necessary options in our online configurator. This makes the procedure easy and fully price transparent for fast processing of your order request by our authorized distribution partners. Click "configure and quote" to start your configuration.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
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Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
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Product
PMC-Parallel-485
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The PMC compatible PMC-Parallel-485 design adds 32 [RS-485 /RS-422] differential IO lines to one slot of your carrier board. 2 additional differential pairs are available for a clock & clock enable. The signals can be used to capture data with an external reference or programmed to be references for the rest of the system.
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Product
Serial To Digital Interface MiniBox™
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ICS's 2363 Serial Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications. OEM board versions available for inclusion in test chassis.
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Product
PXI 16 Bank 5 Channel 1 Pole Multiplexer
40-616-021-16/5/1
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The 40-616 16-Bank, 5-Channel, 1-Pole Multiplexer Module forms part of the System 40 PXI Programmable Switching system. The Module consists of 16 electrically isolated banks of multiplexers controlled by a PXI/ PCI interface. Each bank is a 1 to 5 multiplexer and operates with break-before-make action when a new channel is selected. Any Individual multiplexer bank can have a channel set by itself, alternatively, multiple banks can have channels selected simultaneously. The module is suitable for cascading in applications that require large multiplexer systems, it is also suitable for test systems that require the switching of a large number of signals in parallel.
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Product
Software Solutions
ZAP MULTIRUN
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The ZAP MULTIRUN allows parallel or sequential execution of the same script on multiple work stations and mobile devices. Using ZAP MULTIRUN test automation teams expedite time to execution multiplied by number of devices per given test runs.
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Product
Digital Test Instruments
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Low-Temperature Impact Device
DWC-1
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This low-temperature impact device is compliance with standard requirement of IEC60245, IEC60227, IEC60540, GB5013-2008, GB5023-2008 and GBT2951-2008. It’s used to test all kinds of PVC sheathed cable, wire, soft wire and no sheath of parallel soft PVC insulated impact resistance at low temperature. Specification: • Working temperature: -15℃±1℃ • Impact height: 10~200mm adjustable • Length of specimen: 5D~150D • Material: 304 stainless steel • Completion time once: 3~5s • Completion number of units for once: ≥2pcs • Weight: 100/200/300/400/500/600/750/1000/1250/1500g • Low temperature box to match additionally
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Product
GPGPU Processor Card
VPX3-4935
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Curtiss-Wright Defense Solutions
The VPX3-4935 delivers incredible processing power from its NVIDIA Quadro Turing TU104 GPU, providing an impressive 3072 CUDA cores for parallel processing and a 50% improvement in performance per CUDA core compared to the previous Pascal generation.
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Product
DC Electronic Loads
LSG Series
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*Operating Mode : C.V/C.C/C.R/C.P/C.C +C.V/C.R + C.V/C.P. + C.C.*High Precision, High Resolution (10 A),High Speed Variable Slew Rate (16A/ s).*Sequence Function for High Efficient Load Simulations.*Parallel Connection of Inputs for Higher Capacity. (With 4 Booster Units : Max 9.45kW or 4 Master Units)*External Channel Control/Monitoring via Analog Control Connector.*Program Mode to Create Work Routines for Repetitive Tests.*Multiple-Interface : USB 2.0 Device/Host and GPIB/RS-232C.*Adjustable OPP/OCP/OVP Setting.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 11,30 kg
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Product
Time History Recording to Throughput Disc
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For the most critical tests time history data can be recorded in parallel with vibration control with no reduction in control performance. The real-time throughput data capture function of the m+p VibControl system allows you to record all selected channels continuously in the time domain on the embedded data server (“throughput to disc”) irrespective of the channel count and the frequency range utilized. This means that you can always access all the original data for analysis purposes.
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Product
256 Channel Power Supply
IDPS750
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Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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Product
Memory Products
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The electronic systems we use today require some form of memory for data and software storage. As a leading supplier of high-quality memory products, we offer a broad portfolio of serial EEPROM, serial EERAM, parallel EEPROM, OTP EPROM, serial Flash, parallel Flash, serial SRAM, NVSRAM, and CryptoMemory® security ICs to meet your memory needs. We also offer the industry’s first commercially available serial memory controller for use in high-performance data center computing applications. Our extensive testing protocols have ensured industry-leading robustness and endurance along with best-in-class quality to provide you with reliable products, dependable technical support and a consistent supply of devices throughout your product’s lifecycle.
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Product
Pattern Generator
PI-2005
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As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Product
8 Channel 250 MHz 12-bit ADC/Digitizer
SIS3320-250
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8 channel 6U VME digitizer/transient recorder with a sampling rate of up to 250 MHz (for the individual channel) and 12-bit resolution. The board has a width of one VME slot (4TE). The boards multi event and readout in parallel to acquisition functionality make the card the choice for many demanding digitizer applications.
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Product
Digital LCD Display Drivers
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Analog Devices DecDriver® family of digital LCD display drivers helps meet the increasing demand for higher resolution displays in home entertainment and home theater. This portfolio of products offers improved power, enhanced image quality, and lower costs, and has been optimized for a wide range of displays and performance needs. Our digital LCD display drivers operate over the commercial temperature range of 0°C to 85°C and include features such as a flexible digital input format that allow the devices to be used in parallel in high resolution displays.
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Product
Confocal FLIM System
DCS-120
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*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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Product
Test & Measurement Platform
Konrad System Manager
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The Konrad System Manager is the central tool for the Konrad test and measurement platform. It combines execution, interactive supervision and documentation of the installed Konrad test modules.- Displays the live status of the module functions in parallel to running test executions- Easy debugging of the switch routes- Control the modules functions- Configure device Alias name for modules- Display alias naming for switching channels- Execute selftest functionality of the modules- Display device information and documentation of the installed modules- Simulate modules
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Product
Data Acquisition I/O Boards
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General Standards Corporation is a leading supplier in data acquisition I/O boards, provides a complete family of data acquisition cards for sonar, industrial, and embedded applications on several form factors/busses, and for many operating systems. Functions available include analog I/O, serial I/O, and high speed parallel I/O.
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Product
Battery Pack/Module Test Solution
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Regenerative battery energy dischargeEnergy savingEnvironment protectionLow heat generateChannels paralleled for higher currentsCharge / discharge mode (CC, CV, CP) Constant current Constant voltage Constant powerDriving cycle simulationHigh precision measurement accuracyFast current conversionSmooth current without over shootTesting data analysis functionData recovery protection (after power failure)Independent protection of multi-channelBMS data recordingThermal chamber control integration
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Product
Digital Phase Shifters
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Macom Technology Solutions Holdings Inc.
At MACOM we offer a comprehensive portfolio of 4-Bit and 6-Bit phase shifters. Each of these devices operates with either serial or parallel control inputs. These parts can be used for either Aerospace and Defense or Commercial applications such as; Military or Weather Radar, Transmit/Receive Modules, Phase Cancellation and Electronic Warfare. Our family of phase shifters are packaged in a convenient surface mount PQFN and boasts 360° Coverage, Fast Switching Speed and Low Phase Error.
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Product
NTDS I/O Analyzer
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The NTDS I/O Analyzer provides insight and visibility, enabling users to quickly and efficiently analyze timing relationships, message protocols, throughput, and data integrity on all types of NTDS interfaces. It is capable of monitoring any combination of NTDS Parallel Type A, B, C, H and NTDS Serial Type D, E channels as defined in the MIL-STD-1397 revision B and C specifications regardless of NTDS mode. The channels are connected to existing NTDS cabling with NTDS tap boxes and extract ongoing communication. Each word of NTDS information received is time-stamped with a 125 nanosecond resolution clock ensuring highly accurate timing measurements. Data collected is stored locally for analysis and can be transmitted to external equipment enabling remote troubleshooting, event reconstruction, or time-critical feedback on system performance.
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Product
Flexible Data/Analog Switching System
S6025DE
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Universal Switching Corporation
Designed for parallel switching of RS-232 data or other similar types of data, the S6025DE delivers compact solid-state switching in an expandable configuration. The unit can start as a smaller size and be expanded later to a full 60x60 array with 25 levels, perfect for switching RS-232 type data. It provides a choice or a combination of remote control including RS-232C, RS-422A, RS-485, GPIB (IEEE-488) and Ethernet (10base-T).
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Product
Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Product
4500~6000W DC Electronic Loads
JT634 Series
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Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
