Primary Current Injection Test
-
Product
HPC High Current Probes, 100 – 187 mil (2.54 – 4.75 mm)
HPC
-
100 – 187 mil (2.54 – 4.75 mm)
-
Product
Primary Injection Test System
-
HAOMAI Electric Test Equipment Co., Ltd.
Primary injection testing is suitable for testing over-current trip relays attached to a circuit breaker.
-
Product
Injection Analyzer
-
IAV Automotive Engineering, Inc.
Instrument for the simultaneous measurement of injection rate and injection quantity. The Injection Analyzer is used for investigating hydraulic parameters in the course of development work on high-pressure injection systems.
-
Product
Primary Test Equipment
LET-400-RDC
-
The LET-400-RDC is designed to perform most of the primary tests that are necessary in substations commissioning. It allows to perform with sufficient power, all the primary current injections to test the proper function and wiring of all the elements that compose the protection and measuring section in a substation.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
LTE RRM Test System
T4010S
-
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
-
Product
PCIe 2.0 Test Platform
PXP-100B
-
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
-
Product
NI-9266 , 8-Channel C Series Current Output Module
785046-01
-
8-Channel C Series Current Output Module - The NI‑9266 is ideal for interfacing and controlling industrial current-driven actuators. The module has built-in open-loop detection, which generates an interrupt in software when an open loop is detected as well as zeroing outputs to ensure safety and avoid driving actuators at system power on. The NI‑9266 includes channel‑to‑earth ground isolation for safety and noise immunity.
-
Product
Build-to-Print for Test Systems
-
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
-
Product
PXI Semiconductor/IC Test System
-
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
-
Product
NI-9253, 50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module
785989-01
-
50 kS/s/ch, ±20 mA, 24-Bit, 8-Channel C Series Current Input Module - The NI-9253 is an 8-channel analog input module for ComapctDAQ and CompactRIO systems. Each channel provides a ±20 mA input range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9253 has several diagnostic features to ensure your system is operating nominally at all times with open channel detection, power supply detection, and configurable thresholds. The NI-9253 has eight LEDs to indicate the status of each channel and the power supply so that a user in the field can easily validate that the system is operating normally. The NI-9253 also features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
-
Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
-
Stopper kit includedYAVCANCON2 for fixture identification not included
-
Product
Automotive Ethernet Test Fixture
AE6941A
-
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
-
Product
Fastest In-Circuit Test Platform
TestStation
-
Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
-
Product
Combination Board Functional Test System
QT 4256 ATE
-
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
-
Product
6TL19 Off-Line Base Test Platform
H71001900
-
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
-
Product
Standard - 1.44 (41.00) - 4.50 (128.00) High Current Probe
HCP-13P
-
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
-
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
-
Product
Primary Test Equipment
LET-400
-
It allows to perform with sufficient power, all the primary current injections to test the proper function and wiring of all the elements that compose the protection and measuring section in a substation.
-
Product
NI-9247, 50 kS/s/ch, 50 Arms, 147 Apk, 24-Bit, 3-Channel C Series Current Input Module
783589-01
-
50 kS/s/ch, 50 Arms, 147 Apk, 24-Bit, 3-Channel C Series Current Input Module - The NI‑9247 is designed to support direct ring lug connectivity to the three-phase high-current measurements of 1 A and 5 A current transformers (CTs). It is optimized for power, energy, and industrial applications. The safety features, certifications, input ranges, overvoltage ranges, and connectivity are well suited for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs).
-
Product
Primary Injection Test Set
T1000
-
T1000 primary injection test set is the model featured with light weight and 2 minutes continuous output time at 1000Aac.
-
Product
PXI Digital Test Instrument
PXIe-6943
-
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
-
Product
Photodiode Burn-in Reliability Test System
58606
-
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
NI-9208, 500 S/s, ±20 mA, 16-Channel C Series Current Input Module
780968-01
-
500 S/s, ±20 mA, 16-Channel C Series Current Input Module - The NI‑9208 is designed with industrial systems in mind. It includes a high-resolution mode with 50/60 Hz rejection to remove low frequency noise. It has high-channel density to reduce the number of modules needed, which leaves slots open for other measurement types or for reducing the overall per channel cost of the system. The NI‑9208 uses a standard D‑SUB connection for use with cables and connector blocks.
-
Product
Test Port Cable, 1 Mm
11500L
-
Connect test ports to devices, fixtures, or probe tips with this 24-cm cable featuring a return loss of 16 dB minimum.
-
Product
Fuel Injection Tester
FIT13APB
-
This basic fuel injection tester includes large and small Schrader adapters, M6-1.00 O-ring adapter, and tee manifoldIncludes everything necessary to test the following systems: American Motors; Bosch AFC, MPC European and Japanese (except CIS- use our FIT447); Chrysler Corporation; Ford Motor Company; GM (except TBI- use our FIT446)
-
Product
Fuel Injection Tester
FIT13A
-
This basic fuel injection tester includes large and small Schrader adapters, M6-1.00 O-ring adapter, and tee manifold. Includes everything necessary to test the following systems: American Motors; Bosch AFC, MPC European and Japanese (except CIS- use our FIT447); Chrysler Corporation; Ford Motor Company; GM (except TBI- use our FIT446); Japanese fuel injection systems; a The 2-1/2" gauge has a dual scale dial with ranges from 0-100psi and 0-7 bar.
-
Product
Benchtop Automated Functional Test
midUTS
-
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
-
Product
Secondary Injection Relay Test Set
TD 1000 PLUS
-
TD1000+ is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment. In comparison with T 1000 PLUS model, TD 1000 PLUS has two current outputs to test the differential relay characteristic curve, besides the pick-up current.
-
Product
Fault Injection and White-Box Testing
VectorCAST/Probe
-
VectorCAST/Probe is integrated with the full family of VectorCAST tools allowing probes to be inserted during Unit, Integration, or System Testing. The probe insertions are controlled by the same technology that controls our code coverage instrumentation, which ensures that the probes function correctly regardless of the compiler, target processor, or run-time environment.





























