Primary Current Injection Test
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
Test Instrument
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Fault Injection Module
WF 3154 C-Series
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The WF 3154 from WireFlow is a 4-channel Fault Injection Module for Compact RIO. Each channel provide three solid state relays that can be used to create electrical fault conditions like: Open circuit, Short circuit to battery, Short circuit to ground.
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
Secondary Injection Equipment for Relay Testing
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Portable equipment to test all types of protective relays and power system protection schemes. Automatic relay testing software, Comtrade transient playback and test reporting.
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Product
Primary Adhesive Tester
DRK129
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Shandong Drick Instruments Co., Ltd.
DRK129 Primary Adhesive Tester is applicable in primary adhesive tests of pressure sensitive adhesive tapes, adhesive bandage (plaster), label, protective films and other products.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Standard - 1.44 (41.00) - 4.50 (128.00) High Current Probe
HCP-13A
High Current Probe
Current Rating (Amps): 15Average Probe Resistance (mOhm): 25Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 250,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Plastic Injection Molding
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Astronics supports world-class OEMs with tight tolerance moldings using highly-engineered aerospace-grade and structural resins.
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Product
ESS Performance Test System
Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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Product
VLSI Test System
3380P
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Primary Cable Fault Locating
Directional Impulse Detector
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The Directional Impulse Detector ( D.I.D.) is a compact handheld detector used to locate primary cable faults by sensing the magnetic field generated by the current pulse from a high voltage discharge device (thumper). A meter deflection indicates the intensity of the received signal. No deflection indicates that you have walked beyond the fault or away from the cable.
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Product
Primary Injection Test Set
PI-6000
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The PI-6000 is a rugged & durable primary injection test set capable of testing circuit breakers up to 6,000 amperes frame size. It incorporates an output transformer with dual primaries to facilitate its use on power sources of 480 VAC as well as 208-240 VAC. The unit also includes dual secondaries to provide optimal impedance matching to a wide range of circuit breaker sizes. An internal voltage sensor automatically configures the AC control power section to be energized only when properly configured for the applied voltage.
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Product
TriRaptor Three-phase High Current Injection
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The TriRaptor is the only really portable three-phase injector in the market providing stabilized current in the range of 3000 A and beyond. It has been designed with the same ergonomics and performance characteristics found in the popular Raptor system, so it is really easy to use and can be transported by a single person in a regular vehicle.
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
Eddy Current Testing Instruments
INSITE HT & CT
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The Zetec InSite HT and InSite CT are multi-channel, multi-frequency eddy current testing instruments. They are both designed to operate at full production line speeds in tough manufacturing environments. Both the InSite HT and InSite CT are available in 2, 4, and 8 channel versions.
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Product
6TL24 Combinational Base Test Platform
H71002400
Test Platform
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
Modular Functional Testing Platform
OTP2
Test Platform
Functional testing is an important part of product development and manufacturing and is used to ensure quality, performance and reliability from launch to end of life. A modern, future-proof functional test system must meet many criteria in order to meet the ever-growing demands of the industry. The OTP 2 open test platform developed by LXinstruments meets the following requirements for a dynamic and highly competitive market.
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Product
Impulse Current Test Systems
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Fivestar HV Testing Equipment Co., Ltd.
Impulse current test systems are mainly used for testing transmission and distribution systems against the effects of direct or indirect lightning strokes or against electromagnetic interference effects. Primary application of impulse current test systems is the testing of surge arresters, nowadays mainly of the metal-oxide type (MOA) and surge protection devices (SPD). Now they are also widely used to test vehicles, aircrafts, and military applications.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
2m BNC Test Cable
16048D
Test Port Cable
The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Eddy Current Testing
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Shanghai Xianda Denshijiki Industry Co.,Ltd
And the eddy current generated on the specimen by the specimen by the action of the magnetic field can not be detected (defect) and the change due to the influence of the material is detected.
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Product
200 Vdc External Voltage Bias Fixture
16065A
Test Fixture
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
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Product
CP500X, 500 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784253-01
High Current Probe
The CP500X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 1 meter in length. The CP500X attaches to BNC connections on both the signal input and instrument sides.
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Product
Memory Test System
T5230
Test System
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
In-line High-Density ICT System Series 7i
E9988GL
In-Circuit Test System
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
