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Full-Featured Life Cycle Test System
LCV
Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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Test Executive & Development Studio
ATEasy
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Life Cycle & Fatigue Testers
Switches can use all these operations. Membrane switches, keyboards and keypads will all require a push with a known force. On/Off switches will combine a push and a pull or possibly push on, push off. A rocker switch and toggle switches will require a push in two different places. Rotary switches (and volume controls, potentiometers) need to be rotated clockwise and counter clockwise The standard life cycle and fatigue tester the B886 Simon System has been designed for life cycle and fatigue testing of switches, membrane switches, keyboards and keypads. It contains all the components needed to life and fatigue test a products that need to be pushed. We can also supply different actuators for a push, pull, rocker, toggle, volume control or rotary switch.
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DC Power Supply
62000H Series
The 62000H Series includes 14 different models ranging from 5KW to 15KW, with current range up to 375A and voltage range up to 1000V. The 62000H can easily parallel up to ten units capable of 150KW with current sharing for bulk power applications, for example, battery bank simulation of 450V/150A/67.5KW for electric vehicle and military use. There are 100 user programmable input status on the front panel for automated test application and life cycle ON/OFF test. In addition, the 62000H has a 16 bit digital control with bright vacuum fluorescent display readout. The 62000H series DC power supplies are very easy to operate either from the front panel keypad or from the remote controller via USB / RS232 / RS485 / APG (Standard) and GPIB & Ethernet (optional). Its compact size with 3U only can be stacked on a bench in a standard rack without any difficulty.
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Fatigue Rated Low Profile Cells
Fatigue rated load cells are specifically designed for component durability and fatigue test machines where highly cyclical loading is present. These rugged load cells are extremely resistant to extraneous bending and side loading forces. They are used for material testing, component life cycle testing and structural testing. All fatigue rated load cells are guaranteed against fatigue failure for 100 million fully reversed cycles.
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Accelerated Product Life Cycle
Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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Electric Vehicle Battery Cell Tester
MCV
The MCV is a low-current life cycle test system for development of primary and rechargeable batteries in various chemistries. Operating from a common microprocessor, multiple circuits in the MCV module can run individual test programs. Additionally, the MCV is designed and built for ease of maintenance and service. The modular construction means that most subassemblies, large or small, remove easily for service outside the cabinet and fast replacement.
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LifeTest Software
In combination with the extended range of PEC test equipment, LifeTest supports the many specific functionalities required in battery testing labs. Drive cycle simulations (FUDS, DST…), thermal performance tests, high speed pulse tests (HPPT), life cycle tests, accelerated ageing tests and internal resistance measurement tests can be easily configured, scheduled, executed and reported from a single platform.
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Lifecycle Test System
Model 933
The Model 933A Life Cycle Test System is a low cost, generic test platform used to perform cycling of keypads, keyboards, membranes, switches, or any product requiring fatigue testing.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Material Testing
*Abrasion Testing*Adhesion Testing*Brittleness Temp.*Bursting Strength*Coating Testing*Coefficient of Friction*Compression Testing*Compression Set*Dart Drop Testing*Density Determination*Fatigue Testing*Fiberboard Testing*Flammability Testing*Flexural Testing*Foam Testing*Hardness Testing*Heat Deflection*Hydrostatic Testing*Impact Testing*Life Cycle Testing*Melt Index Testing*Plastic Testing*Ply Separation*Resin Content*Rubber Testing*Shear Strength Testing*Stress Crack Testing*Tear Testing*Temperature Testing*Tensile/Elongation*UV Exposure*Water Absorption*Wood Testing
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Milliampere-Level Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
mA class battery test system, mainly used for battery material research, high-precision test, pulse charge and discharge test, DCIR test, cycle Life test. It provides powerful testing equipment for research institutions, universities and experimental centers of battery production enterprises
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
