-
product
ALD Advantages
Atomic Layer Deposition (ALD) stands out for one reason: control. The most significant advantages of thin film deposition via Atomic Later Deposition over other methods, are manifest in four distinct areas – film conformality, low temperature processing, stoichiometric control, and inherent film quality associated with the self-limiting, and self-assembled nature of the ALD mechanism ALD is exceptionally effective at coating surfaces that exhibit ultra high aspect ratio topographies, as well as surfaces requiring multilayer films with good quality interfaces technology. This thin-film process builds materials one atomic layer at a time, delivering unmatched uniformity and sub-nanometer precision, even on complex 3D structures. That level of accuracy makes ALD a critical technology for advanced semiconductor manufacturing, flexible electronics, and materials research.
-
product
Inclined Surface Coefficient Of Friction
DRK138
Shandong Drick Instruments Co., Ltd.
DRK138 Inclined Surface Coefficient Of Friction Tester is applied to testing the COF of film, paper, card board, sheet and so on. By testing the material’s frictional properties, the open performance of packages, packaging speed of packers and other indexes could be controlled to meet the requirements for production
-
product
Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
-
product
10-GHz Split Cylinder Resonator
85072A
The Keysight 85072A 10-GHz split cylinder resonator measures permittivity and loss tangent of thin film, un-clad substrates and low loss sheet materials according to the IPC TM-650 2.5.5.13 test method. Designed for robustness and ease of use, it features precision cylinders to ensure high Q factor and loss tangent resolution. Compatible with the Keysight 85071E-300 materials measurement software, the 85072A and can be purchased separately or as part of a complete turn-key solution.
-
product
Transmission Meters
Shenzhen Linshang Technology Co., Ltd.
As a leading window film transmission meter (window tint meter) manufacturer, Linshang Technology provides a variety of window film meters to measure transmission rate, rejection rate, SHGC for materials such as automotive film, thermal insulation film, architectural film, thermal insulation glass, etc. There are mainly portable solar film transmission meters LS160 series, LS162 series, LS163 series, desktop demonstration window tint meters LS101, LS180, LS181, L182, split transmission meters LS110A, LS110H. Whether you want to measure UV or IR rejection (940nm, 1400nm) or visible light transmittance, you can find a suitable window film meter here.
-
product
Programmable Step Attenuator, DC to 26.5 GHz, 0 to 11 dB, 1 dB steps
84904K
The Keysight 84904K programmable step attenuator offers coaxial measurements to 26.5 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and attenuator range of 0 to 11 dB in 1-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with less than 2 dB of loss at 26.5 GHz. The compact size of the unit, 35% smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
-
product
Passive and Active Resistor Trimming for Thick and Thin Film
LRT 2000L
*Travel: 6" x 6"*Laser : Fiber Laser Ytterbium 1064 nm*Kerf: 30 to 80 micron Adjustable*Pulse width : 80 nano second*Rap Rate: 1 to 1 million Pulse Per Second*Average Power: 20 watts*Target: Electric crosshair on monitor
-
product
Power Amplifiers
Power amplifiers are designed and manufactured by utilizing the most advanced PHEMT or MMIC devices, thin film technologies, and an improved DC power supply to deliver a high output power with superior power added efficiency (PAE) and high linearity. While standard models focus on general purpose applications, additional models with differing frequency ranges, gains and power levels are listed on the website. Custom designs are also offered to meet any user’s specific needs.
-
product
Programmable Step Attenuator, DC to 26.5 GHz, 0 to 70 dB, 10 dB steps
84907K
The Keysight 84907K programmable step attenuator offers coaxial measurements to 26.5 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 70 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with less than 2 dB of loss at 26.5 GHz. The compact size of the unit, 35 percent smaller than the Keysight 8495/7 26.5 GHz) family, allows for easy integration into instruments and ATE systems.
-
product
3 Ports FWDM（1310/1490/1550nm）
Flyin Optronics' Micro-Optical WDM utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging. It provides low insertion loss, high channel isolation, low temperature sensitivity and epoxy free optical path.
-
product
Resistance Temperature Detectors (RTD) Simulators
Simulation of resistance based temperature sensors such as positive or negative temperature coefficient thermistors. Resistance Temperature Detectors (RTDs) can be wire-wound or thin film. Our RTD simulator modules provide a cost-effective method of simulating both PT100 and PT1000 RTD sensor types that require fine setting resolution.
-
product
Long Edge Wet Film Combs (Stainless Steel)
3238
Each comb has 24 measurement steps (teeth) providing a more accurate wet film thickness value.
-
product
Portable Dew point Analyzer
GEN-25
Shanghai ChangAi Electronic Science & Technology Co.,Ltd
GEN-25 dew point analyzer is a kind high-performance intelligent moisture tester, which is developed by film capacitive ceramic dew point sensor combine with latest micro computer technology. It is used to measure the moisture content in various gases.
-
product
Software
TFT Test Systems
Materials Development Corporation
Model CSM/Win-TFT TEST SYSTEMS allows electrical measurements of thin film transistors (TFT's) used in flat panel displays (FPD's). MDC TFT TEST SYSTEMS can quickly and efficiently measure critical transistor parameters without the need for expensive parametric testers. Various model TFT TEST SYSTEMS are available for testing both linear and saturation characteristics to find parameters like ION, IOFF, mobility, and threshold voltage.
-
product
Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
-
product
Ozone Generators & Systems
MKS offers a wide range of ozone generators and modular delivery systems which produce ultra-pure, reliable ozone gas. In the clean semiconductor environment, Ozone reacts with a wide range of precursor gases resulting in the creation of Al2O3, ZrO2, HfO2, and La2O3 metal oxides to enable thin film deposition processes like Atomic Layer Deposition (ALD) and Etch (ALE). MKS’ generator uses Grade 6 gas, enabling the creation of higher film density improving product yield. Photovoltaic and Display manufacturing leverage semiconductor best practices and utilize ozone to create enhanced thin film barriers, improving product performance and reliability.
-
product
100GHz DWDM Optical Add/Drop Multiplexer (CATV Overlay Multiplexer)
OADM-1001-VOA (100GHz)
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai OADM-1001-VOA is an optical Add-Drop multiplexer with 100GHz channel interval. It is based on mature thin film filter technology, sealed with metal shell, and featured with low insertion loss, high isolation, wide channel and flexible configuration. It is the ideal device to Add(insertion Add)/Drop(Tape-out Drop) a specific wavelength(OADM) in optical fiber DWDM system. OADM-1001-VOA configures a manual-adjust optical attenuation, for adjust the equilibrium the optical power between insert channel and main signal channel, which is conveniently used for VOD overlay in CATV system.
-
product
Programmable Step Attenuator, DC to 40 GHz, 0 to 90 dB, 10 dB Steps
84906L
The Keysight 84906L programmable step attenuator offers coaxial measurements to 40 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life greater than 5 million switching cycles per section) and an attenuation range of 0 to 90 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with with only 2.4 dB of loss at 40 GHz. The compact size of the unit, 35% smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
-
product
Flexible Packaging Testing Service
Guangzhou Biaoji Packaging Equipment Co., Ltd.
Flexible Packaging Testing Service mainly included OTR barrier test service,WVTR Testing Service, COF Coefficient of Friction test, lamination bond strength, material analysis, physical properties, tear strength , tensile strength, puncture, slip, blocking, scuffing, film thickness variation etc.
-
product
Compact Passive and Active Resistor Trimming for Thick and Thin Film
LRT 2000C
*Travel: 6" x 6"*Laser : Fiber Laser Ytterbium 1064 nm*Kerf: 30 to 80 micron Adjustable*Pulse width : 80 nano second*Rap Rate: 1 to 1 million Pulse Per Second*Average Power: 20 watts
-
product
1550/1310~1490nm Wavelength Division Multiplexer
PON-WDM-1543
Hangzhou Huatai Optic Tech. Co., Ltd.
PON-WDM-1543 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
-
product
Ellipsometer
alpha-SE®
For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press "measure". You have results within seconds. Works with your materials - dielectrics, semiconductors, organics, and more.
-
product
Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
-
product
High Voltage Film Capacitors (Axial Leads)
STVHF/STVHE-A
For High Pulse / High Energy Discharge applications with low discharge repetition rate, please tell more about your application. We might have a suggestion.
-
product
Falling Dart Impact Tester
DRK135A
Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
-
product
Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
-
product
Adhesion Testers
Adhesion testing is the best way to determine whether your films and coatings adhere to substrates the way you need them to.
-
product
Transducer / Transmitter
General purpose industrial pressure transducer provides outstanding integrity concerning high shock, vibration and pressure cycling. Utilizing high-performance ASIC, digital compensation provides excellent temperature performance, while the thin film sensor enables long-term stability.
-
product
Spectroradiometer
SpectraScan® PR-655
The SpectraScan® Spectroradiometer PR-655 is JADAK’s economical portable solution for spectral based photometric and colorimetric light measurements, designed for applications requiring precise light measurements from a range of light sources, such as display monitors and projectors, reflective surfaces, and industrial applications (visual display testing, LED testing, film and video post-production, auto/aerospace displays, and dental color testing).
-
product
Mechanical Tester
NANOVEA Mechanical Tester is the most versatile nanoindenter and scratch tester capable of precisely measuring the micro- to nanomechanical properties of wide ranges of materials from thin films, coatings, ceramics and composites to polymers and bio materials via Indentation, Scratch and Friction testing. All NANOVEA Mechanical Tester models come with true feedback load control from independent load and depth sensors that provide unmatched accuracy and the highest repeatability available on the market. This technology allows a user to perform Nanoindentation and Microindentation for Hardness and Elastic Modulus Testing, Stress vs Strain Analysis, Creep and Relaxation, Loss and Storage Modulus, Yield Strength and Fatigue, Fracture Toughness and Nano-scratch & Micro-scratch for Scratch Hardness Testing, Multi-pass Wear Test, Cohesive and Adhesive Failure Testing as well as Coefficient of Friction testing, all available on one system.
