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Product
PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-03
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PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Thermal Analysis
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The TORC (Thermo-optical Oscillating Refraction Characterization) technique applies decades of know-how in optical instrumentation to thermal analysis in a novel and unique way. The technique requires minimal sample preparation at maximal tolerance for sample properties. You can determine the coefficient of thermal expansion, glass and phase transitions as well as polymerization for various samples: liquids, gels, pastes, and certain solids. For example: cured and uncured resins, adhesives, glues, etc. can easily be characterized. Both thermal and time-dependent processes can be monitored with minimal effort.
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Product
Penetrometerand Texture Analyzer
MDT Series
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Mohr Digi-Test (MDT) Series instruments are portable materials testers designed to accurately characterize the texture and firmness of fruit, vegetables, and other agricultural produce in the field, packing house, and the laboratory.
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Product
Broadband VNA Operation To 170 GHz
S93300B
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Configure a 170 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs.
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Product
Computery Control Torsion Tester
SG-L10
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The machine is mainly used for torsion test of metal and nonmetal,also it is applicable to the torsion test of parts and members. Servo-motor and cycloid gear reducer are introduced to the loading system in this product, the system for measuring torque and distortion angle are composed of high accurate torsion sensor, photoelectric encoder and computer measuring force.It possesses automatically tracking test torque and distortion angle, maintaining maximum peak load and displaying loading speed.Test data automatically display and process, print the test report according with the national criterions, including test date, number, material quality and torsion strength etc. The machine characterizes advanced technology, high accuracy, good stability, reliable quality and easy to operate, and it is necessary test instrument for aeronautics & astronautics, construction material, traffic, wire & cable, science research departm ent and universities.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784777-02
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PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Product
FMC Loopback Test Board
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The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.
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Product
RF Coaxial Probes & Probe Positioner
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Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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Product
Phase Noise Analyzer and VCO Tester
FSPN
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The R&S®FSPN phase noise analyzer and VCO tester is designed to provide both very high sensitivity and measurement speed for production and design engineers working in these fields characterizing sources such as synthesizers, VCOs, OCXOs, and DROs. It is the ideal instrument for demanding development and production phase noise and VCO analysis.
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Product
Bit Error Ratio Testers
M8000 Series
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Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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Product
Frequency-Resolved Optical Gating Pulse Analyzer
IQFROG
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The IQFROG measures pulse intensity and phase in both spectral and temporal domains, yielding a complete pulse characterization. With its long delay arm and high resolution spectrometer, it measures chirped pulses up to 50 ps wide, or up to 10 ps wide if the pulse is transform limited. The IQFROG is available in 1.0 and 1.5 micron wavelengths.
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Product
WavePulser 40iX High-speed Interconnect Analyzer
WavePulser 40iX Series
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WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects.
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Product
Thermal Characterization Testing Services
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Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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Product
Vector Network Analyzers
ZNA
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The R&S®ZNA vector network analyzers are the high-end series of the R&S VNA portfolio: excellent RF-performance is combined with a wide range of software features and a unique hardware concept. The touch-only operation together with the DUT-centric approach makes the R&S®ZNA to a powerful, universal and compact measurement system for characterizing both, passive and active devices.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-02
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Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
Static and dynamic analysis
MEMS
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Static and dynamic analysis and visualization are critical parts of the test and development process for MEMS microstructures in order to characterize surface metrology and measure in and out of plane motions. The PS4L Adaptive Architecture is ideal for configuring a system to perform tests to very specialized requirements of the MEMS customer. MEMS customers often require vacuum probing, which is available in semiautomatic and fully automatic configurations.
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Product
Surface Plasmon Resonance Analysis
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Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Product
Modulation Distortion Up To And Beyond 125 GHz
S930713B
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S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Optically Isolated Measurement System
IsoVu
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IsoVu offers complete galvanic isolation and is the industry’s first measurement solution capable of accurately resolving high bandwidth, low voltage differential signals in the presence of large common mode voltages. The stand out feature of IsoVu™ is its best in class common mode rejection across the entire bandwidth. Accurate differential measurements rely on a measurement system’s bandwidth, rise time, common mode voltage, common mode rejection capability, and the ability to connect to smaller test points to characterize devices that are shrinking in size and increasing in performance. Despite these requirements, advancements in test and measurement for power testing, EMI testing, ESD testing, and remote measurement capability have been minimal at best and have not kept pace with changing requirements. While differential voltage probes have had modest performance gains in regard to bandwidth, these probes have failed to make any substantial improvements in regard to common mode rejection, and connectivity. IsoVu is a leap forward in technology and is the only solution with the required combination of high bandwidth, high common mode voltage, and high common mode rejection to enable these differential measurements.
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Product
RF Analog Signal Generators
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The right solution for your requirements from the broad analog signal generator portfolio of Rohde & Schwarz.With the analog signal generator portfolio we cover the wide range of RF, microwave and mmWave frequencies.Our selection of analog signal generators is characterized by the outstanding signal purity and performance as well as their functionality of the solutions; whether in the high end or midrange area.The solutions benefit industries such as RF semiconductor, wireless communications, aerospace and defense, and also covers tasks featuring development, production and service, and more.
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Product
DisplayPort 2.0 Receiver Test
N5991DP2A
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Use the Keysight N5991DP2A DisplayPort 2.0 Receiver Test Software to test, debug and characterize your DisplayPort Sink products maximizing the usage of your test instruments.
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Product
Syscal Pro
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The Syscal Pro is an all-in-one multinode resistivity and induce polarization sounding and profiling system for environmental and engineering geophysical studies. The Syscal Pro gathers a 10 channels receiver and a 250 W internal transmitter which make it the more powerful system of the Syscal range. Compact, easy-to-use and field proof, the Syscal Pro measures both resistivity and chargeability. It is ideal for environmental and civil engineering applications such as depth-to-rock determination, weathered bedrock mapping. With a maximal output voltage of 2000Vpp, the Syscal Pro is very adapted to detect deep fault in fractured aquifers or to characterize the depths and thickness of the groundwater aquifers.
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Product
The CryoLab
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The CryoLab is designed to perform rapid material or circuit characterization measurements from room temperature down to cryogenics in a fully automated manner. Doing measurements doesn’t require any experience or know-how on cryogenics, vacuum technology or thermodynamics from the user.
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Product
Dynamic Imaging Particle Analysis Technology
FlowCam® Macro
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Yokogawa Fluid Imaging Technologies, Inc.
Based on proven FlowCam dynamic imaging particle analysis technology, and optimized for larger particles (50μm to 5mm), FlowCam Macro provides rapid particle characterization that goes beyond just particle size. Direct, image-based measurements of particle size and shape enable differentiation of particle types in a heterogeneous mixture.
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Product
Birefringence Measurement Technology
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Hinds Instruments Birefringence Measurement technology has been adopted by industry leaders world wide to measure birefringence and characterize stress birefringence in materials with unsurpassed accuracy, resolution and repeatability. Capable of measuring optical retardation at 0.001nm resolution with noise floors as low as 0.005nm, these systems are robust, dynamic and scalable to fit the demanding requirements of your application. We provide measurement systems across the light spectrum (DUV, VIS and NIR) and are able to measure virtually all optical materials.
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Product
Transmission Line Pulse Testing
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Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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Product
Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
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EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Product
Magnet Testing
m-axis
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m-axis is a measurement system that can be used to characterize permanent magnets in terms of their magnetic specifications (magnetic moment and magnetization angle) with high precision. In addition to the four standard measuring ranges, the modular design allows the system to be adapted to customer-specific requirements. The measurement systems can be used for 100% in-line quality control via our m-axis I/O module.
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Product
Oil-in-Water Analyzer
HR25K
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
