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Product
Subsea Oil-In-Water Analyzer
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Product
Laser Scanning Systems
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QFP markets manually handled and optically tracked 3D laser scanners that set new standards in the metrology measurement industry. The products are characterized by exceptional performance, ease of use and cost-effectiveness and are the perfect solution for the metrology room as well as for the production line, stand-alone or automated.
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Product
XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Product
PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
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PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Product
ADQ Development Kit for Custom Firmware in the FPGA of an ADQ-Series Digitizer
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The ADQ Development Kit is a tool for developing custom firmware in the FPGA of an ADQ-series digitizer. SP Devices’ digitizers are characterized by a combination of high speed and high resolution.The amount of data from the digitizer is thus very high. The most efficient way of processing the data is through a real-time implementation inside the FPGA on the digitizer. The ADQ Development Kit opens the FPGA for the implementation of real-time signal processing algorithms.The ADQ Development Kit is available for all digitizer models.
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Product
PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
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The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
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Product
Spray Particle Size Analyzer
Spraytec
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Malvern Panalytical's Spraytec laser diffraction system allows measurement of spray particle and spray droplet size distributions in real-time for more efficient product development of sprays and aerosols. It has been specifically designed to address the unique requirements for spray characterization and deliver robust, reproducible droplet size data.
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Product
Surface Analysis
Innova-IRIS
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This provides researchers a perfect combination of chemical or crystallographic information at high spatial and spectral resolution with the most advanced atomic force microscopy characterization. The Innova-IRIS can be integrated with your choice of a leading Raman system to provide the best opaque sample TERS investigations available today. However you tailor your system, your application will benefit from Bruker exclusive, high-contrast IRIS TERS probes and the best tip preservation and lowest drift, guaranteeing that alignment is preserved even over the optical integration times necessary to interrogate weak Raman scatterers.
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Product
Signal Injectors
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Ideal high performance, low noise compliment to your Circuit Sleuth Frequency Response Analyzer. An injection transformer is used to couple an excitation signal from a frequency source into the feedback loop of a control system. This allows loop gain and phase vs. frequency to be measured, with the loop closed, thus characterizing the stability of the system.
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Product
Instruments
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Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Product
Current-Voltage Measurement System
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The SSIVT is an electrical current-voltage measurement system used to characterize photovoltaic cell performance. This current-voltage tester works by sampling various current versus voltage combinations of the photovoltaic cell with a variable impedence load. The performance of the photovoltaic cell is determined by measuring this output I-V relationship while it is being illuminated.
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Product
PXI/PXIe Arbitrary Generators
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The arbitrary waveform generators of the PXA72xx family are characterized by a resolution of 16 bits with a maximum sample rate of 200 MS per second. The devices can also be used to directly output voltages of up to 30 V (or ±15 V).
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Product
Modulation Distortion Up To 70 GHz
S930707B
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S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
18-Wavelength CWDM OTDR
FTB-740C-CWDM
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Single OTDR unit that covers all 18 CWDM ITU channels for testing through MUX/DEMUX channels, providing a complete end-to-end link characterization or troubleshooting for commercial services, C-RAN networks and metro Ethernet deployments.
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Product
LXI Microwave Matrix, 10GHz, Single 4x4
60-750-144
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The 60-750-144 is a single 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Optical Multiport Power Meter
N7745C
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Keysight's popular N7745A optical power meters with eight power-sensor channels provide increased throughput and operational efficiency to meet today's challenges in manufacturing. Designed for characterizing optical multiport components, these optical power meters offer industry-leading solutions for device connectivity, high-speed measurement data acquisition and fast data transfer for post-processing. The multiport power meter enables fast measurement solutions for all multiport devices; for example multiplexers, PON splitters, wavelength selective switches (WSS) and ROADMs, as well as compact setups for simultaneous testing of multiple single-port devices.
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Product
NED-LMD Near-Eye Display Measurement Systems
NED-LMD W-Series
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The world’s first wide field of view near-eye display light measurement device coupled with an integrated precision spectroradiometer that ensures single snapshot, high speed, high spectral accuracy characterization of AR, VR, MR and Heads-Up Displays. The benchtop instrument features a large 158deg field of view, motorized focus lens and a small 5mm entrance pupil to emulate the human eye. Its robust design and easy-to-use software with automated Device-Under-Test (DUT) Pass/Fail analysis allow it to be easily integrated on production lines.
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Product
Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
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When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Product
PathWave BenchVue Advanced Power Control And Analysis
BV9201B
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The BenchVue Advanced power control app helps characterize voltage and current measurements and generate arbitrary waveforms for single instrument support.
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
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The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Product
PXI Network Analyzers
M983xA Series
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Keysight’s M983xA PXIe vector network analyzer (VNA) combines all your measurements into a single instrument, enabling multisite, multi-DUT, multiport system characterization with faster speeds and greater flexibility.
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Product
C-SGN Emulator
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The C-SGN Emulator combines the MME, SGW, and PGW functions, simulating the optimized EPC network required for CIoT. As part of the NetTest suite, the C-SGN Emulator creates an end-to-end lab environment for testing functions and features that characterize enhanced Machine Type Communication (eMTC) and Narrow Band Internet of Things (NB-IoT) implementations. In order to reduce complexity in the setup of a test environment, it also supports simulation of SMS Central Function (SMS-SC) and the Service Capability Exposure Functions (SCEF).
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Product
Static Image Analysis System Particle Size
PSA300
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The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Product
SAM Premium Line
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PVA TePla Analytical Systems GmbH
The SAM Premium Line combines acoustic microscopy and optical microscopy. It enables the scanner to be combined with both an inversion as well as a reflected-light microscope. The technology used in the SAM Premium Line is based on a core platform that employs the latest production and research technology. The individual systems are characterized by high throughput, high flexibility and a wide scanning range. They can be expanded to suit customer requirements and specified for the most diverse applications.
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Product
Scatterometers / Thin Film Metrology Systems
OptiPrime Series
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The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Product
Thermal Warpage and Strain Measurement Tool
PS200S
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The TherMoir PS200S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement forsamples up to 150 mm x 200 mm. With time-temperature profiling capability, the TherMoir PS200S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Pulsed and CW lasers, 375 – 1700 nm, 1 kHz measurement rate
871 Series
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The 871 Laser Wavelength Meter from Bristol Instruments is the best way to measure the absolute wavelength of both pulsed and CW lasers and OPOs. By combining proven Fizeau etalon technology with automatic calibration, the reliable accuracy needed for the most meaningful experimental results is ensured. What’s more, a sustained measurement rate of 1 kHz enables the wavelength characterization of every single pulse for most lasers. And, the resulting time resolution of 1 ms provides the most detailed analysis of tunable lasers.
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Product
BTA Analyzer
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The new BreakThrough Analyzer (BTA) is a flexible gas delivery and management system for the precise characterization of adsorbent performance under process-relevant conditions. It delivers reliable adsorption data for gas/vapor mixtures using a flow-through system.
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Product
Static Multiple Light Scattering (SMLS)
TURBISCAN
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Static Multiple Light Scattering (SMLS) is an optical method that allows for the direct characterization of native concentrated liquid dispersions. Microtrac’s TURBISCAN range uses this technology to provide accurate and rapid results. TURBISCAN was the first patented technology to provide tools that allow accelerated aging tests on unstressed products, thus becoming a reference for direct stability characterization technology.
