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Product
LXI Microwave Matrix, 10GHz, Dual 4x4, Terminated With Loop-Thru
60-750-244-C
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The 60-750-244-C is a dual 4x4 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
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The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783127-02
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PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131H
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The Keysight 85131H is a 62.2 cm (24.5 in) long1 flexible cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.25 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.5 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 3 inch radius. Stability1 of the Keysight 85131H is less than 0.12 dB and phase is 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
ENA Vector Network Analyzer
E5071C
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9 kHz to 4.5/6.5/8.5/14/20 GHz2- or 4-port, 50 ohm, S-parameter test set Improve accuracy, yield and margins with wide dynamic range 130 dB, fast measurement speed 8 ms and excellent temperature stability 0.005 dB/CObtain design confidence through complete characterization of high-speed serial interconnects with enhanced time domain analysis option Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
PXIe-5652, 6.6 GHz RF Analog Signal Generator
781217-01
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PXIe, 6.6 GHz, PXI RF Analog Signal Generator—The PXIe‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
MXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5181B
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Take your devices & designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading output powerThoroughly test receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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Product
Acoustic Microscope
AMI D9650
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Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Product
4-Channel Simultaneous Sampling Module for DAQ970A and DAQ973A
DAQM909A
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The Keysight DAQM909A module enables the DAQ970A and DAQ973A Data Acquisition System to perform dynamic data acquisition for applications such as harmonic and noise distortion, power analysis, and acoustic characterization of electromechanical devices.
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Product
NanoSpectralyzer
NS2
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NS2 is the world's only three-in-one spectrometer for carbon nanotubes. The NS2 provides all of model NS1's state-of-the-art capabilities for analyzing SWCNT samples through near-IR fluorescence and absorption. In addition, the NS2 captures Raman spectra of all CNTs, whether single-walled, multi-walled aggregated, large diameter, or chemically altered. All spectra are automatically measured with a single placement of the sample cuvette. Sophisticated software then performs integrated data analysis to characterize the CNT sample.
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Product
FT-NIR Analyzer
ASP400 series
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The TALYS ASP400 series analyzer is designed to achieve monitoring and control of continuous processes. Its seamless installation enables real-time process monitoring, determination of stream properties or physical qualities, process characterization and early troubleshooting. This analyzer is suitable for a wide range of refinery process monitoring applications including naphtha conversion units such as catalytic reforming, isomerization, naphtha hydro-treating and steam-cracking as well as applications in HF alkylation, gasoline blending and LPG.
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
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PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
HDT & Vicat Systems
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The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
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Product
802.11ad & ay (WiGig) Test System
IQgig-IF
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When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Product
Transceiver Driver
S-112
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Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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Product
High Voltage Optically Isolated Probe, 700 MHz Bandwidth. Includes soft-carrying case.
DL07-ISO
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The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Product
Thick Film Passive Element
GBR-183
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GBR-183 series resistors are made in a thick film technology, on ceramic substrates(Al2O3 -96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-183 series elements are used both for general, and professional applications.
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Product
Photonics Test Solutions
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Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Product
Reverberation Chambers
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Over the past several decades, RCs have been enjoying growing popularity as a promising facility for the characterization of wireless devices and for EMC testing. The RC (Reverberation Chamber) measurement method exhibits much competitive superiority over the AC (Anechoic Chamber) method and TEM Cell method, such as low cost, enhanced test repeatability, a more realistic test environment, and easily achieved high-field environment. The application of the RC for performing EMC testing was first proposed by H. A. Mendes in 1968. In the recent IEC 61000-4-21 standard, the importance of EMC testing using RCs as an alternative measurement technique has been recognized.
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Product
Laser Test Systems
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Santa Barbara Infrared, Inc. offers an extensive family of test systems and components that test and characterize the performance of laser range finders, designators, illuminators and spot trackers.
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Product
WiGig RF Tester
IQgig-RF Model B
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When used in conjunction with IQgig-IF, an optimized test solution for conducted testing of WiGig chipsets and baseband modules, the IQgig family products provide a total test solution for R&D characterization and high volume manufacturing.
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Product
Secondary Ion Mass Spectrometry (SIMS Analysis)
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Rocky Mountain Laboratories, Inc.
Secondary ion mass spectroscopy is operated either in the dynamic mode (DSIMS) or the static mode (SSIMS). DSIMS is useful for profiling impurity and trace elements through films and interfaces. SSIMS is useful for characterizing polymeric materials and only measures the outermost molecular layer of a specimen.
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Product
Deep Access RF Probes
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GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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Product
Semiconductor Device Parameter Analyzer and Measurement Modules
B1500A Series
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Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Parameter & Device Analyzers, Curve Tracer
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Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Series provides a wide selection of IV analyzers suitable to your specific measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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Product
Nand Flash Tester
NplusT
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NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Product
Variable Angle Spectroscopic Ellipsometer
VUV-VASE
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The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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Product
Infiniium UXR-Series Oscilloscope: 33 GHz, 4 Channels
UXR0334A
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The UXR0334A is the 33 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope, that offers 10-bit high-definition ADC, 20 femtoseconds (typical) of intrinsic jitter for exceptional jitter characterization.
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Product
Benchtop Research System
The XENON X-1100
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The XENON X-1100 is the only low-cost benchtop Pulsed Light system that enables researchers to more easily characterize new processes using XENON’s proven technology.
