Stimulus
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Product
True-Mode Stimulus
S97460B
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S97460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port P50xxA vector network analyzer configurations.
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Product
Stimulus Test Cell
HA7200
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The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Product
True-Mode Stimulus
S93460B
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The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
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Product
DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
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Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Product
True-Mode Stimulus
S95460B
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S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Product
LASAR Post Processor, Run Time And Diagnostic Test Solution
DtifEasy Series
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DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
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Product
ICAP/4 Consumer
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Looking to build electronic circuitry and watch its operation right on your computer? ICAP/4 Consumer is an easy to use program that does exactly that. ICAP/4 Consumer enables you to quickly construct any type of analog, digital or mixed analog-digital design, apply electrical stimulus, and view signal waveforms throughout the design.
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Product
Modulation Distortion Up To 90 GHz
S930709B
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S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
PCI D/S, S/D, I/O & Comm Board
76CS3
Multifunction I/O
NAI’s 76CS3 is a PCI/PCIe multifunction I/O and communication board designed for applications requiring Digital-to-Synchro/Resolver (D/S) and Digital-to-LVDT/RVDT (DLV) stimulus output, as well as I/O and communication functions. This full-slot board contains five independent, function module slots. The board can be configured for 6 separate D/S channels, or for D/S in combination with I/O and communication modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Product
RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
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The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Product
Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
High Speed Digital Analog
ITA
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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Product
USB Controlled Multi-Function DAQ For ATE Education And ATEasy Training
GT98901 Series
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The GT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all of which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol. Power for the board is provided via the USB interface, providing a totally self-contained assembly which can provide users with a simple yet complete vehicle that replicates many of the stimulus and measurement functions associated with ATE systems. When combined with Marvin Test Solutions' ATEasy® Test Executive and Test Development environment, the GT98901 is the ideal product for creating and supporting ATE training and education applications.
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Product
Modular Power
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AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, programmable power module system providing DC, AC and electronic load assets all under control of a single controller. ReFlex Power™ (RFP™) provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test.
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Product
DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
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The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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Product
Digital Wideband Transceiver Analysis
S94610B
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Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
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Product
Bus Analyzer / Exerciser
PCF850
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The PCF850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Product
Nodal Impedance Analyser
QT-Hi1
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Qmax Test Technologies Pvt. Ltd.
QT-Hi1 is an innovative Nodal Impedance Analyzer, which uses the industry’s proven V-I trace techniques of learn and compare of nodal impedances which are represented as VI Curves. It uses innovative Auto Best Curve fit technique an intelligent software alogorithm which enables automatic selection of the best fit value of Voltage, Source Impedance and Frequency of the stimulus waveform. The compact size with re-chargeable battery makes it an ideal companion for on-field applications. The wide 8” touch screen graphical display makes this tool more valuable in test and repair industry at all times.
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Product
Audio Test Software
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1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
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Product
MEMS Inertial Test
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Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Product
Modulation Distortion Up To 8.5 GHz
S930700B
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S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
RF-Ready DC Fixture
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The RF-Ready DC fixture provides space for mounting RF input and output matching circuits. Hence, it is possible to tune up the assembly at a remote test station, such as a network analyzer, to peak performance and then run the life test with DC stimulus. The matching structures also allow incorporation of more complex stabilization structures.
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Product
Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Product
VXI Precision PLL Waveform Synthesizer
3152B
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The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
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Product
Battery Analyzers
BA6010 Series
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The BA6010 Series battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. The BA6010 Series is suitable for characterizing battery chemistries that are responsive to a 1 kHz AC stimulus signal including lead acid, lithium and alkaline type batteries used in consumer products, electric vehicles, power backup, security, and fire alarm systems.
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Product
PMC and PMC-X Bus Analyzer / Exerciser
PMC850
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The PMC850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Product
Wide FOV Target Projector
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The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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Product
CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Signal Analyzer
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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Product
PMC Bus Analyzer / Exerciser
PMC650
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The PMC650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
