Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
-
Product
Motorized Force Test System
MT Series
-
In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
-
Product
Binocular Stereo Zoom Microscope Systems
-
Our ELZ Series is not only a great choice for an entry level binocular microscope, but it’s cost effective and compact, as well as have a zoom range of 3.5x – 120x with options and a FOV of 67mm – 6mm with options. Our SSZ-II Series, which is a user friendly stereo zoom microscope, has a zoom range of 2x – 180x with options and a FOV of 109mm – 1.3mm with options.
-
Product
Digital Force Gauge
-
Guangzhou Amittari Instruments Co.Ltd
The digital force gauge is a kind of simple and convenient multi-functional instrument for high-accuracy push force and pull force test. It is widely used in electronics, building hardware, textile, auto parts, ignition device such as lighter, fire fighting equipment, pen manufacturing, lock manufacturing, fishing gear, chemical, power machinery, scientific research institutions and other industries. For the push and pull load test, plug and unplug force test and destructive test etc.
-
Product
Force Tensiometer
K20
-
Our Force Tensiometer – K20 is a robust, semi-automatic instrument for the precise measurement of surface tension and interfacial tension. Using the ring and plate method as the main tensiometric methods, it produces reliable measurements for the routine quality assurance of your surfactant solutions and interfacial processes.
-
Product
NanoFluorescence Microscope
NFM
-
The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
-
Product
Semiconductor Wafer Microscope Inspection System
MicroINSPECT
-
MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
-
Product
Force Sensors And Strain Sensors
-
Force and strain measurement in machines, installations, and tools.
-
Product
Upright Microscope Systems
-
Below you can see examples of an upright microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications.
-
Product
Scanning Near Field Optical Microscope
SNOM
-
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
-
Product
Wafer Cathodoluminescence Microscope
Säntis 300
-
Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
-
Product
Force and Material Testing
-
Starrett Force and Material test solutions range from simple hand-held measurements to highly advanced applications with extreme accuracy.
-
Product
Raman Spectrometer - Confocal Raman Microscope
XploRA™ PLUS
-
Incorporating unique and powerful functions in a reliable, high performance system, ideally suited to the research and analytical lab, the XploRA PLUS is our best multi-sample, multi-user Raman microscope ever.It is fully confocal, not compromising image quality, spatial or depth resolution. The SWIFT Fast Raman images are the fastest fully confocal Raman images available, typically 10x faster than conventional Raman imaging.
-
Product
3-Component Quartz Force Rings
260 Series
-
Three-component quartz force ring sensors are capable of simultaneously measuring dynamic force in three orthogonal directions (X, Y, and Z). They contain three sets of quartz plates that are stacked in a preloaded arrangement. Each set responds to the vector component of an applied force acting along its sensitive axis. 3-component ring force sensors must be statically preloaded for optimum performance. Preloading provides the sensing elements with the compressive loading required to allow the proper transmission of shear forces. Versions are available with ranges up to 10k lb (45k N) in the z-axis (perpendicular to the top surface), and up to 4000 lb (18k N) in the x-and y (shear) axes. Both ICP® and charge output styles are available.
-
Product
Peel Back Force Tester
PBFT
-
Precisely measure the peel back force of carrier tape to verify your packaging systems are within specification. Results can be printed and stored with the outgoing product.
-
Product
Acoustic Microscope
AMI D9650Z
-
The D9650Z incorporates the latest C-SAM technology with enhanced features to accommodate the testing of Power Modules as well as performing standard C-SAM operations. This new system configuration is optimized for inspection of heatsink bond integrity, thickness of bond layer and wire bond welds. Powered by our Sonolytics software platform with PolyGate technology, the D9650Z is ideal for failure analysis, process development and QC screening in low-volume production environments.
-
Product
Force Gauge
-
Shenzhen Graigar Technology Co.,Ltd.
A force gauge is a small measuring instrument used across all industries to measure the force during a push or pull test. Applications exist in research and development, laboratory, quality, production and field environment.
-
Product
ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
-
The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
-
Product
Digital Microscope Camera
-
Providing you the best range of digi eye 510 microscope camera, digital microscope camera, digi eye 510c microscope camera, digi eye 210 digital microscope camera, digi eye 510c digital tablet and digi 4k microscope camera with effective & timely delivery.
-
Product
Automated Multispectral Microscop
VideometerMic
-
The VideometerMic is an automated multispectral microscope incorporating a multispectral scanner head mounted in an xyz-stage for auto-focusing and scanning of samples of size up to 30 mm x 30 mm.
-
Product
Video Stereo Microscope
BVM-20105
-
High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; simple operation, reducing user's fatigue and injury.
-
Product
Scanning Electron Microscopes
SEM
-
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
-
Product
Microscope Software
-
Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
-
Product
ForceTest Force Measuring Software
-
AMETEK Sensors, Test & Calibration
The ForceTest software interfaces directly with your digital force gauge enabling you to automatically capture tests and graphs on a personal computer. Test results and graph can be monitored directly on the live screen in real time while the test is being performed.
-
Product
Digital Microscope
-
A variation of a traditional optical microscope in which a digital/microscope camera is connected, and image output is displayed on a screen and/or monitor. Most models include software and a computer for use.
-
Product
Full Bridge Thin Beam Force Sensors
TBS SERIES
-
The TBS Series thin beam force sensors many different parameters found in medical instrumentation, home appliances, process control, robotics, and automotive are exceptionally suited for small load measurements. They are designed to measure and many other high volume applications. A specially developed integrated strain gage includes all balancing, compensating and conductive elements and is laminated to the beam to provide excellent stability and reliability.
-
Product
Stereo and Zoom Microscopes
-
Generate three-dimensional and laterally precise images. With Stereo Microscope you observe large samples such as leafs and tissues or inspect rough material surfaces. Upgrade your microscope flexibly with different digital cameras and benefit from various types of illumination techniques.
-
Product
High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
-
Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
-
Product
Electron Microscope Sample Preparation
-
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
-
Product
Infrared Microscope
DDR200/300 NIR
-
The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
-
Product
Sapphire 3D Microscope
WDI-2000
-
The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
