Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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Force Logger Sensor
NUL-211
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This sensor can measure the mass to weightrelationship and study how different pulleysystems affect the effort needed to lift weights.It can also be used to measure push/pull forcesand impacts. There is a hook at the bottom of the force sensor that can be connected to various pulling loads.
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Weld Force Gauges
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This system is ideal for field measurement and data logging of forces between the tips of resistance spot welders.
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Product
Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Motorized Force Test System
MT Series
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In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
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Ultraviolet Microscope
UVM-1
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The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, color and NIR imaging and visualization. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.
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Force Gauges
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SHIMPO offers a range of digital and mechanical force gauges to suite every application from low capacities (0.5 lbs) to high capacities (1,000 lbs). Our gauge's features range from simple, no output models to highly sophisticated units that provide memory, statistics and data output. Our gauges are known for their strong construction and highly accurate measurements.
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Inspection Microscope
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This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
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Product
Closing Force Meter
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Maschinenbau Haldenwang GmbH & Co. KG.
Is used to conveniently and reliably determine the closing force of externally operated service doors and locking devices.
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Product
Microscopic Four-Point Probes
M4PP
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CAPRES M4PP Microscopic Four-Point Probes have an electrode pitch three orders of magnitude smaller than conventional four-point probes, and are fabricated using silicon micro-fabrication technology.
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Product
Force Displacement Testers
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Force displacement testing measures how much force is required to displace or deform a specific component or material. It’s an important aspect of quality control in manufacturing as well as material science. It’s necessary to help ensure products are made to the proper standards and to verify the properties of certain materials. Imada provides a range of force displacement testers that provide precise and accurate measurements, with numerous features to help technicians complete testing as quickly and effectively as possible.
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Product
Ergonomic Force Gauges
MSE100 Series
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AMETEK Sensors, Test & Calibration
The MSE100 ergonomic gauge is a simple-to-use, ergonomically designed mechanical instrument ideal for muscle strength evaluations and job task analysis.
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Product
Cleanliness Inspection System / Microscope
CIX90
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The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Product
Coercive Force Meter
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The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Product
Fiber Microscope
WL-D200S
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The WL-D200 fiber microscopes provide dual-illumination, both coaxial and oblique, to produce the highest-quality image detail and superior view of fiber end face cleanliness and core condition.
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Semiconductor / FPD Inspection Microscope
MX61L
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Motorized Microscope for 300mm dia. Wafer/17 inch Glass Substrate use Reflected/Transmitted Illumination.
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Product
Stereo & Pocket Microscope
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A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
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Force Gauge
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Tension & compression capability .* 5000 g, wide capacity, highresolution, high accuracy, highrepeatability.* 3 kind display unit, g/oz/Newton.* Separate sensor.* Peak hold ( Max. load ) measurement.* Positive or reverse display direction.* Hand held & stand mounting.* Microprocessor circuit & exclusiveload cell transducer.
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Thermal Microscope Stage
TS-4MP
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With our TS-4MP Thermal Stage, a specimen on a microscope slide or culture dish can be maintained at any temperature between -20°C and +60°C. Setup is easy, takes little time, and the controller will regulate the stage temperature to within +/-0.1°C
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Measuring Microscopes, Image Processing
Measuring Microscopes
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Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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Force Protection
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The Durham is a high-performance, highly-mobile and easy to emplace Medium Range Day/Night Wireless Surveillance System using a state of the art day camera and a cooled, highly sensitive 640x480 InSb Focal Plane Array thermal camera with 8X continuous optical zoom. The system is image stabilized and has automatic tracking of targets. Each system consists of a Base Station and one Remote Station which can be emplaced up to 5km away for wireless operation or within 500m for fiber optic operation. A single Base Station can monitor and control up to four (4) Remote Stations. The system is powered by a generator, batteries, solar (supplemental power), or vehicle power. Other options available are laser pointers, designators, and a vehicle integration kit.
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Product
Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Modular Infinity Microscope (MIM)
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Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30mm diameter coupling to the I.D. of the C60-TUBE, or with a 50mm coupling on the O.D. of the lens tube.
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Toolmakers Microscope
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Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Atomic Absorption Systems
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Agilent leads the industry with innovative atomic absorption (AA) instruments. The entry-level SpectrAA 55B is ideal for labs in remote locations, while the 240FS and 280FS AA systems achieve the productivity of sequential ICP with Agilent’s Fast Sequential technology. The 240Z and 280Z AA systems provide superior performance and accurate background correction with transverse Zeeman technology. Our AA Duo systems feature unique simultaneous operation of both the flame and graphite furnace.
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3-Component Quartz Force Rings
260 Series
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Three-component quartz force ring sensors are capable of simultaneously measuring dynamic force in three orthogonal directions (X, Y, and Z). They contain three sets of quartz plates that are stacked in a preloaded arrangement. Each set responds to the vector component of an applied force acting along its sensitive axis. 3-component ring force sensors must be statically preloaded for optimum performance. Preloading provides the sensing elements with the compressive loading required to allow the proper transmission of shear forces. Versions are available with ranges up to 10k lb (45k N) in the z-axis (perpendicular to the top surface), and up to 4000 lb (18k N) in the x-and y (shear) axes. Both ICP® and charge output styles are available.
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Inverted Microscope Systems
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Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
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The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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STM Microscope
NaioSTM
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The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
