Atomic Force Microscopes
Nanometer size probe which scans for surface deflections.
See Also: AFM, Microscopes
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400x Bench-Top Optical Fiber Microscope - FTM-400X
Shanghai Fibretool Technology Co.,Ltd.
With coaxial illumination optic magnify system, FTM-400X can easily find the slight defects and scratches on fiber endface. High resolution image sensor and 8"pure black and white digital TFT LCD can show the most real details of fiber endface.This is an integrated fiber endface inspector, it combines optical microscope and monitor in a body other than separate designs. It has clear images and long life time. it has series of adaptors for various kinds of connectors such as multi fiber connectors, optical components. It is an essential instrument for optical manufacturing.
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Bond Force Measurement And Calibration Systems
BFS-20
Based on its design and easy handling it can be used also on other brands to measure the bond force.
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Inverted Microscope Systems
Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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Hand-held Fiber Inspection Microscopes
The WL-C series hand-held fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Cold Atomic Beam System
Detailed description of item: Complete cold atomic beam sources for alkaline-earth precision experiments and atomic devices. Small chambers with patented permanent-magnet Zeeman slowers and in-vacuum 2D MOT optics allow high flux with low outgassing and no thermal beam flux at the cold atom port, which provides a CF-133 connection to customer vacuum chamber. Advanced thermal design of the effusion oven allows long-lifetime operation at minimal heating power, with no water cooling. An integrated low-outgassing hot window is provided for coupling of on-axis Zeeman cooling light. Ion and getter pumps integrated into the chamber manage outgassing from the oven at temperatures up to 520 °C. Operating baseline pressures below 1×10-11 mbar can be attained in the customer’s downstream cold atom (typically 3D MOT) science chamber, with suitable pumping speed provided at the differentially-pumped cold beam output port.
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Digital Force Gauges
Imada digital force gauges are highly accurate instruments that provide the precise force measurement required in quality testing that determines strength and/or functionality of a part or product. Digital gauges can be used for destructive or non-destructive force measurement applications and check both compression and tension (push or pull) forces. The high sampling rate of Imada digital gauges enables them to capture the peak force of destructive tests which occurs in milliseconds. Imada digital force gauges also feature selectable units: lbf, kgf and N and easy-to-program high/low setpoints for Go/No Go testing.
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Measuring Microscopes, Image Processing
Measuring Microscopes
Optik Elektronik Gerätetechnik GmbH
Image processing software for dimensional measurements, motorized measuring microscopes and fully automatic measuring machines.
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Mechanical Force Gauges
The mechanical force gauges from Chatillon offer high precision compression testing (Push) and tensile testing (Pull) at a low cost on a wide range of testing applications.
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Force Tensiometer
K20
Our Force Tensiometer – K20 is a robust, semi-automatic instrument for the precise measurement of surface tension and interfacial tension. Using the ring and plate method as the main tensiometric methods, it produces reliable measurements for the routine quality assurance of your surfactant solutions and interfacial processes.
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Force Distance Tester
925
The Model 925 is a low cost force-distance tester. It communicates with a Windows™-based PC to send data into an Excel format. The data can then be viewed and analyzed in tabular or graphical format. Once in the Excel format, the data can be transferred or used in any of the multiple Excel operations. This line of displacement-force test stations has a positional resolution of 0.0025 mm (0.0001 inches). Your test department will appreciate the high accuracy readings provided over the complete travel range.
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Stereo Zoom Microscopes
Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
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Radiation Force Balance
Radiation force balance for diagnostic and therapeutic medical ultrasound
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Autofocus Optical Fiber Microscope - AFM-700
Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
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Heating Microscope
Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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Microscopic Probes
M12PP
CAPRES M12PP Microscopic Twelve-Point Probes are specialized versions of the CAPRES Micro Multi-Point Probes. By using a dedicated 12-by-4 multiplexer, a total of 495 different pin-configurations can be obtained, each with different probe pitch. This is utilized in e.g. the CIPTech, where 8 or more combinations are used to obtain a “depth profiling” of the measured structures.
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Force Gauges
SHIMPO offers a range of digital and mechanical force gauges to suite every application from low capacities (0.5 lbs) to high capacities (1,000 lbs). Our gauge's features range from simple, no output models to highly sophisticated units that provide memory, statistics and data output. Our gauges are known for their strong construction and highly accurate measurements.
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Imaging Mass Microscope
iMScope QT
Inheriting the concept of a mass spectrometer equipped with an optical microscope from the iMScope series, the iMScope QT is also Shimadzu's flagship model for MS imaging with a Q-TOF MS(LCMS-9030).
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Verification Of Maximum Withdrawal Force Test Apparatus
IEC60884 FIG 18
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG 18 verification of maximum withdrawal force test apparatusThis device complies with the requirements of GB 189.1-2008 Figure 18/19, IEC884 Figure 18/19, VDE0620, etc. It is suitable for checking the maximum force required to pull the plug out of the socket and the single pole pin pulled out from the socket assembly. Whether the minimum force required is within the range specified by
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Digital Video Inspection Microscope
Contamination is the first reason for troubleshooting optical networks. Proactive inspection and cleaning of fibre connectors can prevent poor signal performance, damage to equipment, and network downtime. DIAMOND’s Video Microscope Kit contains all necessary tools for proper inspection and cleaning of the connector’s front-faces to help ensure optimal connector performance.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Compact Inverted Microscope, 1mm Field Of View
Viewing transparent samples from below in a Petri dish, flask, well plate or cavity slide. The microscope is compact and can be put inside most incubators to view experiments without opening the door. Time-lapse images can be saved and viewed remotely.Ideal for use as a Bench Microscope in teaching applications.
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High-Resolution Scanning Probe Microscope (SPM)
High-Resolution Scanning Probe Microscope (SPM)
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Coercive Force Meter
The meter is mainly used in measuring the coercive force of magnetic components of relays and the mechanical energy meter compensation films, which is the essential instrument of manufacturers who are producing the relays and the energy meters, etc.
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Fluorescence Microscopes
We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
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Digital Push And Pull Force Gauge
HG-2-1000
Shenzhen Chuangxin Instruments Co., Ltd.
Digital push and pull force gauge is a universal portable force device, testing push and pull load. It is small, light, easy to take, multi-function, high precision. Applicable for all products doing push and pull load test, insert and pull out force test, destroy test, etc. It also can be combined with the machine and clamp to make up a small tester for different purposes.
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Scanning Electron Microscope (SEM)
Prisma E
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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3-Component Quartz Force Rings
260 Series
Three-component quartz force ring sensors are capable of simultaneously measuring dynamic force in three orthogonal directions (X, Y, and Z). They contain three sets of quartz plates that are stacked in a preloaded arrangement. Each set responds to the vector component of an applied force acting along its sensitive axis. 3-component ring force sensors must be statically preloaded for optimum performance. Preloading provides the sensing elements with the compressive loading required to allow the proper transmission of shear forces. Versions are available with ranges up to 10k lb (45k N) in the z-axis (perpendicular to the top surface), and up to 4000 lb (18k N) in the x-and y (shear) axes. Both ICP® and charge output styles are available.
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Microscope Platforms
Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Universal SOIC ZIF (Zero-Insertion-Force) Test Socket
Series 547
Universal SOIC Zero Insertion Force Test Socket. Devices with up to 44 pins can be inserted without bending or otherwise damaging the legs, since no force is required to either insert or remove the component from the socket. Accepts SOIC gull-wing and J-lead devices, up to 44 pins on .050 [1.27] lead pitch, body widths from .150 to .600 [3.81 to 15.24].
