X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Product
In Vivo Imaging
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Introducing two NEW systems in the IVIS® Lumina™ preclinical in vivo imaging instrument family, the IVIS Lumina S5 and the Lumina X5. The IVIS Lumina S5 2D optical imaging system combines high sensitivity optical and patented spectral unmixing capabilities in a high-throughput system. The IVIS Lumina X5 has all the features of the S5 with integrated high-resolution x-ray.
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Superlattice Doping / ALD Services
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Alacron, Inc. is capable of processing sensor wafers on a contract basis to produce backside illuminated wafers sensitive in the UV and soft X-Ray region with an array of anti-reflective coatings based on licensed patented, (US 8,395,243 and US 8,680,637), technology from Jet Propulsion Laboratory (JPL).
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Computed Tomography and CT Scanner
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When conventional x-ray images aren’t enough, a diagnosis for soft tissue conditions requires appropriate technology. Whether cross-sectional images are required or entire pictures of internal organs, CT exams and scanning are a vital part of a healthcare or imaging facility.
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Product
Beam Directional Power Supply Battery 40 to 120 kV
CP120B
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This ultra-light, compact and battery operated constant potential portable X-Ray generator is the perfect tool for specific NDT applications that require repetitive short exposures. Its versatility also makes it the ideal piece of equipment for security applications. In fact, in combination with the FLATSCAN15, the FLATSCAN30 and other digital X-Ray detectors, the CP120B will – thanks to its small focal spot and constant potential X-Ray output – enhance image quality and definitely contribute to a reduced exposure time.
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High Flexible Inline AXI Platform
AXI X# Series
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The X#-platform series is an inline automated X-ray system which covers a wide range of AXI applications. It is a flexible platform with very versatile fields of use depending on the application requirements. The inspectable applications range from component level inspection for wire bonds, large SMT boards, high-power electronic modules up to fully assembled modules.
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Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Product
Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Product
X-ray Analytical Microscope Super Large Chamber Model
XGT-9000SL
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- Large chamber capacity (W x D x H) : 1030 mm x 950 mm x 500 mm- X-ray shield complying with JAIMAS0101-2001/ IEC1010-1 to protect you from X-ray exposure- Mapping area size up to 350 x 350 mm2- <15 µm spot size with ultra-high intensity without compromising sensitivity and spatial resolution- Dual types of detectors for transmission and fluorescent X-rays- Detectable element range down to C with a light element detector and He purge module
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Product
XRF
M Series
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The M Series is the ultimate in high performance for the smallest x-ray spot sizes. The poly-capillary optics in the M Series is more advanced than the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included. The field of view becomes more limited with higher magnification, so a second camera takes a macro-image of the part to be measured. The dual-camera system allows operators to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the feature to be measured.
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Industrial Computed Tomography
TomoScope® XL
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Micro focus X-ray source up to 225 kV (option: 300 kV micro focus tube) Grater range of x-ray detectors Grater range of x-ray detectors
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Product
Ultra High Vacuum
UHV
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Our range of UHV magnet systems for x-ray beamline applications offers the highest performance specifications currently available combined with an unparalleled degree of flexibility ensuring that the system is tailored precisely to the requirements of the user facility.
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Product
LIXI WorkStation
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The LIXI WorkStation utilizes real-time xray to provide a cost effective solution for a variety of inspection needs. The system features a mobile cabinet for ultimate portability within your facility, while providing the operator with a high degree of safety.
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Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
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X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Product
16-element Si photodiode array
S12362-321
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The S12362/S12363 series is a back-illuminated type 16-element photodiode array specifi cally designed for non-destructive X-ray inspection. These are modified versions of our previous products (S11212 series: 1.575 mm pitch). The pitch has been changed to 2.5 mm. The back-illuminated photodiode array is also simple to handle and easily couples to scintillators without having to worry about wire damage because there are no bonding wires and photosensitive areas on the back side.
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Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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LIXI ImageScope
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The LIXI ImageScope is an open system commercial industrial xray scanning tool. Lightweight and portable, its design is ideal for quick, onsite results.
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Data Acquisition Control Boards
X-GCU
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X-GCUs are a data acquisition and control boards of Detection Technology’s digital X-ray detector platforms. X-GCU together with the digital X-Cards provide complete and easily scalable detector subsystems shortening time-to-market and delivering total cost savings for all types of X-ray imaging systems.
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Product
XRF Lead Paint Spectrum Analyzer
LPA-1
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The LPA-1 is a state-of-the-art Lead Paint Analyzer using X-Ray Florescence (XRF) and K-Shell technologies, providing readings in as little as 2-4 seconds. It is widely considered the fastest, most reliable lead inspection system today. Non-destructive testing for lead on painted surfaces. Fast, efficient and easy to use testing device. Completes readings in 2-4 seconds.
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Product
Linear Array Detector Cards
X-Card 0.2 to 2.5mm
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A product family of high performance linear X-ray detector cards with preamplifier ASICs. The preamplifier ASIC converts the charge output from the photodiode array into voltage with serial output for easy integration with readout electronics. Can be arranged end-to-end to form large linear detector arrays.
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Product
High Resolution Inline AXI Platform
AXI XS Series
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The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Portable XRF Analyzer
X-5000
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The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
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Digital mammography system
AMULET
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The new format FPD has a proprietary panel structure with a double layer of amorphous selenium that has high X-ray absorption properties, and was developed by combining Fujifilm''s "Device Development Technology" and "Vacuum Deposition Technology." The first layer efficiently converts X-rays into electrical signals, while the second layer employs the unique "Direct Optical Switching Technology," that captures higher resolution and lower noise image electrical signals rather than using electrical switches such as conventional TFTs. By achieving both "50µm fine pixel size (higher resolution) and low noise," the AMULET system can show microcalcifications and tumors in greater detail, both significant indicators for early diagnosis of breast cancer.
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Energy Dispersive X-ray Fluorescence Spectroscopy Consumables
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Ultra High Performance 3D CT System
UltraTom
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3D micro-tomography (CT Scan) and nano-tomography. Modular system with multiple imagers and x-ray generators. Experimentations possible in-situ. Large volume Inspection and manipulation volume.
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Software
DIFFRAC.SUITE
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DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
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Electron Multipliers
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Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Product
X-Ray Photoelectron Spectrometer
AXIS Supra
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AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Product
High Performance XRF Measuring Instrument
FISCHERSCOPE® X-RAY XAN® 250
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Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
