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Product
IC Testing System
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Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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Product
Brake Test Systems
Giant 8000 Series
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Customer perception of vehicle quality is closely related to the NVH behaviour of the vehicle. With the HORIBA ATS Brake testing system, NVH relevant design features are analyzed and various metrics stored in the database of the automation system. For friction borne vehicle NVH problems coming from the brake and its components the GIANT 8000 Series is the ideal tool to resolve it. The GIANT 8000 Series is superior NVH test system providing you with the best testing conditions for all types of vehicles. Test brake fixtures could be tested with a complete wheel suspension system. In a semi acoustic chamber NVH tests could be realized and drum brakes and disc brakes including the vehicle axle could be tested.
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Product
Sound Level Meters
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Is designed to respond to sound in the same way as the human ear and to give reproducible measurements of sound pressure levels.
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Product
Test System
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Maynuo Electronic Co.,Ltd a professional R & D and production of programmable DC electronic loads, programmable DC power supply, high power load, power supply, AC power supply, power supply, such as testing high-performance mobile phone test equipment and facilities, as well as electrical, electronic, aerospace, military, chemical, automotive, battery charger, battery, solar cell production lines and other industries to provide automated testing program. The company has many years experience in a number of outstanding technical R & D, product innovation by the majority of users. We are committed to provide users with more accurate and more stable more easily accessible to the higher cost of test instruments, to create the industry in testing the influence of an international brand of excellence.
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Product
High Voltage Test System
CKT1175-15
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12.5 mV – 2000 VDCIR measurements to 5000 megohmsHipot testingDwell time prog. from 1 ms to 1000s in 1 ms steps
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Product
Chloride Test System
C-CL-2000
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The C-CL-2000 produces results on-site, within minutes that are accurate and comparable to expensive laboratory tests. It measures the electrochemical reaction of a weighted sample placed in an extraction liquid. It automatically shows a temperature compensated reading of percent of chlorides on its digital display. A wide range - from 0.002 to 2% chloride by weight - is covered.
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Product
Entry Level OTDR
palmOTDR-S120 Series
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● The cost effective and the fully functional OTDR ● Graphic display of test results PC Software Download ● Quick start: <5 seconds USB Driver Download ● Perfect user interface, handheld & lightweight (1kg) ● Hotkeys: Easy to use, push-and-test ● 1000 test records storage ● Bellcore file format (.sor) ● PC software for batch data processing ● USB data interface, driver-free ● Multiple languages: EN/DE/IT/FR/ES/PT/RU/KR/VN/CN etc. ● 10 hours continuous operation with battery ● Dust-shock proof (2m drop test)
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Product
Test Automation System for Brake Testing
STARS Brake
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STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Product
Resonant Testing System
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Originally designed to precrack specimens for fracture mechanics, the current versions offer much more possibilities due to a modular concept:*Bending up to 160 Nm*Tension/Compression up to 8 kN*Torsion
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Product
VME Test System
VMETS
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Measurements of system performance include Bus Utilization, Transfer Rates and Statistics. As data is acquired the Min, Max and Average values are updated and displayed in graphical form.
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Product
Power-Switching Test System
High Voltage Switching Test System
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The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Product
Level Translators
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ADI’s level translators offer the most flexible level translation solutions in the industry. The ADG3241 series translators allow direct 3.3 V to 1.8 V translation by means of the innovative SEL pin function while allowing bidirectional data transfer. The ADG3231 series allows wide range 1.65 V to 3.6 V translation and the ADG3308 series allows the industry's widest 1.2 V to 5.5 V up or down translation while permitting bidirectional data transfer.
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Product
Level Sensors
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Sensor solutions for point level detection and continuous level measurement.
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Product
Automatic Level Control Amplifier
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RF Lambda’s automatic level control amplifiers allow customers to implement an AGC function into their system to tune the gain and stay linear with high input signals without the need to manually control the input level. Hermetically sealed options are available upon request.
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Product
6 MHz Level Test Set ET 92
ET 92
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100 Hz to 6 MHz selective/wideband Level Meter & Generator, with Spectrum Analyser
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Product
Car-to-X Test Systems
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Qosmotec Software Solutions GmbH
Wireless Communication Technology is finding its way into automotive industry – not only for entertainment purposes, but for security and safety reasons: With Car-to-X technology, drivers shall get information that other vehicles and road side facilities already have, for example, in case of a traffic jam ahead, a slippery road behind a curve or a necessary change of the traffic lane because of road constructions.
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Product
Test System
4003 TLP+™
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The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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Product
Full Wafer Contact Test System
Fox 1
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Unique cartridge technology uses full-wafer contactors combined with parallel test electronics to achieve single touch, full-wafer test
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
SparkFun Level Translator Breakout
PCA9306
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There are a couple must-have boards that every engineer and hobbyist should have on their desk, and this PCA9306 dual, bidirectional voltage-level translator breakout is one of them! Because different parts sometimes use different voltage levels to communicate, voltage level translators can be the key to making different parts play nice.
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Product
Interface & Level Converters
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Advanced Science and Novel Technology, Co., Inc.
2-channel LVDS-to-CMOS converter (Receiver) and 2-channel CMOS-to-LVDS converter (Transmitter)Optional signal splitter function with selectable inversionOptional DS (Data/Strobe) encoding/decoding for compatibility with Space Wire StandardProgrammable LVDS/CML/ECL Receiver input interfaceTrue LVDS Transmitter output interfaceFlexible selection of enabling and operational modes of the channelsHigh-impedance states of disabled CMOS outputsSingle +3.3V power supplyIndustrial temperature range
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Product
VIP Cabin Management Systems
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Where elegance meets powerful functions, add a new level of electronic sophistication to your cabin.
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
Transducer Test System
TTS-030
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For the generation of unique bond links the use of high-quality components is an essential precondition. Despite all care in the production of ultrasonic transducers again and again unexpected effects occur, which only manifest themselves in the use of those transducers and which also have the reason in the transducer itself.
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Product
Electrodynamic Vibration Test Systems
A-series
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A wider range of test requirements and higher test specifications.A-series meets the needs for such a versatile test environment.Advanced automatic energy saving, high level of functionality and a protected test environment.
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Product
Conformance Test Systems
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With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
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Product
Transportation Simulation Test System
KRD50 series
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KRD50 series transportation simulation test system is to simulate the actual road conditions such as shocks and vibrations during the transportation of various items of a specific load, and to evaluate the effect of the actual working conditions on the loading, unloading, transportation, packaging, sealing or internal structure of the goods. In order to assess or confirm the products and packaging.
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
Test System Mainframe
ITC59000
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The ITC59000 Test Platform is a desktop DynamicParametric Test System mainframe. The ITC59000Test Platform accepts up to four Test MeasurementUnits (TMUs) that perform transient measurements onsemiconductor devices such as power MOSFETs,IGBTs, and diodes.
