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Test Fixtures & Jigs
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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Test Extension Boards
XJIO
The XJIO boards are expansion units that enable you to improve the test coverage for a Unit Under Test (UUT) by verifying the signals right through to the external connections. They will integrate with your XJTAG test system to provide access to otherwise inaccessible areas of your circuit. With a range of digital and analogue I/O pins on the board, you can improve fault isolation, verify power rail levels, and dispense with costly custom test jigs - even for non-JTAG boards.
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Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Automatic Dielectric Constant Tan Delta And Resistivity
No Balancing and Calculation required to calculate Volume / Surface Resistivityand Dielectric Constant.Complies IEC 60250, IS 4487, Test jig Conform to ASTMD 257Built in Thermal PrinterSerial port RS232 for data downloading.Can be used to check liquid sample with Three Terminal oil cell.Storage 100 Test reports
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MCB Thermal Verification Test Bench
The test system is a special version of the thermal test test system in the sense that the test jig is primarily designed to hold and connect multi pole MCBs for thermal verification so that each pole can be verified to trip within the IEC time band after the MCB has been riveted. This test ensures the trip verification of MCB so as to trip all the 4 poles at once when overload is detected in one single pole. In short, this is a verification-only bench.
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Engine Simulator
MS 1118
Test Set-A calibration unit is a test jig is used to simulate parameters of Adour 804E and 811 engines of Jaguar aircrafts. It simulates current, voltage, speed, and turbine gas temperature. It performs NL Check, NH Check, TGT1 (Non T2 Compensated), TGT2 (T2 Compensated), Amp (Non T2 Compensated), Amp (T2 Compensated), Solenoid Volt, TGT Inject, NL Inject, and NL/TGT Redatum.
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ESI Test Jig
MS 1543
This Test System designed to test the analog, discrete, Ethernet, RS232, RS422, Synchro /Resolver and SPI Signals. It is standalone test equipment and has GUI ATP Software interface with laptop/PC through RS232/Ethernet Interface.
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Mechanical Bench-top Test Jigs
CGF Series
Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
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Bench-top Test Jig
CMF Series
Robust test jig, using a cam-operated horizontal probe plate - self customisation.
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Production Line Acoustic Test Chamber
PLATC
The Production Line Acoustic Test Chamber from GRAS is designed for quick and qualified acoustic test of cell phones, tablet PCs, Bluetooth speaker systems etc., including frequency response, THD, Rub & Buzz and microphone test using optional sound source. The chamber has a number of connections for injecting test and control signals to the test object (DUT).Benefits include:Repeatable testing and reliable dataEasy open/close for quick and safe change of DUTFlexible test jig for easy adjustment to new DUTFlexible microphone mounting for both front/backside speakers as well as edge-mounted speakersHigh quality, high sensitive 1/4” CCP measurementmicrophone included (G.R.A.S. 46BL)Individually calibrated frequency response** Compared to reference measurement in anechoic room
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Compression Test Jig For Foam Rubber Specimens
JIS-based compression testing of foam rubber used in seats can be performed. This machine comprises exclusive accessories added onto an Autograph precision universal testing machine.
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Bench-top Test Jigs
Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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Energy Saving System
ECO-Vibe neo
ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.
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SRJ (for IBP sensors)
The MEDTEQ SRJ is a test jig to measuring the step response of IBP sensors, which can assist in testing compliance with IEC 60601-2-34 frequency response. It is also suitable for manufacturers or test labs wanting to access the raw pressure waveforms via an oscilloscope.
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Ceramics Bending Test Jig
These test jigs enable 3- and 4-point bending tests in accordance with various JIS, ISO and ASTM standards.
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Printed Circuit Board Bending Test Jig
Evaluation of Bending Strength of Electronic Components and Substrates
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Material Test Machines
Sanwood Environmental Chambers Co ., Ltd.
Sanwood Universal Test Machines, UTM, are widely use for different material testing, like semi-product & finished product made of rubber, plastic, metal, nylon, non-woven fabrics, textile, tape, polyfoam, waterproof materials, wire, cable, etc. With different test jigs or fixtures, the UTM can run the tensile, compression, shearing foce, adhesion, peeling force, tear strength, fatigue, etc test according to GB, CNS, ASTM, ISO, DIN, JIS, EN test standards.
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Customized Material Testing Machines
Globally growing innovations result besides fulfillment of new testing standards in an ever increasing demand for customer-specific solutions regarding the testing technologies, jigs, measuring systems, software and the automation level of the testing machines.The core competencies of TIRA are customer-specific solutions.TIRA is able to realize individual customized solutions according to customer´s request and the simplest derivations like longer, wider, narrower, shorter material testing machines.
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Precision Metal Clad Shunt Resistor
IRHF
Precision Metal Clad Resistors designed in four- terminal technique, are distinguished by high load capacity as well as excellent accuracy. Isolated voltage and current connections making them suitable for very precise current measurements. Easy current measurement is performed by attaching to current bus directly and connecting to voltage (ampere) metal through flexible wires. The ULH models are UL approved versions. Units have a low inductance, heavy copper terminals. The main application is battery manufacturing test jig.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
