Pull Force
strength necessary to extract.
See Also: Force, Compression, Crimp Force, Pull off Force, Push Pull Force, Peeling, Tension, Gravity, Electrical, Magnetic
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 155gf
K100-G150155-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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Product
PXI Module Adapter, Pull Thru Adapter, Receiver, 1 Position
510109462
Adapter Module
PXI Module Adapter, Pull Thru Adapter, Receiver, 1 Position.
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Product
High Power Temperature Forcing System
MaxTC G4
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NEW G4– MaxTC is our premium Temperature Forcing System product, specifically designed for industry needs as a result of customer´s feedback from the Flex-TC. Its powerful cooling force (90W @ -40°C), rapid transition rates (75°C /min) and remote control capabilities will provide solutions to all semiconductor testing needs. MaxTC is compact, ultra quiet (55 d BA) and fits into any laboratory. A premium product at amazing value.
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Product
Force Sensors In S-form For Pull/push Direction
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INELTA Sensorsysteme GmbH & Co. KG
With very small space requirement and high breaking force made from tempered stainless steel, suitable for measuring medium to high forces. Easy integration and mounting by threaded bores.
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Product
Cable Pulling Analysis
CABLE
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CABLE quickly solves complex three-dimensional cable pulling tension and sidewall pressure calculations, allowing you to make rapid and accurate design decisions.Don't leave installation to chance.
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Product
Atomic Force Microscopy
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Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Product
Force Sensors
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Piezoelectric force sensors, respectively piezoelectric force transducers or load cells, are perfectly suited for the precise measurement of compressive and tensile forces, both in highly dynamic applications and in quasi-static processes. In universities and industry, for basic research or quality assurance: exact data is always essential in order to measure force characteristics and make processes more cost-effective. Thanks to their rugged design, piezoelectric force sensors from Kistler keep precise track of quasi-static and highly dynamic force processes, even when conditions are difficult. Our force sensors can also handle simultaneous measurements of multiple orthogonal force components.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 230gf
K100-K150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
Sensor Products: Weld Force Gage
90061
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Model 90061 is a self-contained, portable measurement system which allows auditing of the pinch force generated between the electrodes of resistance spot welders. Resistance welding uses a pair of electrodes to clamp two base metals firmly together prior to and during application of electrical current. Poorly clamped parts result in a defective joint. A correctly clamped assembly aids in reducing the resistance in the joint and allows the current flow to properly heat the base metals to weld the part.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
Force Gauge
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Tension & compression capability .* 5000 g, wide capacity, highresolution, high accuracy, highrepeatability.* 3 kind display unit, g/oz/Newton.* Separate sensor.* Peak hold ( Max. load ) measurement.* Positive or reverse display direction.* Hand held & stand mounting.* Microprocessor circuit & exclusiveload cell transducer.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 305gf
K100-C150305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Product
Economical Load and Force Measurement
ELF
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Tekscan's ELF force and load measurement system matches the market's need for an inexpensive load and force measurement system with Tekscan's ability to deliver innovative load and force measurement solutions. The system consists of data acquisition hardware, software, and FlexiForce B201 sensors.
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Product
Temperature Forcing System
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Wewon Environmental Chambers Co, Ltd.
Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibration testing machine, xenon lamp aging tester, ultraviolet weather testing equipment, tensile testing machine and various IP protection level test equipment. The system characteristic of Wewon Tech thermal stream temperature test system as below technical parameters mentioned.https://www.wewontech.com/temperature-forcing-system/
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Product
Economic Extreme Power Temperature Forcing System
ECO Cool Dual Edition
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Mechanical Devices is pleased to offer its customers with the first direct phase change TCU with DUAL head. Each head can be controlled individually. This DUAL head unit makes it possible to reduce the cost per workstation, saves space, reduces power consumption and heat emission in the laboratory or production hall.MD Thermal control units were designed with high efficiency and flexibility in mind, allowing for customization to suit different package and interface variations. The system allows for temperature forcing across a wide range of device sizes and types, whether socketed or soldered to the board.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 305gf
K100-H080305-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Product
Push Pull Testers
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Lever-operated manual systems enable rapid push/pull testing up to 220 lbf.Wheel-operated manual systems enable slower, more precise movement with the hand wheel up to 750 lbf.Motorized push/pull testers offer the most control and highest degree of repeatability with the ability to set a constant test speed and range of movement up to 1100 lbf.All push/pull testers can be configured with a digital force gauge with data output for analysis by data acquisition software. An optional digital distance meter to measure displacement is available.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Force Sensors
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TE Connectivity (TE) designs and manufactures force sensors for applications that require high performance or unique packaging, including electro-mechanical flight control, test and measurement and ultra-low cost OEM load cells for medium to high volumes. Based on our proprietary piezoresistive silicon strain gage (Microfused) technology, our sensors combine durability and long-term stability in extremely low cost packages.
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Product
High Force Type Spring Probes
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Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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Product
Ergonomic Force Gauges
DMG Series
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AMETEK Sensors, Test & Calibration
The DMG ergonomic gauge lets you objectively measure manual muscle strength and functional task requirements for almost any application.
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Product
Torque and Force Calibrators
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Self-contained, semi-automated, multi-functional calibrator, which provides a rapid highly accurate and safe means for calibrating and testing a wide variety of torque and force measuring instruments.
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Product
Atomic Force Microscope
3DM Serirs
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Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Product
AFM Atomic Force Microscope
FM-Nanoview 6800
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Zhengzhou Nanbei Instrument Equipment Co. Ltd
All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
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Product
Atomic Force Microscope
AFM Heron
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New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Product
Force Protection
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The Durham is a high-performance, highly-mobile and easy to emplace Medium Range Day/Night Wireless Surveillance System using a state of the art day camera and a cooled, highly sensitive 640x480 InSb Focal Plane Array thermal camera with 8X continuous optical zoom. The system is image stabilized and has automatic tracking of targets. Each system consists of a Base Station and one Remote Station which can be emplaced up to 5km away for wireless operation or within 500m for fiber optic operation. A single Base Station can monitor and control up to four (4) Remote Stations. The system is powered by a generator, batteries, solar (supplemental power), or vehicle power. Other options available are laser pointers, designators, and a vehicle integration kit.


























