Wafer Inspection
Inspection of integrated circuits in wafer form for contaminants, flatness, size, and roughness.
See Also: Wafer, Wafer Thickness, Wafer Failure Analysis, Wafer Edge, Wafer Resistivity, Wafer Mapping, Wafer Probes, Wafer Probers, Wafer Handlers
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Product
Vision Inspection System
Vision Station
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Design and manufacture vision inspection system for SOT, SOD, TO, DPAK, SOIC, TSOP, SSOP, QFN/MLP, ODFN and LED inspection.
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Product
DC Safety Inspection Device For Solar Panels
“DC Fault Tester”
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Identifies defect position instantly- contributes to saving inspection time
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Product
Inspect a Large Range of Part Geometries
ECHOMAC® PA Composite Tester
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ensures complete inspection of the part. The system is scalable, allowing the flexibility of adding channels as needed to handle a large range of part geometries. Meets or exceeds USA, European and other international specifications in aerospace and automotive industries. MAC can supply mechanics designed to meet customer requirements ranging from inline bubbler systems to stand alone immersion tanks with part placement.
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Luminescence Defect Inspection System
INSPECTRA® PL Series
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This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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Product
WDXRF Wafer Analyzer
2830 ZT
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Product
Building Inspection Kit
MR160-KIT2
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Troubleshoot moisture and building problems wherever you go with the FLIR MR160-KIT2. This kit features the MR160, a moisture meter with IGM™ to quickly target problem areas, as well as the C2, a full-featured, pocket-sized thermal camera designed for a wide range of building and electrical applications. The MR160’s integrated pinless sensor and external pin probe provide the flexibility to take either intrusive or non-intrusive measurements. The kit also includes the MR06 wall cavity probe for even greater functionality.
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Product
Wafer Probers
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Devices to align probes to test the electrical properties of IC chips or TEGs (Test Element Groups) formed on wafers. The vast options available will meet various needs, from research to mass production.
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Product
Automatic and Accurate Inspecting Systems
Circuit AOI
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The Circuit AOI system is designed to perform automatic and accurate inspecting systems. It integrates rigid mechanical system with advanced vision technology and manufactured and tested by strict is standards. It is suitable for circuit inspection for PCB/FPC, verification and repair. Innovation and unique inspection algorithms are applied to inspect open, short, protrusion, nick, scratch, pin hole, island, line width/space violation, object missing and others defects. AOI system can use offline setup project and check results. It will improve the throughput.Compare to halogen lighting, the full angle LED lighting of Circuit AOI can obtain the best image contrast and is good for different panel type inspection.
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Product
Automatic Flight Inspection System
AT-920DG
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Airfield Technology is pleased to announce the availability ofa new product, the AT-920DG Automatic Flight InspectionSystem.The new AT-920DG system combines the unique groundbasedinspection capability of our original AT-920 with theproven DGPS positioning system and WinFIS flight inspectionsoftware from our larger, dual equipment AT-930DG system.
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Product
Non-Destructive Test Resonant Inspection Station
RAM-TEST-FIXTURE
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The NDT Test Station, Model RAM-TEST-FIXTURE Resonant Inspection System is an ideal choice for testing when repeatable manual inspections are required. The innovative Test Station allows precise control of part positioning with an adjustable table ranging up to 6.25 inches (158.75 mm) in height.
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Product
Smart Factory Inspection System
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API, recognizing manufacturing industry’s increasing demand for part measurement automation, with a higher degree of accuracy, has developed its Smart Factory Inspection System with true 6 Degrees of Freedom (6DoF) real-time 3D robotic measurement incorporating its proven metrology technology and calibration components.SFIS can be delivered as a customized integrated solution or as a standard production inspection cell.
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Product
Automated Optical Inspection
AOI
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No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools. As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
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Product
Inspection Bundle
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Cost effective bundle of eVision's inspection librariesIncludes EasyImage, EasyGauge, EasyMatch, EasyObject and EasyColor
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Product
Ceramics and Glass Inspection Systems
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Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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Product
3D Solder Paste Inspection Machine (3D-SPI)
3Si Series
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Saki's 3D SPI identifies critical defects and assists with process improvement.
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Product
Macro Inspection
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High-throughput automated macro inspectionAny wafer size, in less than one second with ~75 micron resolutionSmall footprint table-top system
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Product
Electrical Inspection Adapters & Accessories
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Electrical Inspection Adapters & Accessories by electro-PJP
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Product
Borescopes & Inspection Cameras
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Triplett Test Equipment & Tools
Is an inspection camera with a detachable wireless 3.5" color display. It features 4x digital zoom, water resistant 8mm camera with 3.5ft cable, and 4 adjustable white LEDs for illumination.The wireless display detaches from the handle for additional freedom in viewing, and internal magnets will conveniently mount it to steel surfaces. With the included Micro SD card you can save snapshots and live video. Saved files can be viewed on the LCD screen or downloaded to a computer via the USB port.
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Solder Joint Inspection System
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DMC developed the software to inspect the solder joints of automotive power door lock switches.
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High Energy Industrial CT X-Ray Inspection System
MeVX Series
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The most advanced industrial DR & CT systems in the world are now available with Linear Accelerators. Offered with energies up to 9MeV, the MeVX series of systems provide the same ease of use as our low energy systems in a high energy format. Utilizing our current efX software platform along with the superior service, support & training that we are known for puts these systems in a class of their own.
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Product
Wafer Test
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WinWay’s commitment to technology, quality and service ensures our interface solutions go above and beyond to exceed your expectations. Our products and services have a proven track record of delivering customer success in semiconductor testing. The Company offers comprehensive test interface solutions ranging from wafer-level test, package-level test to thermal management.
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Product
Inspection
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A complete line of testing instruments for inspection laboratories is available from our Petrolab group. We specialize in instruments for vapor pressure, flashpoint, distillation, and color as well as equipment for hundreds of other ASTM, ISO, and DIN testing procedures. Below are a handful of items we offer.
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Product
Double Sheet / Splice Inspection
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Leuze electronic GmbH + Co. KG
Double-sheet control sensors enable the reliable differentiation between one or more layers of very thin objects made of different materials. This allows, for example, single-layer paper sheets to be reliably pulled in or individual electrodes to be stacked for the production of a battery cell. Different operating principles, based on ultrasonics and capacitive sensors, cover the range of materials for different applications. Sensors for splice inspection detect desired and random splices in paper webs independent of the surface color and material properties.
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Product
Fiber Inspection & Cleaning
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ShinewayTech Fiber Inspection & Cleaning - Optical Connector Inspector, Wireless FIber Inspection Probe, Cleaning Pen, & more.
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Product
Conformal Coating Inspection (CI AOI)
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They cover the components, the area around the components and identify most coating issues including cracks, bubbles, insufficient / excess coating, loss of adhesion and other common contaminations. Full coverage inspection for conformal coating.
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Product
Wafer Prober
Prexa
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The latest fully automated 300mm wafer prober. The system offers excellent productivity and advanced functions, contributing to KGD (known good die) testing for advanced packaging.
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Product
X-Ray Inspection System
MXI Quadra 5
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Quadra™ 5 is the X-ray inspection system of choice for sub micron applications such as PCB and semiconductor package inspection, counterfeit component screening and finished goods quality control.
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Product
Low to Modest Volume Clean, Inspect, Test
KI-TK034
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1310/1550 nm source & power meter, inspection microscope, cleaning materials. Interchangeable MPO/APC, SC, LC connectors (EAR99 Restricted)
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Product
AXI Inspection Systems
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Dou Yee Enterprises (S) Pte Ltd
Dou Yee Enterprises AXI Inspection Systems
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Product
GPR Bridge Inspection Equipment
BridgeScan
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Geophysical Survey Systems, Inc.
BridgeScan™ is a complete, affordable GPR system that is an effective tool for quickly determining the condition of aging bridge decks, parking structures, balconies and other concrete structures. The system is also used to obtain accurate concrete cover depth on new structures.





























