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Electronic Test And Measurement Systems
Summaries, information, & tutorials about electronics test and measurement equipment & techniques.
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Thermal Stability Test System
Premier Electrosystems' Thermal Stability Test Setup is used to test thermoplastics and PVC (Plasticized Polyvinyl Chloride) materials. When exposed to continuous heat, these materials degenerate and emit harmful acidic gases. The instrument is manufactured for testing PVC materials for their thermal stability at higher temperature.
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Machine Vibration Monitoring Devices & Systems
Spider-80x
*Route Based Vibration Data Collection*Remote Condition Monitoring Software*Vibration Diagnostics System
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Battery Test device
ATGB 1200
The ATGB 1200 is a battery tester for all standard battery technologies aimed at quality assurance, production and product development. Advantages of the ATGB: Creation of customized test sequences. Generation of load curves and peaks. Temperature measurement at the battery
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RF Devices that deliver Comprehensive Solutions for Wireless Systems
Sumitomo Electric Industries, Ltd.
GaN HEMTs, GaAs FETs , MMICs, and low-noise HEMT solutions offer high performance and uncompromised reliability for radar, base stations, SATCOM, point to point, and space applications.
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Test System
USB Explorer 280
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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AIM System Solutions
AIM can provide a wide range of customized solutions:*Special-to Type Test Equipment (STTE)*High Level Bus Analysers (HLBA)*Data Acquisition Recording & Simulation Systems*Aircraft Ground Equipment (AGE)*MIL-STD-1760 Weapon Test Sets*Fibre optic MIL-STD-1553 Stub/ARINC429 Link Extension System (FoMIS/FoL)
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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GSP-2B Test System Interface Probe
GSP-2B
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46
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Protective Relay Test System
MTS-5100
The MTS-5100 is the only all-in-one relay test set with a direct front panel interface for all functions, without exception!
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Wire Damage Test Device For Pull Testing
IEC60884 FIG11
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
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Analog DAQ Devices
Family of ruggedized products that provide an isolated analog, digital or temperature interface to a PC via the PC’s USB port.
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Portable Test System
MT786
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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SoC Test System
V93000 SoC / Smart Scale
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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VLF Testing and Diagnostics System
PHG 80 TD/PD
BAUR Prüf- und Messtechnik GmbH
Cable testing and diagnostics with the BAUR PHG 80 TD/PD. With the PHG TD/PD, you get a multifunctional cable testing and diagnostics system that was specially designed and developed for medium-voltage networks. The PHG TD/PD system is also the only cable testing and diagnostics system that gives a comprehensive overview of the quality and ageing condition of the test sample. The diagnostic methods TD and PD are mutually complementary, because on one hand you can detect the complete condition and on the other hand locate individual faults in the operating resources.* High performance VLF truesinus testing device (3 kW) with regulated output voltage* Compact, enclosed design in 19" format* Variable installation option with separate control and voltage unit* Variable connection options to cable stations of different models
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Optics Test Systems
Lens Test
Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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System Tests Radar Pulse Stability
PN9002
Noise eXtended Technologies S.A.S.
The cost-effective PN9002 test simplifies the testing and analysis of pulse-to-pulse amplitude and phase stability for radar systems and components to 18GHz.
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Wireless Device Testers
To keep the communications backbone of mobile radio technology running, powerful mobile radio networks are needed. For the complex measurements involved, Rohde & Schwarz offers a wide range of instruments and systems such as wireless device testers, infrastructure testers, protocol testers, conformance and preconformance testers.
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Belt Starter Generator Test Systems
D&V has developed 12 V, 48 V and higher voltage BSG and ISG testing systems for performance, endurance and production testing, complete with thermal chambers, chillers and assembly lines.
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Measuring and Test Devices
ProfiMessage D
With a ProfiMessage D device, you can immediately begin using a optinal PROFINET interface as well as communicating to third-party systems via an OPC UA Server/Client. The device is also equipped with a display to show important configuration and measurement data. Other special features include universal sensor inputs, high-level data security, and a diverse range of interfaces.
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3U OpenVPX Multichannel Discrete I/O Board
68DT1
The 68DT1 is a 3U OpenVPX™ board featuring up to 96-Channels of Standard Functionality (SF) DT1 module-type or Enhanced Functionality (EF) DT4 module-type Discrete I/O functions [foptioned, factory configurable].48-Channels are dedicated as input (voltage or contact sensing with programmable, pull-up/pull-down current sources). An additional 24 or 48-Channels are programmable for either input or output (current source, sink, or push-pull) switching up to 500 mA per channel from an applied 3 – 60 V external VCC source (or sink to ISO-GND). The 68DT1 can sense broken input connections and whether an input is shorted to +VCC or to ground. Additional features of the DT4 EF are listed below. The 68DT1 offers unparalleled programming flexibility, a wide range of operating characteristics, and a unique design that eliminates the need for pull-up resistors or mechanical jumpers.
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Instrument Transformer Test Systems
Our systems for testing voltage (VT) and current (CT) instrument transformers are conceived among other things for testing accuracy and insulation.
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Shock Test System
Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability and sometimes the object may fail. Therefore, it's necessary to study the effect of impact and reproduce the shock environment, to assess the structural strenghth and performance of the object under shock environment.
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Rail Traction Inverter Test System
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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Lightwave Test Systems
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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CAN Interface Device
CAN Interface Devices communicate using onboard transceivers for High-Speed/Flexible Data-Rate, Low-Speed/Fault-Tolerant, and/or Single-Wire CAN as well as any external transceiver. Using the NI-XNET driver, you can create applications that require real-time, high-speed manipulation of hundreds of CAN frames and signals. You can also import, edit, and use signals from Fieldbus Exchange Format (FIBEX) and Database Container (DBC) files in integrated CAN databases. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time.
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Versatile quality control testing system
QuickSun® 550Ei
QuickSun 550Ei is a versatile testing system for qualifying of PV modules with dimensions up to 105 x 205 cm2. Basic set up includes a top class solar simulator which measures modules in sunny side up position enabling e.g. soiling simulations. Several additional measurement methods can be integrated to the same system including high resolution EL imaging with analysis software from one of the most recognized EL system suppliers. Also hot spot revealing IR images can be recorded by applying either forward or reverse bias current, and true nA scale leakage current measurements can be performed with sensitive enough instruments.





























