Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Motion and Sensor Instruments
Trig-Tek™ Instruments
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In 2010, we acquired the Trig-Tek™ line of innovative, precision, dynamic test and measurement instruments suitable for laboratory, military, and industrial environments. Trig-Tek™ is now a brand of products engineered and manufactured by Astronics Test Systems.
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Piezoelectric Testing
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Radiant Technologies, Inc. specializes in the measurement of electrical and piezoelectric properties of non-linear materials. The Piezoelectric Task captures a sample's displacement as a function of voltage profile along with the sample's polarization response. An external displacement measurement instrument must be attached to a Radiant Precision Test System to make this measurement. All of the Radiant testers are equipped with a high-impedance voltage input to capture the output of a displacement sensor. Every Vision measurement task will collect data from that sensor input simultaneously with the measurement being executed. Radiant's test systems work easily with displacement sensors which include:
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Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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Product
LT-500A Aging-Life Test System For LED Luminaires
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Hangzhou Everfine Photo-E-Info Co., LTD
LT-500A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Eddy Current Testing
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PRÜFTECHNIK Condition Monitoring GmbH
Nondestructive testing systems from Prüftechnik ensure that manufacturers of semi-finished products and their customers obtain the best possible quality. Our eddy current testing systems and sensors provide quality assurance and process control and help you guarantee the security of your investment.
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Product
Testability Director
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Advanced Test Engineering Solutions, Inc.
A spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government''s Testability Program for Electronic Systems and Equipments. But Version 3.1 goes much further, bringing you hundreds of guidelines from IC design through board and system testing.
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Product
SIP-90-4 Test System Interface Probe
SIP-90-4
ICT/FCT Probe
Overall Length (mil): 693Overall Length (mm): 17.60Rec. Mounting Hole Size (mil): 57Rec. Mounting Hole Size (mm): 1.45Recommended Drill Size: 1,45 mm
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Product
Scienlab Battery Test System – Pack Level, 220 KW
SL1730A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Testing of Current Measuring Transformers
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All components from this category can be integrated into an existing current transformer test system. When selecting CT test components, both the type of converter to be tested and the required current are important.
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Product
PCI Precision Resistor Card 4-Channel, 2Ω To 52.4kΩ
50-297-133
Programmable Resistor Modules
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Interface
RP-708
Interface
The RP-708 is a two-channel ARINC 708 weather radar display data bus PMC module interface, supporting variable frame sizes for embedded applications, simulation and test. Abaco Systems provides integrated support for this module on PCI, PCIe, CompactPCI, VME, VXI and native PMC platforms. Each RP-708 channel can be configured as two transmit channels, two receive channels, or one transmit channel and one receive channel simultaneously.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Melt Flow Testers
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nstron®'s CEAST Melt Flow Testers are specifically designed for easy and accurate measuring of the Melt Flow Rate (MFR) and the Melt Volume Rate (MVR). CEAST Melt Flow Testers range from systems that perform a simple manual test procedure to semi-automated testing systems performing multiple weight tests. Our testers meet ASTM and ISO standards.
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
PXI 5W Programmable Resistor Module, 1-Channel, 2Ω to 26.7kΩ
40-252-132
Programmable Resistor Modules
The 40-252-132 is a programmable resistor module with 1 channel which can be set between 2Ω and 26.7kΩ with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Mass Flow Test Systems
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No matter the industry, product integrity is necessary to the manufacturing process. Everything leaks, and mass flow testing provides a fast, reliable determination of leakage to ensure it is within permissible ranges.
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Easy CAN Analysis Tool
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Easy CAN of Peritec made, is CAN analysis tool low price using NI cRIO-CAN and ECU test systems Peritec, PCMCIA-CAN, the USB-CAN.
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Product
In-Line Debug Press
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Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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Product
Temperature Forcing System
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Wewon Environmental Chambers Co, Ltd.
Wewon Technology specializes in the research, development, production and sales of laboratory testing equipment system services. Through more than ten years of accumulation in the field of equipment, the business of wewon Tech is mainly divided into three fields, namely optical communication, automobile and new energy industry.Specialized equipment from Wewon Environmental Chambers Co., Ltd. includes thermal stream instrument, environmental chambers, walk in chamber, salt fog test chamber, vibration testing machine, xenon lamp aging tester, ultraviolet weather testing equipment, tensile testing machine and various IP protection level test equipment. The system characteristic of Wewon Tech thermal stream temperature test system as below technical parameters mentioned.https://www.wewontech.com/temperature-forcing-system/
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Product
Scienlab Measurement And Control Module
SL1064B
Communications Module
The Measurement & Control Module SL1064B is a rack-mount gateway for CAN- and LIN-buses with up to 6 channels. It can be used as a configurable communication interface between Scienlab Battery Test Systems and devices under test (especially their BMS) as well as additional components using CAN communication.
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Solar Simulators
TriSOL CPV
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Concentrating Photovoltaics (CPV) has the promise of producing solar cells with high cell efficiencies, which result in a reduction in the cost of operating a PV module. However, a CPV system requires the integration of CPV solar cells, modules and CPV optics into one efficient system. OAI’s focus is CPV cell testing methodology. The CPV cells can now be tested using OAI’s advanced standalone CPV Simulators for low dose and high dose configurations. The low dose CPV Solar Simulator provides exposure up to 50 Suns, whereas, the high dose CPV Solar Simulator provides exposure up to 1500 Suns. The low and high dose simulators provide exposure in varying Sun concentrations in various beam sizes from 1.5cm x 1.5cm to 7.5cm x 7.5cm, and may be configured with OAI’s I-V Test Systems.
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Test Program Development
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Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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AXIe Chassis and Controllers
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AXIe is a new open standard for high-performance, modular instrumentation, and incorporates the best features of other modular formats including VXIbus, LXI and PXI. Keysight has designed a new line of scalable chassis in this new format. Along with controller options, these new AXIe chassis will form the basis of a high-performance, AXIe-based test system.
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Product
PXI 40Amp 14Volt 4xSPST Automotive Relay
40-180-101
Relay
Models 40-180/181 are High Power Relay Modules available with 2 SPST, 4 SPST or 2 SPDT contacts. They are capable of switching inductive/capacitive loads up to 40A at 14VDC or 20A at 28VDC. The 40-180/181 High Power Relay Modules are suitable for switching heavy loads or for slaving large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of D.C. voltage at high current. The 28V version is suitable for truck system test applications.
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Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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8-Channel 4-Quadrant Source Measurement Unit (SMU)
PXIe-9908
Source Measure Unit
The PXIe-9908 is a high-density SMU module designed for automated testing and mini/micro LED wafer probing applications. It supports precision sourcing and measurement up to ±100V and 100mA, with scalable configurations. With compatibility across major operating systems and programming languages, it delivers fast, accurate, and reliable testing performance tailored for automated test systems and next-generation display technologies.
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Functional Test
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Functional test systems offer users the ability to test boards in a real world environment, checking that they function as designed by stimulating inputs and monitoring outputs. Often whole suites of boards have similar functions and this is where a generic functional tester offers large benefits over more bespoke solutions.
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Product
PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
Digital Waveform
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Open Frame Chassis
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The Hartmann Electronic Open Frame Development Chassis Series is our most diverse system yet. Available for 3U or 6U, with 34HP or 50HP with space for up to 12 slots, this versatile test system is sure to be an engineer’s best friend. A strong frame with an adjustable locking grab handle, along with a light-weight design make our Open Frame Chassis the perfect companion for easy transport from the lab to the testing grounds.
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Product
Battery Simulator
1200
Battery Simulator
The Battery Simulator 1200 provides isolated channels to simulate battery sink and source characteristics often used for testing a Battery Management System (BMS). The instrument can be used standalone with the soft front panel, or integrated into a larger test system. Its proper industrial cooling and cell channel isolation allows units to be easily stacked, providing solutions with over 200 channels of simulation capability. The built-in channel voltage and current readback reduces the need for external monitoring equipment.
