Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Surge Generator
Surge Generator is the backbone of underground cable fault locator test systems. Surge Generator is used with a Prelocator for fault distance measurement and also used with a PinPointer for pinpointing the fault spot.
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MB-OFDM Protocol Test System
WiMedia Explorer 300
The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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DynoLAB Test Cell Supervisory System
SAKOR Technologies’ DynoLAB™ data acquisition and control systems offer reliable, cost effective automation of all types of dynamometer test systems. As with all SAKOR products, the DynoLAB system undergoes a continuous program of upgrade and improvement, regularly expanding and enhancing DynoLAB’s capabilities.
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SSD Test Systems
MPT3000HVM / MPT3000HVM2
As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.
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Surge Arrestor Testing Equipment
SA 30i+
SA 30i+, the wireless Leakage Current Analyser from SCOPE is a State of the Art, On-line test system for Residual Life Assessment of Metal Oxide Surge Arresters. The instrument measures and directly displays the values of Total Leakage Current and Third Harmonic Resistive Leakage Current. It provides system harmonic compensation as per IEC 60099-5-B2. It provides Corrected Resistive Leakage Current after applying correction factors for change in system voltage & temperature.
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PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 472Ω
40-251-020
The 40-251-020 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 472Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Scienlab Battery Test System – Pack Level
SL1700A Series
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increase the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 90 and 270 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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SRS-200A Spectral Radiation Safety Test System
Hangzhou Everfine Photo-E-Info Co., LTD
SRS-200A is a new generation of portable photo-biological safety test and evaluation equipment. Based on the mainfunctions of the laboratory spectral radiation safety test system, the convenience and operability of test are fully considered.To some extent, the analyzer makes up for on site measurement insufficiency.
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Test System
ETS788
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Aerospace and Aviation Solutions
SCOEs and EGSEs by LXinstruments are used during test and validation of satellite assemblies and modules in aerospace applications. As an example, we implemented solar array simulators, battery simulators and high-power load racks for a German satellite manufacturer for testing satellite power supply systems. Due to the high power ratings, the systems are partially equipped with water cooling. Specialized switching modules were developed for switching DC currents at high voltage levels; these can be programmed with SCPI commands via Ethernet.Our modular OTP² functional test platform is ideally suited for implementing durable, reliable test systems, e. g. for in-flight entertainment applications. Since the OTP2 platform is based on open interfaces, it can be quickly and easily adapted to any required communication busses and ARINC interfaces.
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Semiconductor Package Inspection System
NIDEC-READ GATS (Grid Array Testing System) series carry out open/leak circuit tests on semiconductor package (MCM/CSP/BGA).
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Incremental Encoder Simulator
ENC-SIM01
Plant Control and Automation Pty Ltd
This instrument is designed to simulate the function of most types of incremental encoders; it allows the engineer to fully test a control system that uses a rotary or linear shaft encoder, without the need for any mechanical movement.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, SMB
40-878-241
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Flying Probe Tester
FA1817
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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microLED Testing System
OmniPix-ML1000
The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Waveform Generators
Drive your test systems forward with PXI instruments from Astronics. Small size, power-packed, and cost-effective, these waveform generators provide the perfect upgrade for your test bench.
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PXI-2533 , 256-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-33
256-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2533 is a high-density 4x64 PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring solid-state relays (SSRs), the PXI‑2533 offers unlimited mechanical lifetime and the ability to route 55 W simultaneously on all channels. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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PCI To Star Fabric Module
51-921A-001
The use of the StarFabric interface operating at 2.5Gb/s minimizes the impact on system speed. The PCI interface of the 51-921A supports both 32 bit and 64 bit operation and backplane speeds of 33MHz and 66MHz, ensuring the highest speed operation under all conditions. The StarFabric interface ensures the modules perform seamlessly with no impact on the test system software.
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PCI High Density Pecision Resistor Card, 3-Channel, 4Ω To 11.4MΩ
50-298-153
The 50-298-153 is a high density programmable resistor card with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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High Voltage 50 Ω Pulse Generator
TLP-12010A
High Power Pulse Instruments GmbH
The high-current TLP/HMM test system TLP-12010A offers advanced features intended for the characterization of semiconductor devices, discrete components, such as TVS, varistors, capacitors, gas tubes, circuits and systems in the high power time domain. It includes high current I-V characteristics inpulsed operation mode, turn-on/off transient characteristics of the device, breakdown effects, charge recovery effects e.g. reverse recovery, Safe-Operating-Area (SOA) and ESD measurements in general.
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PXI High Density Precision Resistor Module, 3-Channel, 3.5Ω to 395kΩ
40-298-142
The 40-298-142 is a high density programmable resistor module with 3 channels which can be set between 3.5Ω and 395kΩ with 0.5Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Ethernet Interfaces
All of ICS's Ethernet Interfaces conform to the IEEE-488.2 Standard and are fully VXI-11 compatible. Use with any Etherrnet based test system. Complies with LXI VXI Discovery method.
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Cogging Test System
CTS
Magtrol’s Cogging Test System is a stand-alone test system designed to control and measure Detent Torque, Cogging Torque and Friction Torque. The test System includes a precision geared motor, a TS Series Torque Sensor integrating a 5 000 pulses encoder. CTS 100 to CTS 102 have a built-in security clutches to avoid system overload by mishandling when not in use. The geared motor drives the MUT (Motor Under Test) at a low speed from 1 to 10 rpm (respectively 8 rpm for CTS 103 and CTS 104), while acquiring its cogging torque related to angle position.
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Test Operator Platform
TOP
TOP/TRM provide a multi user test run management for your system test bench: Comfortably create tests, run test batches and review results. The execution queue schedules all tests and also allows prioritized single user access.
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Pneumatic Vertical Shock Test System
KRD11 series
KRD11 series pneumatic vertical shock test system is featured with advanced design, high degree of automation and reliability, simple operation and convenient maintenance. The system meets the requirements of both shock and bump test, can perform conventional half-sine wave, post-peak sawtooth wave, trapezoid wave and other waveform shock tests.
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PCI High Density Pecision Resistor Card, 4-Channel, 2.5Ω To 925Ω
50-298-121
The 50-298-121 is a high density programmable resistor card with 4 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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PCI High Density Pecision Resistor Card, 4-Channel, 2.5Ω To 472Ω
50-298-120
The 50-298-120 is a high density programmable resistor card with 4 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
