Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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12/24 CH Insertion Loss/Return Loss Automatic Testing System
CA3201
UC INSTRUMENTS CA3201 12/24 CH INSERTION LOSS/RETURN LOSS AUTOMATIC TESTING SYSTEM is special designed for MPO/MTP fiber cable and multi-channel fiber optical devices like PLC device. It also can be easy changed into AWG DWDM devices testing system ifwe change 1310 /1550 nm light source into UC INSTRUMENTS’ tunable laser source.
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Defined CRPA Test System
BroadSim Wavefront Software
Protecting your GNSS systems from jamming and spoofing is more critical now than ever before. BroadSim Wavefront was designed to enable easier and more affordable CRPA receiver testing, leveraging proven software-defined architecture.
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Plug-in Test Systems
FAME is the innovative, modular plug-in test system for measuring and testing tasks in protection technology for medium-voltage and high-voltage switchgear. The plug-in test system combines complex switching operations for testing the function of current transformers and voltage transducers, as well as tripping and signal contacts.
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Battery Management Systems Testing
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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Solid Oxide and Molten Carbonate Fuel Cell Test Stations
Greenlight''s SOFC test systems include options for integrated reformers, de-sox, gas mixing, water saturation, pre-heating, furnace, heat recovery and water balance. These SOFC test rigs can be configured to operate on gaseous or liquid fuels, with operating temperatures up to 1000C. Pressure control is optional and furnaces can be tailored for either planar or tubular cell configurations. For single cell or button cell testing, Greenlight offers the X20 table-top SOFC test bench, including furnace and optional fixtures.
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Power Frequency Series Resonant Test System
HTZX(L) / 140
Wuhan Huatian Electric Power Automation Co., Ltd.
AC withstand test for single hydrodynamo with capacity of 250MW or less.
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HPx-310 Radar Signal Output Card
The HPx-310 Radar Signal Output card is a replacement for the HPx-300, form, fit, and function. It generates representative radar signals for system testing, simulation, training or radar video streaming. Under software control, the card generates radar video, trigger and azimuth signals similar to those generated by real radars.
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Tooling And Fixturing
Control develops and supplies fixtures and test accessories :*For a vast field of applications - ICT (In-Circuit Test), functional test, Flash programming, EoL (End-of-Line) test systems, etc.*For all handling systems currently used in the market: online or offline, mechanical, pneumatic or vacuum operation*From simple mechanical fixtures, with a few hundred probes and low production volumes, to highly complex accessories with thousands of probes, double-sided probes, double acting, etc.
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Fixed Laser Source Module
Keysight offers a broad choice of fixed laser sources, which are available as single-wavelength and dual-wavelength modules as part of the Keysight Lightwave Solution Platform. The Keysight 8165xA Fabry-Perot laser sources can be used in conjunction with optical power meter modules for insertion loss, optical return loss and PDL measurement of broadband components and fiber. The Keysight 81663A Distributed Feedback Laser Sources are best suited for amplifier test and WDM system test applications. Keysight covers PON and common WDM wavelengths with its 81663A Distributed Feedback (DFB) laser source modules. The precise tunability around ITU-grid center wavelength gives you the flexibility to match test setups to the latest requirements of the DWDM-system. The fine-tuning allows to shift the center wavelength from one DWDM transmission channel to the adjacent channel in dense WDM systems. The built-in isolator ensures highest laser stability, even when reflections are present in the optical path.
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PCI Precision Resistor Card 4-Channel, 2Ω To 102kΩ
50-297-134
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI High Density Precision Resistor Module, 9-Channel, 3Ω to 13.6kΩ
40-298-031
The 40-298-031 is a high density programmable resistor module with 9 channels which can be set between 3Ω and 13.6kΩ with 0.25Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test Chamber for Dynamic Vibrators
The focus of the Feutron climate simulation overall concept is on the simplest operation of the overall functions of the test systems and the highest reliability with maximum efficiency. This is why our systems are supplied as plug-in compact devices.
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PXI Precision Resistor Module 3-Channel, 2.5 to 395k
40-297-142
This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Automatic Hardness Testing System
AMH55
Maximize your productivity and easily measure impressions on various surface conditions for a wide number of applications with LECO’s new AMH55. The AMH55 introduces LECO’s innovative Cornerstone® brand software to our hardness testing platforms, for increased usability, simplified reporting, and streamlined analysis times. Supporting accurate and efficient microindentation and Macro/Vickers hardness testing in fully automatic, semi-automatic, and lite configurations, the AMH55 is a valuable resource for users needing precise and productive hardness testing while tailoring the data and results to their needs.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 2Ω to 13.6kΩ
40-251-131
The 40-251-131 is a programmable resistor module with 2 channels which can be set between 2Ω and 13.6kΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 5W Programmable Resistor Module, 4-Channel, 1Ω to 122Ω
40-252-012
The 40-252-012 is a programmable resistor module with 4 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Test System
MxDSRC™
The MxDSRC Test System simulates systems in the vehicle that interact with the DSRC radio module to create tests closely replicating real-world scenarios. Its integrated approach allows the DSRC components, such as RF quality and protocol conformance, to be exercised with multiple system components. MxDSRC provides a powerful and easy-to-use framework for testing your DSRC system.
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Test & Test Development for Circuit Card Assembly
Teledyne Advanced Electronic Solutions performs comprehensive testing at the CCA and system level assembly. Teledyne AES can perform testing developed by the customer or develop a complete test strategy for the customer’s products.- Bed of Nails FixtureIn-Circuit Test (Bed of Nails) or Flying Probe Testing for rapid feedback on CCAs- Functional testing of CCAs or complete systems- Environmental testing to include vibration, thermal cycling, HASS, etc.- CCA and system level test development- High frequency testing – currently to 40 GHz- High power system testing – currently to 4kW
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High Voltage Test & Measurement System
Hard-wearing and technically-sound High Voltage Test & Measurement System is developed to provide accurate results. These systems are widely used in power, electrical, engineering and other industries. They are designed using heavy-duty spare-parts to add strength with life to the systems. They are ideal to provide accurate results without any flaw to ensure to provide the best performance. These systems are perfect combination of easy usage, durability and high accuracy in results.
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PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope
780319-02
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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HV Test System up to 20000 Volt
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Advanced Diagnostics for ScanExpress™ JET JTAG Embedded Test Solutions
ScanExpress JET Advanced Solutions
ScanExpress JET advanced diagnostics add additional diagnostic resolution with fully automated analysis translating functional test results to down to the net and pin level, even with BGA packages.The seamless integration with ScanExpress JET and ScanExpress Runner as well as the ability to output ScanExpress Viewer fault reports for PCB visualization make ScanExpress JET Advanced Diagnostics a must-have tool for any JTAG test system.
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Industrial Vibration Sensor
IVS-500
The new IVS-500 Industrial Vibration Sensor is the key to fast acoustic quality inspection, structure-borne noise analysis and reliable pass-fail decisions. This Laser sensor measures reliably, in demanding industrial environments, without contact and therefore without wear and on virtually all surfaces. Costs and yields are therefore optimized by reducing false rejects in the production and assembly process. The simple setup and ruggedized sensor design of the IVS-500 enable a smooth integration into production test systems. Complemented with the software tool QuickCheck, Polytec offers a comprehensive solution for reliable pass/fail analysis.
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TestStation LX2
The TestStation LX2 is Teradyne’s largest pin count in-circuit test system. Configurable up to 15,360 pins utilizing UltraPin II 128HD pin cards for testing large, complex, and heavily-integrated printed circuit board assemblies.
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Saluki S8723X Series USB CW Power Sensor (9kHz - 40GHz)
S8723X series is a diode detector USB power sensor based on a USB 2.0 full-speed/high-speed adaptive interface. It has a wide frequency range and large power dynamic range. It can be connected to a computer or other electronic measuring instruments, easy to set up a power test system, particularly useful for field and other low-cost production line testing and power testing.
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Drive-Train/Power-Train Performance/Endurance Test System
This system is suitable for engine drive test or transaxle test of HEV/EV in combination with the real-time model calculation by the measurement/control panel and low inertial motor. Simulation test of an actual vehicle running condition can be executed by modeling a real tires or an engine. The tires and vehicles are modeled by MATLAB® / Simulink®, so they can be evaluated under various conditions by changing parameters or replacing models.
