Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Fully Automatic Tensile Testing System
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This is a fully automatic tensile testing system for metals. The system is fully automated from supply of specimens, measurement of specimens, tensile testing, recovery of specimens, and data processing, and is capable of continuous nighttime testing.
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Product
Connector and Breakout Box
ES4640
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The ES4640 Connector Box offers a standardized wiring and connectivity for HiL testing systems in the powertrain domain. Its front panel provides connectors for the ECU, CAN bus communication, on-board diagnostics, and LEDs for ignition and injectors. Its rear panel connects loads, failure simulation, and other components. Sample applications of the ES4640 are closed loop HiL systems for 8 cylinder gasoline and diesel engine ECUs.
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Product
The Language of Technical Computing
MATLAB
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MATLAB is a high-level language and interactive environment for numerical computation, visualization, and programming. Using MATLAB, you can analyze data, develop algorithms, and create models and applications. The language, tools, and built-in math functions enable you to explore multiple approaches and reach a solution faster than with spreadsheets or traditional programming languages, such as C/C++ or Java. You can use MATLAB for a range of applications, including signal processing and communications, image and video processing, control systems, test and measurement, computational finance, and computational biology. More than a million engineers and scientists in industry and academia use MATLAB, the language of technical computing.
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Product
Fully Automatic Eddy Current Crack Test System
ROTO-SCAN
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Foerster Instruments, Incorporated
The fully automatic crack test system ROTO-SCAN was specially developed for the testing of rings. The mechanical equipment has been developed for the gentlest possible handling of the test pieces and features a compact and low-maintenance design. The test probes seamlessly scan the inner and outer contours of the test pieces, thus ensuring 100 % testing of the rings.
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Product
PCI Precision Resistor Card 18-Channel, 1Ω To 122Ω
50-297-012
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Discrete Device Test System
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capability to perform parallel testing of power discrete devices. As the standard specifications of mainframe, 341-TT/P has 1.2kV/20A and 351-TT/P has 2kV/50A capabilities. These systems have 2 testing subsystems, each of which has 4-station capability by multiplexing to 4 handler/prober stations for high volume production testing.
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Product
In-Line Test System
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With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
PCI Precision Resistor Card 3-Channel, 2.5Ω To 201kΩ
50-297-141
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The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
PXI Precision Resistor Module 3-Channel, 3 to 1.51M
40-297-150
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This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Portable Emissions Measurement Systems
PEMS
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SEMTECH® ECOSTAR Plus is a modular suite of ruggedized measurement systems built for the extremes of heavy-duty testing. The system consists of individual, self-contained modules, each with a specific functionality, designed to measure the full range of gaseous and particulate emissions.
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Product
PXI Precision Resistor Module 3-Channel, 2.5 to 201k
40-297-141
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This 3-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 470Ω
40-253-014
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The 40-253-014 is a programmable resistor module with 2 channels which can be set between 1Ω and 470Ω with 2Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
The All-In-One Noise Test System
NXA Series
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Noise eXtended Technologies S.A.S.
The NXA is a fully automated Phase Noise analyzer. Its dual channel architecture allows the system to use a cross-correlation process to cancel its internal noise floor. This reliable technique provides access to the unique noise floor performance of the DCNTS.
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Product
GPIB-ENET/1000, Ethernet GPIB Instrument Control Device - Brazil 127/220VAC
781630-12
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The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Product
Power Module And Device Testing System
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Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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Product
Seno-Con Test System
PANTHER 2K QST
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Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
PXI 5W Programmable Resistor Module, 1-Channel, 2.5Ω to 102kΩ
40-252-040
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The 40-252-040 is a programmable resistor module with 1 channel which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PMA Suite For The PSA/PSL-3000: 802.3at (30W) PSE's
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In-Depth System Testing of 802.3at and 802.3bt 2-Pair PSE's Using PSA-3000 or PSL-3000 instruments. Concurrently Analyze Up To 192 PSE Ports. Robust Emulation of Type-1, Type-2, and Type-3 (Class 4) PD's Including PoE LLDP. Assess PSE Power Administration Decisions. Assess PSE Power Management Behaviors. Static and Transient Reserve Capacity Analysis. Per-Port Variation and Uncertainty Analysis. Assess PSE Power Reliability Over Time.Colorful and Graphical Pop-Up Spreadsheet Reporting. Available to PSA-3000 and PSL-3000 as part of the Live PD Emulation license feature.
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Handset Noise Under RF Test System
BK8021
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If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Product
Protective Cover, G12x, Receiver
310113518
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The Receiver Protective Cover prevents damage to your modules and contacts and keeps your test system in proper working order.
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Product
PXI 5W Programmable Resistor Module, 2-Channel, 1.5Ω to 3.55kΩ
40-252-023
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The 40-252-023 is a programmable resistor module with 2 channels which can be set between 1.5Ω and 3.55kΩ with 1Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Combined Environmental Reliability Test System
VTC SERIES
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HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.
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Product
Voice Quality Test System
MultiDSLA
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MultiDSLA solution is a state of the art measurement system for Voice Quality Testing and Performance Assessment used by many organisations as the reference measurement in applications ranging from core technology development to network operations.
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ATE Test Systems
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Introducing the Procyon ATE System! When it comes to ATE Test Systems for a for low- to high-volume production, Intepro has the testing power you require to be successful. For more than three decades, Intepro Systems has designed, built and integrated power supply test equipment for the world’s largest and smallest power supply manufacturers.
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Modulation Distortion Up To 43.5 GHz
S930704B
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S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Microhardness Testers
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Newage Testing Instruments, Inc.
Newage Testing Instruments offers a range of microhardness testing solutions including the cost-effective MT91 and MS-ZH microhardness testing system.
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Modulation Distortion Up To 90 GHz
S930709B
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S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Field Test Set
MTS-207
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The MTS-207 is a state-of-the-art portable PXI platform for field testing and data acquisition systems. Its proven architecture has been deployed worldwide on multiple programs including the MTS-206 Maverick Missile system flight line tester. The MTS-209 Common Armament Test Set, the AN/TSM-205B Hellfire System test Set, and many more. It combines the capabilities of the versatile and powerful PXI architecture in a compact, ultra-rugged, flight-line qualified enclosure. The MTS-207 is ideal for test and data acquisition applications requiring operation under harsh environmental conditions including flight-line, back-shop, or airborne applications.
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Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
