Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Environmental Chambers
3119-600 Series
The Instron environmental chambers are precision thermal enclosures designed to integrate with static or dynamic test systems, enabling evaluation of material behavior under controlled non-ambient conditions. They circulate hot or cold air over specimens and grips using forced-convection to maintain stable temperatures. These chambers are available in a variety of standard sizes (or can be customized), and are compatible with extensometers, grips, and fixtures to provide a turnkey solution for temperature-dependent testing from subzero to elevated conditions.
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Functional Test
For a functional test the WEETECH test systems simulate reality and enforce switching operations that can only be tested in an embedded condition. In doing so voltages, currents, time intervals and other measurement categories are adjusted and switching sequences are processed in a way, it would happen in reality.
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PXIe-2747, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module
780587-47
PXIe, 2.7 GHz, Dual 8x1 PXI RF Multiplexer Switch Module—The PXIe‑2747 is a PXI RF multiplexer switch module that is ideal for switching RF signals up to 2.7 GHz in production test applications. The high channel count of the PXIe‑2747 makes it well-suited for test systems that require switching a large number of RF signals, such as switching several devices under test to a single channel on the RF analyzer. It also features onboard relay counting for relay monitoring.
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True Concurrent Test
TestStation Duo
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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PXI Precision Resistor Module, 4-Channel, 2 to 6.97k
40-297-130
This 4-channel PXI precision resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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3-Axis Motion Simulators
When a device under test needs to be stimulated with simultaneous movements around three axes, then a product from the ACUTRONIC three-axis motion simulator range is the right choice. Independent motion simulation in three axes makes them very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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COLOSUS
The COLOSUS line of electro-optical test systems from Santa Barbara Infrared Inc. and Labsphere Inc. include collimated optics, software and uniform sources for the optical characterization of sensors and cameras.
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Comprehensive Simulation of Master, Slave and End Nodes in A 2 B ® Networks
Infotainment Test Device ITD 1024
The complexity, cost and weight of audio systems are significantly reduced with the Automotive Audio Bus (A 2 B ® ) from Analog Devices Inc. Regardless of their hierarchical structure or use as master or slave, all A 2 B ® products must be adequately tested before use. This applies, for example, to HiFi amplifiers/loudspeakers, head units, eCall systems, microphones, vibration/noise suppression units, actuators or sensors.Our small and very compact infotainment test system ITD 1024 takes on this task for you: It comprehensively and extremely reliably tests all A 2 B ® signals and communication in all phases of the product development process - during development, for validation and in production.
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ESS Performance Test System
The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.
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PXI RF Analog Signal Generator
PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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PCI Precision Resistor Card 4-Channel, 1.5Ω To 472Ω
50-297-120
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Power Transformer Automatic Test Device
XD71
Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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Immunity Testing Systems
CIS Series
The CIS series test systems are configured to perform conducted immunity testing according to IEC 61000-4-6. The system includes an ACS series power amplifier, coupling/decoupling Network (CDN), directional coupler, 150Ω to 50Ω adapters, power attenuators, cables and [optional] CSAT software. These systems, when properly configured, are capable of testing your products to all levels given in IEC 61000-4-6 up to 230 MHz. You can choose from three systems. Follow the links below for detailed information, including a comprehensive datasheet listing system specs.
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The Language of Technical Computing
MATLAB
MATLAB is a high-level language and interactive environment for numerical computation, visualization, and programming. Using MATLAB, you can analyze data, develop algorithms, and create models and applications. The language, tools, and built-in math functions enable you to explore multiple approaches and reach a solution faster than with spreadsheets or traditional programming languages, such as C/C++ or Java. You can use MATLAB for a range of applications, including signal processing and communications, image and video processing, control systems, test and measurement, computational finance, and computational biology. More than a million engineers and scientists in industry and academia use MATLAB, the language of technical computing.
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JTAG External Modules for Cluster Test
JEMIO
The JTAG External Modules JEMIO™ for Cluster test are intended to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system. For many designs, Boundary-Scan has adequate access to on-board signals, but signals that go off the board often cannot be tested by a JTAG tester. By adding JTAG access to these off-board signals, JEMIO™ modules can increase the board's JTAG test coverage, possibly reducing the need for implementing another test method or for developing alternative tests to reach the required level of test coverage.
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PXI-2546, 2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module
778572-46
2.7 GHz, 50 Ω, Dual 4x1 PXI RF Multiplexer Switch Module—The PXI‑2546 is an RF signal multiplexer switch module. The multibank architecture of the PXI‑2546 makes it ideal for test systems that require parallel operations such as RF stimulus-response testing. The module also provides excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use the onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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PXI High Density Precision Resistor Module, 9-Channel, 2.5Ω to 472Ω
40-298-020
The 40-298-020 is a high density programmable resistor module with 9 channels which can be set between 2.5Ω and 472Ω with 0.125Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Adapters
BroadWave designs and manufactures Coaxial Adapters and other coaxial RF components that are ideally suited for test, verification and system integration. Our products offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.
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TTESync For VxWorks 653
TTESync is a synchronization component that allows tight synchronization of VxWorks 653 partitions to the fault-tolerant system-wide cycle time of the TTEthernet communication network. All partitions executed on different modules can be “pinned down” within the overall system cycle time, thus enabling the lowest latency and minimum jitter in message exchange among distributed functions. At system level this results in clean layering, well-understood functional interactions and simpler application design, testing and system integration. System architects can reduce system complexity and further optimize system size, weight, power (SWaP) and life-cycle costs.
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OLED Life Time Test System
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD E-Series
The world’s most comprehensive test systems to completely characterize augmented reality, virtual reality, mixed reality, and heads-up displays (AR, VR, MR and HUDs) by truly emulating the human eye and conforming to the latest standards being developed by the IEC and SID.
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ATE Development Services
Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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PXI Precision Resistor Module 4-Channel, 1.5 to 3.55k
40-297-123
.This 4-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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±6 kV ANSI/ESDA/JEDEC HBM Test System
HBM-TS10-A
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*Wafer, package and system level HBM testing*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*No trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT HBM current sensor for real time transient current monitoring with 1V/A output sensitivity into 50 Ω digital oscilloscope input*Integrated DUT HBM voltage sensor for real time transient voltage monitoring with 1/200V/V output sensitivity into 50 Ω digital oscilloscope input*Integrated overvoltage protection of the DUT voltage sensor, DUTcurrentsensor and DC test interface for efficient overload protection of the digital oscilloscope and SMU during high voltage HBM testing*Integrated DC test DUT switch with automatic switch control*Integrated 50 Ω precision hardware trigger output for high speed digital oscilloscopes*Fast HBM measurements, typically 0.5s per pulse including one-point DC measurement between pulses*Eficient sofware for system control and waveform data management (fully compatible with TLP measurement data)*The sofware can control automatic probers for fast measurements of complete wafers*Compact size 145 mm x 82.5 mm x 44 mm of the integrated HBM pulse generator probehead*System controller size 483 mm x 487 mm x 133 mm*High performance and high quality components*Optionally available hardware upgrades to all HPPI fully integrated HBM/HMM/TLP/VF-TLP test systems TLP-3010C, 4010C, 8010A, and 8010C
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LM-79 Moving Detector Goniophotometer
LSG-5000
Moving Detector Goniophotometer completely meets LM-79 Clause 9.3.1 and EN13032-1 clause 6.1.1.3 goniophotometer type 4 requirements. The LSG-5000 is an automatic light distribution intensity 3D curve testing system for measuring light. The measuring distance is from 5m to 30m. It can measure all types of lighting sources, LED or HID luminaires such as indoor and outdoor luminaires, roadway luminaires, street lamps, flood lights and other kinds of luminaires.
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Surge Arrestor Testing Equipment
SA 10i
SA 10i the Leakage Current Meter from SCOPE is a State of the Art, hand held, on-line test system for Residual Life Assessment of Surge Arresters. The instrument measures and directly displays the values of resistive and total leakage current.
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Software & Hardware Interface
XJAPI
The XJAPI is a simple-to-use DLL Application Program Interface (API), designed to give you low-level access to the JTAG chain via either the XJLink or the PXI hardware, allowing easy integration with a wide range of other systems such as development/evaluation boards, test systems
