Product

Smart Refrigerant Probes Deluxe Kit w/ Vacuum Gauge

HUB8

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UEi Test & Measurement Instruments

HUB8 - UEi Test & Measurement Instruments

The HUB8 Smart Refrigeration Probes Deluxe Kit is the most complete and convenient wireless refrigeration probe kit available today. The HUB8 makes it easier for you to service and charge air-conditioning and refrigeration systems. The addition of the wireless Vacuum Gauge and Outdoor Thermometer probe integrates real-time Target Superheat, Evacuation and Rise Test calculations into the App. This provides a more accurate, efficiency and cost-effective charge on the system allowing all your vacuum, refrigeration and air parameters to be viewed from one location.

Product

Solder-In Lead for ZD Differential Probe Qty 2

PACC-ZD002

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Teledyne LeCroy

PACC-ZD002 - Teledyne LeCroy

Solder-in lead for ZD differential probeQty 2

Product

30A, 100MHz High Sensitivity Current Probe

CP031A

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Teledyne LeCroy

CP031A - Teledyne LeCroy

Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.

Product

Flying Probe Test System

A8a

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Mycronic

A8a - Mycronic

The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.

Product

Low-leakage Switch Matrix Family

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Keysight Technologies

Keysight Technologies

Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

Product

OmniScan X3 & OmniScan X3 64

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Evident Scientific

Evident Scientific

Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM.

Product

A-/B-Scan Thickness Gauge For NDT

SONOWALL® 70

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SONOTEC GmbH

SONOWALL® 70 - SONOTEC GmbH

SONOWALL 70 is the first thickness gauge in the market with intelligent probe identification. The extended probe management allows probe-specific information such as DAC-curves, delay lines, and serial numbers to be saved directly in the ultrasonic probe. In addition to various thickness applications, the device can be upgraded to a full-function flaw detector.

Product

Radiometric Probe for UVB Irradiance

LPUVB03BLAV

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Senseca

LPUVB03BLAV - Senseca

The LPUVB03BLAV probe measures global irradiance (W/m²) on a surface area (m²) in the UVB (280 nm…315 nm) spectral region. In particular, the spectral sensitivity is focused at 305 nm, with a bandwidth (FWHM) of 5 nm. The global irradiance is the result of the sum of direct solar irradiance and of diffused irradiance incident on a planar surface.

Product

K Thermocouple Penetration Probe

TP660

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Senseca

TP660 - Senseca

“K” Type thermocouple penetration probe. Tolerance according to IEC 60584-2 standard.

Product

Wafer Test Solutions

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AEM Holdings Ltd

AEM Holdings Ltd

Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.

Product

DDR4 Protocol Debug And Analysis Solution

U4972A

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Keysight Technologies

U4972A - Keysight Technologies

The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.

Product

Eddy Current Test System

CIRCOGRAPH® Product Family

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Foerster Instruments, Incorporated

CIRCOGRAPH® Product Family - Foerster Instruments, Incorporated

The CIRCOGRAPH eddy current test system with rotating probes guarantees maximum detection sensitivity for exposed longitudinal surface defects on bright material. The test system is primarily used for wire drawing machines, Cu tube rewinders, and finishing sections in the bright steel sector. The individually tailored test systems by FOERSTER can be fitted with rotating sensors or CIRCOSCAN rotating discs. They scan flat and profiled material, e.g. when testing rails and billets.

Product

500 MHz Passive Probe for WaveJet Touch, 10:1, 10 MOhm

PP006D

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Teledyne LeCroy

PP006D - Teledyne LeCroy

Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.

Product

Combined Pressure and Temperature Transducers

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Variohm Eurosensor Ltd

Variohm Eurosensor Ltd

We offer some different styles of combined pressure and temperature transducers which are well suited to Motorsport applications.  These include the EPTT5100 combined pressure and temperature transducer, which, has an internal temperature sensor, and the miniature EPTTE1400 combined pressure and temperature transducer which has an external temperature probe.

Product

Piers and Jetties Testing Equipment

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Buckleys Ltd.

Buckleys Ltd.

The BathyCorrometer is a diver-held unit which will measure the corrosion potential at specific contact points. Although the readings are visible to the diver, a Surface Display Unit can be supplied to verify readings on board a ship or diving platform. If Remotely Operated Vehicles (ROVs) are being used, the UCP1A contact probe or UCP1B proximity probe can be easily installed to carry out corrosion surveys. Simple surveys of marine structures can be carried out by the use of a Marine Survey Kit (see the case study on Dover Harbour Board).

Product

Small IC Adapter for ZD Differential Probe Qty 2

PACC-ZD006

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Teledyne LeCroy

PACC-ZD006 - Teledyne LeCroy

Small IC adapter for ZD differential probeQty 2

Product

Flying Probe Tester

FA1817

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HIOKI E.E. Corp

FA1817 - HIOKI E.E. Corp

Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.