Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1B-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Service Testers
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Service tester with receiver probe, laser pyrometer, alligator clip cable, 10 inch handle, manual and standard bag.
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Product
DH Series PT Browser Tip, 16 GHz BW, 3.5 Vpp Range
DH-PT
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
Standard 0.70 (2.00) - 1.70 (4.80) General Purpose Probe
P2662AG-2V1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe
POGO-1I-6-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 230gf
K100-A080230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Product
Broadband Field Meter
NBM-520
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*Intelligent probe interface detects the probe parameters*Fully automatic zero point adjustment*PC software for convenient data management
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Product
Probes & OEM Modules
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Measure and monitor humidity, dew point, carbon dioxide, moisture in oil, temperature, pressure, and vaporized hydrogen peroxide.
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Product
Engine Performance/Endurance Test System
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Various types of test system as follows can be built up in combination with measurement control equipment and peripheral instruments (fuel flow meters, actuators, temperature control device, combustion analysis system, ECU monitor, OBD, sound and vibration measurement instruments, emission analyzer, smoke meter etc.)·Traveling fuel economy test·Gas emission test·Output performance test·Deterioration/endurance test·Combustion analysis·Sound source probing
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Product
Full Wafer Test System
FOX-1P
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Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Product
Concentric Pen Probe
807
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This miniature concentric ring probe allows for small areas to be measured for surface resistance in accordance to ANSI/ESD STM11.11-2006 when connected to a resistivity meter or megohmmeter.
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2G30-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Test Fingers & Probes
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Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25A-16
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
The Nanoworkbench
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In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary.
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Product
WLCSP Probe Heads
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Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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Product
Scanner Probe
RFS set
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The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Product
Vibration Analyzers
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A vibration analyzer measures and assesses the machinery condition using vibration sensors such as accelerometers, displacement probes, and velocity pickups.
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Product
Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-1P-4-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Adapter/Stainless Steel
WADP-24FSF
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Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Product
NIR & UV-VIS Process and Lab Analyzers
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The optical or spectrum analyzer is the brain which transforms the signal collected by the sample interface into actionable information. Guided Wave sample interfaces (probes, flow cells) are designed for use with NIR or UV-Vis fiber optic coupled analyzers. They are designed to be rugged and reliable in harsh chemical and physical process conditions while providing optimal light transmission for long-term reliable measurements. More information is available about specific analyzers on each product page or on the process analyzer product overview.
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Product
Spread Resistance For Slanting Polished Sample Of Semiconductor By Tow Kinematically-mounted Probe Contacting .
SRS-2010
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*Resitivity map along with depth direction, thickness of epitaxial , depth of PN junctin and carier density profiles
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Product
Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0B
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe
POGO-1T-8
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Alternate 1.00 (28.00) - 2.00 (57.00) General Purpose Probe
P2663G-1V2S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
Passive Probe, 20:1, 500 MHz, 1.3 M
N2875A
Oscilloscope Probe
A compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Product
Super Silicon Resistivity and Type Tester
HS-3FC II
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Super Silicon Resistivity and Type Tester is specially designed for silicon sorting,it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Product
Temperature Logger for Thermistor Probe
TGP-4020
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Loggers with probes can be used to record temperature in awkward to reach areas or applications where a fast time response is required. A versatile range of probes are available for this unit and can measure between -40 to +125C. Like the logger, probes are waterproof to IP68.





























