Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
Battery Probes
Battery Probe
Offer a wide range of terminations for SMT, PTH or double-ended probes for simplified hardware mount solutions.
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Product
Test Thorn Probe
CX-41
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Shenzhen Chuangxin Instruments Co., Ltd.
Test Thorn Probe For testing accessibility in appliances with visibly glowing heating elements.
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Product
CryoPulse
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Metis Instruments & Equipment NV
Measurements in up to 50 T environments. Cryogenic measurement environment with temperature control from 4K up to room temperature. Modular architecture with easy upgrades to higher energies & higher peak fields. Fast sample exchange possible. Large set of measuring probes for various applications
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1I-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
RTD Thermometer
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Tel-Tru® Manufacturing Company
Tel-Tru RTD probe assemblies and RTDs integrated with a compact transmitter are designed for precision temperature measurement in demanding sanitary or industrial environments. RTDs are configurable with many options to meet the needs of dairy, beverage, food, pharmaceutical and chemical processing applications.
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Product
T3DSO Passive Probe, 350 MHz, 10X, 10 MOhm, 300V/600V
T3PP350A
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Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.
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Product
Thermistor Temperature Probe
E2308A
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The Keysight E2308A is a general purpose temperature probe. The thermistor (5 k ohm at 25 degrees C) is encapsulated in a stainless steel case and typically used for liquid temperature measurements.
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Product
EPA General Purpose Probes
General Purpose Probe
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Product
8:1 IR Thermometer w/ Circular Laser
INF145
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UEi Test & Measurement Instruments
The INF145 features circular laser targeting, HACCP Danger zones, a built-in probe and NSF certification making it ideal for food environments.
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Product
Current Probes
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Current probes allow you to measure DC or AC current. Yokogawa's selection of current probes allow measurements ranges up to 500 ARMS and bandwidths up to 100MHz.
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Product
Dry Bulb Temperature Probe for WBGT
TP3207.2
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Dry bulb temperature probe used for calculating the following indices: IREQ,WCI, DLE, RT, PMV, PPD, WBGT, SR and mean radiant temperature. Pt100 sensor.
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Product
Stand-Alone Test Fixture
MA 2012/D/H/GR2270/71
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 17,00 kg
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Product
RF High Frequency Probes
High Frequency Probe
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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Product
Special Durometer
HD3000L
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Hildebrand Prüf- und Meßtechnik GmbH
Type 1: Slim Probe 1, foot DIA. 8 mm for hard to reach areas or irregular shapes.Type 2: Chisel shaped (angled foot) for hard to reach or narrow areas.Type 3: Slim Probe 2, DIA. 5.0 mm. A thinner foot for reaching hard to get places or irregular shapes. Custom designed durometers conform to the Hildebrand Company standard.
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Product
Low Voltage Differential Oscilloscope Probes
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Differential signaling used in high speed serial standards requires very accurate characterization. The industry-leading bandwidth and signal fidelity found in a Tektronix low voltage differential oscilloscope probe ensures that you see every possible detail. Tektronix offers TriMode™ architecture which streamlines measurement acquisition by enabling you to make differential, single-ended, and common mode measurements with a single connection!
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1T24-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-H150-3
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25I40-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Radius, Straight Shaft Bullet Nose, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0J
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
Optical Voltage Probe
400-02
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Srico’s optical voltage probe uses advanced, proprietary optical chip technology to achieve precise, interference-free measurement. Our sensor and optical fibers are made of dielectric materials. This facilitates a high degree of isolation between the voltage test point and the instrumentation system ⎯ at a safe distance of 100 meters and more. This system senses, measures, and transmits electrical data very accurately.
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Product
Sub-Micron Probe Positioner
QP150 Series
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Quarter Research and Development
Quater’s new QP150 sub-micron probe positioners are designed to significantly reduce mechanical crosstalk between axes resulting in fast and accurately placed probe touchdowns with zero pad or trace damage from unwanted needle deflections. Overall ergonomic design places micrometers within a compact zone allowing users to precisely control needle direction and speed.
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Product
33 GHz Optical Probe
DPO7OE1
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The DPO7OE1 is a 33 GHz, low noise, broad wavelength optical probe with optical reference receiver (ORR) performance for 28Gbaud PAM4 and PAM2 (NRZ). The DPO7OE1 can be used as a conventional Optical-to-Electrical (O/E) converter for wide-bandwidth optical signal acquisition. The DPO7OE1 provides an FC/PC or FC/APC optical connection for Tektronix DPO/MSO70000 C/DX/SX model oscilloscopes for high-speed optical signal verification.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-1Z1-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Service Assurance Remote Probe for IPTV, OTT, VoiP & Internet
µNET
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The μNET is a palm size probe for testing and monitoring Triple-Play services (IPTV, VoIP, Internet) at the customer set top box or the last mile concentrator (ie.GPON mux). Multiple μNET probes can be used throughout the IPTV network on a temporary or permanent basis. Test results are sent to the external FTP server. All tests are performed in a cycle set up by the user.
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Product
Wireless Functional Test Fixtures
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Circuit Check’s wireless fixture technologies reduce debug time, simplify ECO’s and reduce maintenance. This allows for the highest test performance, ability to probe denser smaller targets and achieve ultra-high node counts. Higher density more complex circuit boards complicate testing requirements. Smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board (T-Board).
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Product
Interchangeable Probe Active Transmitters
HD2817T…Series
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The instruments of the HD2817T… series are transmitters, indicators, and ON/OFF regulators with data logging functions, they measure temperature and humidity. The instrument has a large, backlighted, graphical display.
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Product
LED Probes for testing
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Advanced Probing Systems, Inc.
Probe Needles are used for the fabrication of most probe cards, however there exist applications for which these materials may not be appropriate, e.g., hubrid device and gold pad probing.
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Product
Probe Interfaces
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Renishaw's range of interfaces makes it easy to connect a probe to your machine's controller.





























