System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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HIL/V&V Solutions
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SPHEREA designs test systems derived from our modular platform for V&V applications, for the whole development chain, from design to qualification
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Product
PCI Resistor Card 4-Channel 1 Ohm To 127 Ohm With SPDT
50-293-112
Programmable Resistor Modules
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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In-Circuit Test Systems For Sale
Test System
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Scalable Multi-Channel Active Thermal Control (ATC)
T-Core Thermal Control System
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Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.
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PXI Embedded Controller
PXI-3982
Controller
The ADLINK PXI-3982 PXI embedded controller, based on the 6th generation Intel® Core™ i7 processor, is specifically designed for hybrid PXI based testing systems, delivering a rugged yet stable platform for a wide variety of testing and measurement applications.
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Product
PCI Precision Resistor Card 6-Channel, 2.5Ω To 1.51MΩ
50-297-044
Programmable Resistor Modules
The 50-297 PCI Precision Resistor card provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Battery Module/Battery Pack Test
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The battery test system CT3001B and CT3001D provide solutions for battery module/battery pack test with higher current/voltage. They can also be used in situations that batteries are charged/discharged at high rates. Different current/voltage range and channels numbers can be custom made based on the requirement.
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9050 Rack Mount
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The rack mountable 9050 50 Module Receiver is designed to accept 9025 and 9050 ITAs and is ideal for systems with advanced mass interconnect requirements. The 9050 can be adapted to accommodate vacuum or mechanical fixturing. Connector modules can be intermixed for creating custom interfaces ideal for functional and system testing applications.
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Ground Grid Tester
GGT Series
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The GGT500 ground grid integrity tester is designed for inspection of the substation ground grid. It can also be used as a portable micro-ohmmeter with Both Sides Grounded and Remote Control functionalities. It is intended to inspection the conditions of a grounding system beneath substations, testing of medium- and high-voltage circuit breakers, disconnecting switches, high-current bus bar joints, cable splices, and different high-current links.In the United States when inspecting the quality of the grounding systems beneath a substation, the proper procedure is to inject 300 A DC during a time period of 60 s. This is what the GGT500 will do, and in that time period, the current path and voltage drop are checked. Also acting as a micro-ohmmeter, the GGT500 can test low resistance values by producing high test currents of up to 500 A.The instrument is placed in an unbreakable, plastic case with IP67 protective rating (with closed lid). Although very portable and lightweight, micro-ohmmeters have very high output power capabilities. High output voltage enables a wider measurement range at higher test currents, as well as the use of thinner/longer test cables. GGT500 ground grid integrity tester generates a true DC ripple-free (less than 1 % ripple) current with automatically regulated test ramps. This significantly decreases magnetic transients and ensures great accuracy.When used for testing in Both Sides Grounded conditions, a special current clamp powered from the ground grid integrity tester is used for measuring a current through groundings. If even a higher safety level is required, the remote control feature enables the operator to perform measurements from a distant location, away from the instrument and test object.
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Automatic Tablet Weighing System
CIW 7.2/7.3
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With the automatic weighing system CIW 7.2 / 7.3 LAB you weigh tablets, dragees, capsules and similar products. Based on the UTS tablet testing systems by Kraemer Elektronik, the standard unit offers a tablet separation system and a special transport star for precise positioning of the test specimen on the integrated scale.The CIW 7.2 / 7.3 LAB in the laboratory version is now equipped with the database-driven, intuitive all-in-one touch software and no longer requires additional software solutions for most areas of application.The functionality of the software can be extended modularly – matching your needs and requirements.Alternatively, you can expand the CIW 7.2 / 7.3 LAB weighing system with a 12-station feeder and/or a 12-station collector to perform multiple defined tests (12-station feeder) in one measuring cycle. All cleaning-related parts can be easily and quickly disassembled without tools.The CIW 7.3 LAB model is nearly identical to the CIW 7.2 LAB, but additionally features a precise measuring device for thickness determination.
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High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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MB-OFDM Protocol Test System
WiMedia Explorer 300
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The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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Modular Test Systems
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Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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PXI 5W Programmable Resistor Module, 2-Channel, 1Ω to 62.1Ω
40-252-111
Programmable Resistor Modules
The 40-252-111 is a programmable resistor module with 2 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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AMIDA 3001XP Tester
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AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Fully Programmable Digital Design with Wireless Remote Control
VLF E Series
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The VLF E Series uses a state-of-the-art, switching power supply design with wireless computer controls. Equipped with HVI’s E-Link software, the E Series stands among the most advanced cable testing systems available. Our customers praise its flexible data capture and reporting capabilities, full remote operation via XBee wireless technology, and seamless tan delta testing with HVI’s TD units.
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Multi-Wafer Test & Burn-in System
FOX-XP
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The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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PCI High Density Pecision Resistor Card, 9-Channel, 2Ω To 62.1Ω
50-298-111
Programmable Resistor Modules
The 50-298-111 is a high density programmable resistor card with 9 channels which can be set between 2Ω and 62.1Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 2.5Ω to 102kΩ
40-251-040
Programmable Resistor Modules
The 40-251-040 is a programmable resistor module with 2 channels which can be set between 2.5Ω and 102kΩ with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Power Conversion Automated Test Platform
C8000
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Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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Fuel Cell Test Software
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Exceptional functionality with a user-friendly graphical interface- Enhanced with our proprietary automation language, Emerald Software - Comprehensively manages the full range of FCATS fuel cell test system parameters- Simple user-friendly interface permits even novices to begin testing in minutes
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Milliampere-Level Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
mA class battery test system, mainly used for battery material research, high-precision test, pulse charge and discharge test, DCIR test, cycle Life test. It provides powerful testing equipment for research institutions, universities and experimental centers of battery production enterprises
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Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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PXI High Density Precision Resistor Module, 3-Channel, 4Ω to 11.4MΩ
40-298-153
Programmable Resistor Modules
The 40-298-153 is a high density programmable resistor module with 3 channels which can be set between 4Ω and 11.4MΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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PXI 16x4 Signal Insertion and Monitor Matrix
40-525A-002
Matrix Switch Module
This is a PXI signal insertion and monitor matrix with switched pass thru connections on both X and Y axis. It is also available in a 34x4 format and can be used for signal insertion and monitoring purposes on connections between the UUT and test system.
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PXI Programmable Resistor Card 4-Channel 2 Ohm to 510 Ohm - SPST
40-294-114
Programmable Resistor Modules
These PXI Programmable Resistor modules are available with either two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Universal Testing Systems (Up to 600 kN)
5980 Series
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Instron 5980 Series floor model testing systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 Series floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 400 and 600 kN.
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Haptic Testing System
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The Air Ventilator Haptic Test System performs automatic functional tests on air ventilation components to measure the force necessary for the execution of movements in the different components of the part. The movements are performed by a 6-axis robot that forces the components of the part to follow the desired routes while storing data on the force expended. This particular machine tests movable fins and knurled wheels by performing four test motions on each fin and two on each wheel.
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Proven Testing Solutions for Critical Software
V&V Services
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*Unit and integration testing*System and acceptance testing*DO-178 process definition and optimization*Test automation*Timing analysis and optimization*On-target problem solving*Third-party software verification*Assurance services
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Modulation Distortion Up To 8.5 GHz
S930700B
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S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
